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32 results on '"Integrated circuits -- Quality management"'

1. New Life Science Findings from University of Wollongong Outlined (Computational Design and Evaluation of a Quad-mosfet Device for Quality Control of Therapeutic Accelerator-based Neutron Beams)

Subjects
Metal oxide semiconductor field effect transistors -- Quality management, Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Physical fitness -- Research -- Health aspects -- Reports, Quality control -- Research -- Health aspects -- Reports, Standard IC, Quality control, Health
Abstract

2024 SEP 7 (NewsRx) -- By a News Reporter-Staff News Editor at Obesity, Fitness & Wellness Week -- Investigators publish new report on Life Science. According to news reporting originating [...]

Published
2024

2. Researchers from National Institute for Bioprocessing Research & Training Report Details of New Studies and Findings in the Area of Gene Therapy [Rapid Characterization of Adeno-associated Virus (Aav) Capsid Proteins Using Microchip Zipchip ...]

Subjects
Genes -- Reports -- Genetic aspects -- Health aspects, Gene therapy -- Reports -- Health aspects, Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Physical fitness -- Health aspects -- Reports, Viral proteins -- Reports -- Genetic aspects -- Health aspects, Standard IC, Health
Abstract

2024 FEB 3 (NewsRx) -- By a News Reporter-Staff News Editor at Obesity, Fitness & Wellness Week -- Research findings on Biotechnology - Gene Therapy are discussed in a new [...]

Published
2024

3. Chunghyun Sin, President of South Korea Smart Solar System, and his delegation visited Yongxiang for exchanges

Subjects
Semiconductor industry, Solar energy industry, Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Integrated circuit fabrication, Quality control, Semiconductor industry, Standard IC, Integrated circuit fabrication, Quality control, Business, Business, international
Abstract

On October 24, Chunghyun Sin, President of South Korea Smart Solar System, and his delegation visited Yongxiang Co., Ltd. Liu Song, Assistant Director of Yongxiang Photovoltaic Business Department, and Deputy [...]

Published
2023

4. Economic analysis of testing homogeneous manycore chips

Author

Lin Huang and Qiang Xu

Subjects
Standard IC, Multiple core processors -- Design and construction, Multiple core processors -- Testing, Product testing -- Economic aspects, Integrated circuits -- Quality management, Semiconductor chips -- Quality management
Published
2010

5. Radiation hardened by design digital I/O for high SEE and TID immunity

Author

Clark, Lawrence T.

Subjects
Integrated circuits -- Design and construction, Integrated circuits -- Quality management, Semiconductor chips -- Design and construction, Semiconductor chips -- Quality management, Electrostatics -- Control, Standard IC, Business, Electronics, Electronics and electrical industries
Published
2009

6. Model-based clustering for integrated circuit yield enhancement

Author

Hwang, Jung Yoon and Kuo, Way

Subjects
Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Quality control -- Methods, Stochastic analysis -- Usage, Standard IC, Quality control, Business, Business, general, Business, international
Abstract

The usage of stoachastic analysis to develop a model for the clustering of variables as part of the quality control process, to enhance the yield of integrated circuits, is described.

Published
2007

7. Strengthening of prestressed concrete girders with composites: installation, design and inspection

Author

Rosenboom, Owen, Walter, Catrina, and Rizkalla, Sami

Subjects
Bridge construction -- Quality management, Fatigue testing machines, Laminated materials -- Quality management, Integrated circuits -- Quality management, Epoxy resins, Semiconductor chips -- Quality management, Corrosion and anti-corrosives, Materials -- Fatigue, Adhesives -- Quality management, Business, Construction and materials industries, Standard IC, Quality management
Abstract

Abstract The application of fibre reinforced polymer (FRP) or steel reinforced polymer (SRP) materials to the tension side of a reinforced/prestressed concrete member has been accepted as a strengthening technique [...]

Published
2009
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8. Publication: ASIC Audit Inspection Report 2020

Subjects
Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Quality control -- Reports, Standard IC, Quality control, General interest, News, opinion and commentary
Abstract

Australia: BDO Australia Ltd has issued the following press release: As part of BDO's commitment to transparency, each year we publish our Transparency Report, providing information about how we support [...]

Published
2020

9. Improved EEPROM tunnel- and gate-oxide quality by integration of a low-temperature pre-tunnel-oxide RCA SC-1 clean

Author

Buller, J.F., Bandyopadhyay, B., Garg, S., and Patel, N.

Subjects
Electrically erasable programmable read-only memory -- Analysis, Integrated circuits -- Quality management, Production management -- Analysis, Semiconductor preparation -- Quality management, Business, Computers, Electronics, Electronics and electrical industries
Abstract

The effects of integration of a low-temperature RCA standard clean-1 (SC1) on the tunnel- and gate-oxide charge-to-breakdown ([Q.sub.BD]) and voltage ramped dielectric breakdown (VRDB) distribution in a 0.7 [[micro]meter] CMOS EEPROM process technology were studied. A low-temperature (< 65 [degrees] C) SC1 used to clean the wafer surface prior to tunnel oxidation resulted in a significantly higher tunnel-oxide [Q.sub.BD], as well as improved gate-oxide [Q.sub.BD] and mode-B failure rates compared to that for a traditional high temperature (> 80 [degrees] C) SC1. The reduced silicon dioxide etchrate of the low-temperature SC1 allowed for additional gate-oxide annealing during the gate oxidation cycle, while keeping the overall thermal budget [(Dt).sup.1/2] for the technology equivalent to that with the higher temperature SC1. This resulted in improved gate-oxide VRDB distributions and [Q.sub.BD] values on large capacitor structures. The tunnel-oxide [Q.sub.BD] improvement was most likely due to reduced surface roughness in the tunnel-oxide window regions with the lower temperature SC1. The process including the low-temperature SC1 was also proven to provide equivalent yield to the process with the high temperature SC1 on a 0.7 [[micro]meter], 7 nS 128 macrocell EEPROM programmable logic device.

Published
1996

10. Using a tungsten plasma clean process to reduce metal shorts caused by CMP microscratches

Author

Ollendorf, Heinrich, Cabral, Stacey, and Fuller, Robert

Subjects
Semiconductor industry, Standard IC, Infineon Technologies -- Innovations, Semiconductor industry -- Production processes, Semiconductor industry -- Quality management, Optical instruments industry -- Innovations, Integrated circuits -- Quality management, Integrated circuits -- Production processes, Semiconductor chips -- Quality management, Semiconductor chips -- Production processes
Published
2004

11. Effect of the product term on reliability prediction of integrated circuits

Author

Kumar, K.

Subjects
Semiconductor industry -- Quality management, Integrated circuits -- Quality management, Reliability (Engineering) -- Testing, Semiconductor chips -- Quality management, Business, Business, international, Semiconductor industry, Standard IC, Quality management, Testing
Abstract

Introduction The useful lifetime of an integrated circuit could be up to 25 years; therefore it has become almost essential to predict the expected failure rate of such devices. Reliability [...]

Published
1996

12. What PAM5 means to you: multilevel signaling puts Gigabit Ethernet on CAT-5 cable, while tests ensure the quality of ICs that implement it. (Device Test)

Author

Schroeder, George

Subjects
Standard IC, Technology application, Integrated circuits -- Quality management, Semiconductor chips, Signals and signaling -- Technology application, Signals and signaling -- Quality management
Abstract

From its early applications in the 1960s for T1 communications services, multilevel signaling has played an important role in increasing the data rates that existing wire infrastructures could support, providing […]

Published
2003

13. Dongbu HiTek Gets ISO13485 Quality Management Certification

Subjects
Semiconductor industry -- Licensing, certification and accreditation, Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Quality control, Semiconductor industry, Standard IC, Quality control, Arts and entertainment industries
Abstract

Dongbu HiTek announced that it has been certified to meet all international quality management criteria set forth in the ISO13485 standard for the medical device industry. Adding this latest ISO [...]

Published
2012

14. Profile of Kathleen Dennis President of Microchips Biotech, Inc

Subjects
Biotechnology, Quality control, Biotechnology industries, Integrated circuits -- Quality management, Standard IC, Quality control, General interest, News, opinion and commentary
Abstract

Lexington : Following is the Profile of Kathleen Dennis President of Microchips Biotech, Inc: Kathleen Dennis joined Microchips Biotech as Vice President of Quality in February 2016, bringing more than [...]

Published
2017

15. Outsourcing can boost IC quality

Author

Lipman, Jim

Subjects
Semiconductor industry, Standard IC, Semiconductor industry -- Outsourcing, Semiconductor industry -- Quality management, Integrated circuits -- Quality management, Semiconductor chips -- Quality management
Published
2006

16. Test may decide choice of SoC or system-in-package

Author

Rajsuman, Rochit

Subjects
System on a chip, Embedded system, Standard IC, Embedded systems -- Design and construction, Embedded systems -- Testing, Embedded systems -- Quality management, Semiconductor chips -- Design and construction, Semiconductor chips -- Testing, Semiconductor chips -- Quality management, Integrated circuits -- Design and construction, Integrated circuits -- Testing, Integrated circuits -- Quality management
Published
2003

17. Experts gather to scrutinize IC quality

Author

Goering, Richard

Subjects
Circuit designer, Integrated circuit design, Standard IC, Semiconductor industry, Market trend/market analysis, Circuit design -- Quality management, Conferences and conventions -- Forecasts and trends, Integrated circuits -- Design and construction, Integrated circuits -- Quality management, Semiconductor chips, Nanotechnology -- Product development, Semiconductor industry -- Product development
Published
2003

18. Don't sweat the small stuff

Author

Travis, Bill

Subjects
Semiconductor industry -- Quality management, Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Business, Electronics and electrical industries, Semiconductor industry, Standard IC, Quality management
Abstract

MINIATURE PROBES AND ADAPTERS ALLOW YOU TO TEST, EMULATE, AND VALIDATE DEVELOPMENTAL CIRCUITS THAT CONTAIN MICROMINIATURE IC's AND OTHER ULTRASMALL COMPONENTS. TIME WAS, IT WAS RELATIVELY STRAIGHT FORWARD and easy [...]

Published
1999

19. Management's tough new charge: keep off static electricity

Author

Socolovsky, Alberto

Subjects
Standard IC, Semiconductor device, Integrated circuits -- Quality management, Circuit components -- Quality management, Semiconductor chips -- Quality management, Very-large-scale integration -- Quality management
Abstract

Management's tough new charge: Keep off static electricity Many people who have bought a memory upgrade board for their PC from computer dealers tell a classic horror story: the boards […]

Published
1988

20. Forza Silicon Achieves ISO 9001 Certification

Subjects
Semiconductor industry -- Licensing, certification and accreditation, Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Silicon -- Quality management, Complementary metal oxide semiconductors -- Quality management, Quality control, Semiconductor industry, Standard IC, Quality control, Business, general
Abstract

Fabless Semiconductor Company's Certification Covers Advanced Mixed-Signal ASIC Design Services and CMOS Imaging Chips Pasadena, California (PRWEB) May 17, 2010 -- Forza Silicon Corporation announced today that the Company's Quality [...]

Published
2010

21. High-density assemblies force innovative test

Author

Schutt, Jeff

Subjects
Technology application, Quality Control, Integrated Circuit Fabrication, Integrated circuits -- Quality management, Semiconductor industry -- Quality management
Abstract

BGA, flip-chip and high-density electronic assemblies in many cases are subjected to the same types of tests that traditionally have been reserved for lower-technology assemblies. However, innovative approaches must be […]

Published
1996

22. Two new imaging techniques promise to improve IC defect identification

Author

Ajluni, Cheryl

Subjects
Standard IC, Integrated circuit fabrication, Electric fault location -- Research -- Methods, Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Non-destructive testing -- Methods -- Research, Integrated circuit fabrication -- Quality management -- Methods -- Research
Abstract

Crucial to the success of IC manufacturing is the ability to produce high-quality, reliable microchips in step with today's microlithographic feature sizes of roughly 0.35[µmeter] and a gate density per […]

Published
1995

23. Elusive mask defects: random reticle CD variation

Author

Reynolds, James A.

Subjects
Semiconductor industry, Standard IC, Semiconductor device, Masks (Electronics) -- Inspection -- Quality management, Semiconductor industry -- Quality management -- Inspection, Integrated circuits -- Quality management, Semiconductor chips -- Quality management
Abstract

On today,s reticles, a class of serious mask defects exist that print defective patterns on wafers but are generally not screened out by reticle manufacturers. This article Lithographers maintain critical […]

Published
1994

24. Six Sigma Security, Inc. Announces the Installation of VeriChip Corp's VeriGuard System and Its Human-Implantable RFID Microchip, as Part of an Overall Security Solution for CityWatcher.com

Subjects
Sigma Security Inc., Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Radio frequency identification (RFID) -- Quality management, Standard IC, Radio frequency identification, Business, Business, international
Abstract

CINCINNATI -- Reissuing release (dated February 6, 2006) to add ticker symbol for searching purposes. The corrected release reads: SIX SIGMA SECURITY, INC. ANNOUNCES THE INSTALLATION OF VERICHIP CORP'S VERIGUARD [...]

Published
2006

25. Software predicts IC reliability

Author

McCarty, Lyle H.

Subjects
University of California, Berkeley -- Innovations, Integrated circuits -- Quality management, Reliability (Engineering) -- Testing
Published
1991

26. Dongbu HiTek Secures ISO13485 Quality Management Certification

Subjects
Semiconductor industry -- Licensing, certification and accreditation, Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Quality control, Semiconductor industry, Standard IC, Quality control, Business, Business, international, Telecommunications industry
Abstract

Dongbu HiTek announced that it has been certified to meet all international quality management criteria set forth in the ISO13485 standard for the medical device industry. Adding this latest ISO [...]

Published
2012

27. Accent Confirms Commitment to Quality by Receiving ISO 9001:2008 Certification

Subjects
Semiconductor industry, Integrated circuits -- Quality management, Semiconductor chips -- Quality management, Embedded systems -- Quality management, Semiconductor industry, Standard IC, Embedded system, System on a chip, Electronics
Abstract

Accent S.A., a leading fabless SoC provider offering highly differentiated platform-based System-on-Chip (SoC) solutions, announced the company has received ISO 9001:2008 certification for its four design centers in Italy and [...]

Published
2010

28. QPL failures spur circuit testing by DESC

Author

Vinton, Bob

Subjects
United States. Defense Electronics Supply Center -- Management, Semiconductor industry -- Quality management, Integrated circuits -- Quality management, Business, Electronics and electrical industries
Abstract

With a rash of QPL violations serving as apparent impetus, the Defense Electronics Supply Center in Dayton, O., will begin testing integrated circuits for the first time later this year. [...]

Published
1985

30. Conquering the limbo factor

Author

Curran, Lawrence

Subjects
Standard IC, Support services, Company marketing practices, Productivity, Customer service, Quality control, Electronics industry, Analog Devices Inc. -- Marketing, Integrated circuits -- Quality management, Semiconductor preparation, Semiconductor chips -- Quality management, Electronics industry -- Quality management -- Marketing, Industrial productivity, Production control, Quality control -- Marketing, Customer service
Abstract

When Analog Devices Inc. was named by Dataquest Inc. as Semiconductor Supplier of the Year among midsize chip makers (see main story), the recognition told Art Schneiderman that 'we're on […]

Published
1991

31. AF withholds payments to Westingh'se; cite radar boards

Author

Robertson, Jack

Subjects
United States. Air Force -- Finance, Westinghouse Electric Corp. -- Contracts, Integrated circuits -- Quality management, Business, Electronics and electrical industries
Abstract

WASHINGTON -- A 22-month-long quality control problem at Westinghouse Electric wtih printed circuit boards on its new F-16 and B-1B radars, still not completely remedied, has caused the Air Force [...]

Published
1985

32. DOD issues mistested parts guidelines

Author

Masud, S.A.

Subjects
United States. Department of Defense -- Quality management, Texas Instruments Inc. -- Quality management, defense contracts -- Quality management, Semiconductor industry -- Quality management, Integrated circuits -- Quality management, Business, Electronics and electrical industries
Abstract

WASHINGTON -- The Defense Department, apparently convinced that other semiconductor suppliers are likely to follow Texas Instruments with disclosures of improper testing of military microcircuits, has issued guidelines for handling [...]

Published
1985

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