1. Statistical study and parallelisation of multiplexed single-electron sources
- Author
-
Norimoto, S., See, P., Schoinas, N., Rungger, I., Boykin II, T. O., Stewart Jr, M. D., Griffiths, J. P., Chen, C., Ritchie, D. A., and Kataoka, M.
- Subjects
Condensed Matter - Mesoscale and Nanoscale Physics - Abstract
Increasing electric current from a single-electron source is a main challenge in an effort to establish the standard of the ampere defined by the fixed value of the elementary charge $e$ and operation frequency $f$. While the current scales with $f$, due to an operation frequency limit for maintaining accurate single-electron transfer, parallelisation of singleelectron sources is expected to be a more practical solution to increase the generated electric current $I = Nef$, where $N$ is a number of parallelised devices. One way to parallelise single-electron sources without increasing the complexity in device operation is to use a common gate. Such a scheme will require each device to have the same operation parameters for single-electron transfer. In order to investigate this possibility, we study the statistics for operation gate voltages using single-electron sources embedded in a multiplexer circuit. The multiplexer circuit allows us to measure 64 single-electron sources individually in a single cooldown. We also demonstrate the parallelisation of three single-electron sources and observe the generated current enhanced by a factor of three., Comment: 5 pages, 3 figures
- Published
- 2024