1. On the use of the IC stripline to evaluate the susceptibility to EMI of small integrated circuits
- Author
-
Franco Fiori and Michele Perotti
- Subjects
Integrated Circuits, Susceptibility, radiated susceptibility tests, IC stripline ,Engineering ,Electromagnetics ,Hardware_PERFORMANCEANDRELIABILITY ,02 engineering and technology ,Integrated circuit ,01 natural sciences ,Electromagnetic interference ,Integrated Circuits ,law.invention ,radiated susceptibility tests ,Interference (communication) ,law ,EMI ,IC stripline ,Hardware_INTEGRATEDCIRCUITS ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,business.industry ,020208 electrical & electronic engineering ,010401 analytical chemistry ,Electromagnetic compatibility ,Electrical engineering ,0104 chemical sciences ,Susceptibility ,Device under test ,business ,Stripline - Abstract
The IC stripline method is one of those suggested in IEC-62132 to evaluate the susceptibility of ICs to radiated electromagnetic interference. In practice, it allows the multiple injection of the interference through the capacitive and inductive coupling of the IC package with the guiding structure (the stripline) in which the device under test is inserted. The pros and cons of this method are discussed and a variant of it is proposed with the aim to address the main problems that arise when evaluating the susceptibility of ICs encapsulated in small packages.
- Published
- 2016
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