1. Direct Laser Ablation and Ionization of Solids for Chemical Analysis by Mass Spectrometry
- Author
-
E J Nelson, J K Holt, and G L Klunder
- Subjects
History ,Chemical ionization ,Matrix-assisted laser desorption electrospray ionization ,Chemistry ,Analytical chemistry ,Thermal ionization ,Mass spectrometry ,Ion source ,Computer Science Applications ,Education ,Atmospheric-pressure laser ionization ,Physics::Atomic Physics ,Direct electron ionization liquid chromatography–mass spectrometry interface ,Atomic physics ,Ambient ionization - Abstract
A laser ablation/ionization mass spectrometer system is described for the direct chemical analysis of solids. An Nd:YAG laser is used for ablation and ionization of the sample in a quadrupole ion trap operated in an ion-storage (IS) mode that is coupled with a reflectron time-of-flight mass spectrometer (TOF-MS). Single pulse experiments have demonstrated simultaneous detection of up to 14 elements present in glasses in the ppm range. However, detection of the components has produced non-stoichiometric results due to difference in ionization potentials and fractionation effects. Time-of-flight secondary ionization mass spectrometry (TOF-SIMS) was used to spatially map elemental species on the surface and provide further evidence of fractionation effects. Resolution (m/Δm) of 1500 and detection limits of approximately 10 pg have been achieved with a single laser pulse. The system configuration and related operating principles for accurately measuring low concentrations of isotopes are described.
- Published
- 2007
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