42 results on '"ION-BEAM ANALYSIS"'
Search Results
2. Effects of H vacancies on photochromic properties of oxygen-containing yttrium hydride.
- Author
-
Moldarev, D., Pitthan, E., Wolff, M., and Primetzhofer, D.
- Subjects
- *
THIN films analysis , *ION analysis , *ION beams , *YTTRIUM , *HYDRIDES - Abstract
We present in-situ studies of H loss from YHO films using ion beam analysis and its effect on the photochromic properties. The film evaporates loosely bound H under exposure to a beam of 3056 keV He2+ without a concomitant increase of O. Annealing at 145 °C decreases both the photochromic contrast and the bleaching speed indicating the importance of mobile H for the photochromic reaction. [ABSTRACT FROM AUTHOR]
- Published
- 2024
- Full Text
- View/download PDF
3. Effects of H vacancies on photochromic properties of oxygen-containing yttrium hydride
- Author
-
Moldarev, Dmitrii, Pitthan, Eduardo, Wolff, Max, Primetzhofer, Daniel, Moldarev, Dmitrii, Pitthan, Eduardo, Wolff, Max, and Primetzhofer, Daniel
- Abstract
We present in-situ studies of H loss from YHO films using ion beam analysis and its effect on the photochromic properties. The film evaporates loosely bound H under exposure to a beam of 3056 keV He2+ without a concomitant increase of O. Annealing at 145 °C decreases both the photochromic contrast and the bleaching speed indicating the importance of mobile H for the photochromic reaction.
- Published
- 2024
- Full Text
- View/download PDF
4. Quantitative Lithiation Depth Profiling in Silicon Containing Anodes Investigated by Ion Beam Analysis.
- Author
-
Möller, Sören, Joo, Hyunsang, Rasinski, Marcin, Mann, Markus, Figgemeier, Egbert, and Finsterbusch, Martin
- Abstract
The localisation and quantitative analysis of lithium (Li) in battery materials, components, and full cells are scientifically highly relevant, yet challenging tasks. The methodical developments of MeV ion beam analysis (IBA) presented here open up new possibilities for simultaneous elemental quantification and localisation of light and heavy elements in Li and other batteries. It describes the technical prerequisites and limitations of using IBA to analyse and solve current challenges with the example of Li-ion and solid-state battery-related research and development. Here, nuclear reaction analysis and Rutherford backscattering spectrometry can provide spatial resolutions down to 70 nm and 1% accuracy. To demonstrate the new insights to be gained by IBA, SiO
x -containing graphite anodes are lithiated to six states-of-charge (SoC) between 0–50%. The quantitative Li depth profiling of the anodes shows a linear increase of the Li concentration with SoC and a match of injected and detected Li-ions. This unambiguously proofs the electrochemical activity of Si. Already at 50% SoC, we derive C/Li = 5.4 (< LiC6 ) when neglecting Si, proving a relevant uptake of Li by the 8 atom % Si (C/Si ≈ 9) in the anode with Li/Si ≤ 1.8 in this case. Extrapolations to full lithiation show a maximum of Li/Si = 1.04 ± 0.05. The analysis reveals all element concentrations are constant over the anode thickness of 44 µm, except for a ~6-µm-thick separator-side surface layer. Here, the Li and Si concentrations are a factor 1.23 higher compared to the bulk for all SoC, indicating preferential Li binding to SiOx . These insights are so far not accessible with conventional analysis methods and are a first important step towards in-depth knowledge of quantitative Li distributions on the component level and a further application of IBA in the battery community. [ABSTRACT FROM AUTHOR]- Published
- 2022
- Full Text
- View/download PDF
5. Absolute Local Quantification of Li as Function of State-of-Charge in All-Solid-State Li Batteries via 2D MeV Ion-Beam Analysis.
- Author
-
Möller, Sören, Takahiro Satoh, Yasuyuki Ishii, Teßmer, Britta, Guerdelli, Rayan, Tomihiro Kamiya, Kazuhisa Fujita, Kota Suzuki, Yoshiaki Kato, Wiemhöfer, Hans-Dieter, Kunioki Mima, and Finsterbusch, Martin
- Subjects
SOLID electrolytes ,LITHIUM cells ,ION beams ,STORAGE batteries ,POLYMER colloids ,LITHIUM-ion batteries ,ELECTRIC batteries ,GAMMA rays - Abstract
Direct observation of the lithiation and de-lithiation in lithium batteries on the component and microstructural scale is still difficult. This work presents recent advances in MeV ion-beam analysis, enabling quantitative contact-free analysis of the spatially-resolved lithium content and state-of-charge (SoC) in all-solid-state lithium batteries via 3 MeV proton-based characteristic x-ray and gamma-ray emission analysis. The analysis is demonstrated on cross-sections of ceramic and polymer all-solid-state cells with LLZO and MEEP/LIBOB solid electrolytes. Different SoC are measured ex-situ and one polymer-based operando cell is charged at 333 K during analysis. The data unambiguously show the migration of lithium upon charging. Quantitative lithium concentrations are obtained by taking the physical and material aspects of the mixed cathodes into account. This quantitative lithium determination as a function of SoC gives insight into irreversible degradation phenomena of all-solid-state batteries during the first cycles and locations of immobile lithium. The determined SoC matches the electrochemical characterization within uncertainties. The presented analysis method thus opens up a completely new access to the state-of-charge of battery cells not depending on electrochemical measurements. Automated beam scanning and data-analysis algorithms enable a 2D quantitative Li and SoC mapping on the μm-scale, not accessible with other methods. [ABSTRACT FROM AUTHOR]
- Published
- 2021
- Full Text
- View/download PDF
6. One detector, all the light elements – Low-background NRA, RBS and ERDA for the quantification of elements from hydrogen to fluorine.
- Author
-
Frost, R.J.W., De La Rosa, N., Elfman, M., Kristiansson, P., Nilsson, E.J.C., Pallon, J., and Ros, L.
- Subjects
- *
HYDROGEN , *LIGHT elements , *SILICON detectors , *PARTICLE detectors , *FLUORINE - Abstract
Presented is a review of the accomplishments, of the light-element program, conducted at the Lund Ion-Beam Analysis Facility. A detailed account is given of the current experimental setup at the total Ion-Beam Analysis Chamber, which is equipped with two Double-Sided Silicon Strip Detectors for charge particle detection, a silicon drift detector for PIXE analysis, an electrostatic deflection system for charge measurement and implements a Nuclear Micro-Probe. A summary of the work conducted to date on the quantification of low Z elements is presented on a case by case basis. Details of the current work efforts and an overview of the advances which are intended in the near future are given. [ABSTRACT FROM AUTHOR]
- Published
- 2021
- Full Text
- View/download PDF
7. Quantitative Lithiation Depth Profiling in Silicon Containing Anodes Investigated by Ion Beam Analysis
- Author
-
Sören Möller, Hyunsang Joo, Marcin Rasinski, Markus Mann, Egbert Figgemeier, and Martin Finsterbusch
- Subjects
all-solid-state batteries ,garnet solid-state electrolyte ,lithium-ion transport ,electrochemical stability ,ion-beam analysis ,depth-resolved analysis ,Production of electric energy or power. Powerplants. Central stations ,TK1001-1841 ,Industrial electrochemistry ,TP250-261 - Abstract
The localisation and quantitative analysis of lithium (Li) in battery materials, components, and full cells are scientifically highly relevant, yet challenging tasks. The methodical developments of MeV ion beam analysis (IBA) presented here open up new possibilities for simultaneous elemental quantification and localisation of light and heavy elements in Li and other batteries. It describes the technical prerequisites and limitations of using IBA to analyse and solve current challenges with the example of Li-ion and solid-state battery-related research and development. Here, nuclear reaction analysis and Rutherford backscattering spectrometry can provide spatial resolutions down to 70 nm and 1% accuracy. To demonstrate the new insights to be gained by IBA, SiOx-containing graphite anodes are lithiated to six states-of-charge (SoC) between 0–50%. The quantitative Li depth profiling of the anodes shows a linear increase of the Li concentration with SoC and a match of injected and detected Li-ions. This unambiguously proofs the electrochemical activity of Si. Already at 50% SoC, we derive C/Li = 5.4 (< LiC6) when neglecting Si, proving a relevant uptake of Li by the 8 atom % Si (C/Si ≈ 9) in the anode with Li/Si ≤ 1.8 in this case. Extrapolations to full lithiation show a maximum of Li/Si = 1.04 ± 0.05. The analysis reveals all element concentrations are constant over the anode thickness of 44 µm, except for a ~6-µm-thick separator-side surface layer. Here, the Li and Si concentrations are a factor 1.23 higher compared to the bulk for all SoC, indicating preferential Li binding to SiOx. These insights are so far not accessible with conventional analysis methods and are a first important step towards in-depth knowledge of quantitative Li distributions on the component level and a further application of IBA in the battery community.
- Published
- 2022
- Full Text
- View/download PDF
8. Automating the setup and control of the pre-sample charge measurement system at the Lund Ion-beam Analysis Facility.
- Author
-
Frost, R.J.W., De La Rosa, N., Kristiansson, P., and Pallon, J.
- Subjects
- *
CHARGE measurement , *GRAPHICAL user interfaces , *USB technology , *USER interfaces , *BANKING laws - Abstract
In many IBA applications the aim is to obtain quantitative figures characterising the sample, usually requiring a reliable measurement of the beam current for normalisation. To avoid the drawbacks associated with on-sample and post-sample charge measurement systems a pre-sample measurement system can be used. In this work an upgrade to the pre-sample charge measurement system at the Lund Ion-beam Analysis Facility is presented, in which a custom built control module based around a Teensy 3.2 micro-controller has been added to the existing system. The new control module allows for remote handling and monitoring of the deflection system, operated via USB connection to a PC running a graphical user interface. Details of the control modules functionality, design and programming are given, as well as the functionality of the user interface. An example of how the new control module can be used for automated calibration of the deflection system is also presented. [ABSTRACT FROM AUTHOR]
- Published
- 2020
- Full Text
- View/download PDF
9. Ion-beam analysis of insulator samples.
- Author
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Szilágyi, E., Kótai, E., and Merkel, D.G.
- Subjects
- *
ELECTRON beams , *ION implantation , *SPECTRUM analysis , *ELECTRON sources , *INSULATING materials , *ION analysis - Abstract
During the bombardment of insulator materials with high-energy particles, the samples are often emitting light and are sparking. This fact makes both the ion-beam analysis and the ion implantation of insulating materials more difficult. Light may disturb the detectors, sparks usually disturb the current-integration systems and electronics. Moreover, the accumulation of positive charges alters the results of the experiments via decelerating the incoming ions and accelerating the outgoing particles. In case of ion implantation, the projected range may be changed, while in ion-beam analysis the shape of the spectra can be changed resulting evaluation problems. To avoid the charge accumulation several methods have been used in the daily practice such as applying thin cover layers, wrapping or masking the samples, applying relatively low beam currents or electron sources in the experimental chamber. A short review of the above mentioned methods to avoid the charge accumulation is given. Moreover, the evaluation problems of the spectra taken on sparking (or at least charged-up) samples are also discussed. Proton and helium backscattering spectrometry as well as elastic recoil detection analysis are used to demonstrate the capability of a simple model of charge accumulation which is implemented to DEPTH code. [ABSTRACT FROM AUTHOR]
- Published
- 2019
- Full Text
- View/download PDF
10. Absolute Local Quantification of Li as Function of State-of-Charge in All-Solid-State Li Batteries via 2D MeV Ion-Beam Analysis
- Author
-
Sören Möller, Takahiro Satoh, Yasuyuki Ishii, Britta Teßmer, Rayan Guerdelli, Tomihiro Kamiya, Kazuhisa Fujita, Kota Suzuki, Yoshiaki Kato, Hans-Dieter Wiemhöfer, Kunioki Mima, and Martin Finsterbusch
- Subjects
lithium batteries ,all-solid-state batteries ,ion-beam analysis ,particle induced gamma ray analysis ,material analysis ,ceramic electrolytes ,Production of electric energy or power. Powerplants. Central stations ,TK1001-1841 ,Industrial electrochemistry ,TP250-261 - Abstract
Direct observation of the lithiation and de-lithiation in lithium batteries on the component and microstructural scale is still difficult. This work presents recent advances in MeV ion-beam analysis, enabling quantitative contact-free analysis of the spatially-resolved lithium content and state-of-charge (SoC) in all-solid-state lithium batteries via 3 MeV proton-based characteristic x-ray and gamma-ray emission analysis. The analysis is demonstrated on cross-sections of ceramic and polymer all-solid-state cells with LLZO and MEEP/LIBOB solid electrolytes. Different SoC are measured ex-situ and one polymer-based operando cell is charged at 333 K during analysis. The data unambiguously show the migration of lithium upon charging. Quantitative lithium concentrations are obtained by taking the physical and material aspects of the mixed cathodes into account. This quantitative lithium determination as a function of SoC gives insight into irreversible degradation phenomena of all-solid-state batteries during the first cycles and locations of immobile lithium. The determined SoC matches the electrochemical characterization within uncertainties. The presented analysis method thus opens up a completely new access to the state-of-charge of battery cells not depending on electrochemical measurements. Automated beam scanning and data-analysis algorithms enable a 2D quantitative Li and SoC mapping on the µm-scale, not accessible with other methods.
- Published
- 2021
- Full Text
- View/download PDF
11. A New High-Throughput Focused MeV Ion-Beam Analysis Setup
- Author
-
Sören Möller, Daniel Höschen, Sina Kurth, Gerwin Esser, Albert Hiller, Christian Scholtysik, Christian Dellen, and Christian Linsmeier
- Subjects
ion-beam analysis ,Rutherford-backscattering spectrometry ,nuclear reaction analysis ,particle induced x-ray spectroscopy ,material analysis ,Physics ,QC1-999 ,Nuclear and particle physics. Atomic energy. Radioactivity ,QC770-798 - Abstract
The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NRA), and Rutherford-backscattering-spectrometry (RBS) provides the most complete analysis over the whole periodic table in a single measurement. Yet, for a highly resolved and accurate IBA analysis, a sophisticated technical setup is required integrating the detectors, beam optics, and sample arrangement. A new end-station developed and installed in Forschungszentrum Jülich provides these capabilities in combination with high sample throughput and result accuracy. Mechanical tolerances limit the device accuracy to 3% for RBS. Continuous pumping enables 5 × 10−8 mbar base pressure with vibration amplitudes < 0.1 µm. The beam optics achieves a demagnification of 24–34, suitable for µ-beam analysis. An in-vacuum manipulator enables scanning 50 × 50 mm² sample areas with 10 nm accuracy. The setup features the above-mentioned IBA detectors, enabling a broad range of analysis applications such as the operando analysis of batteries or the post-mortem analysis of plasma-exposed samples with up to 3000 discrete points per day. Custom apertures and energy resolutions down to 11 keV enable separation of Fe and Cr in RBS. This work presents the technical solutions together with the quantification of these challenges and their success in the form of a technical reference.
- Published
- 2021
- Full Text
- View/download PDF
12. INAA and ion-beam analysis of elemental admixtures in carbon-based nanomaterials for battery electrodes.
- Author
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Kameník, Jan, Simões, Filipa R. F., Costa, Pedro M. F. J., Kučera, Jan, and Havránek, Vladimír
- Subjects
- *
ION beams , *SINGLE walled carbon nanotubes , *RESEARCH & development , *NUCLEAR activation analysis , *CARBON nanotubes , *METAL inclusions - Abstract
Six carbon materials with potential application in research and development of battery electrodes were tested for mass fractions of more than 40 elements by instrumental neutron activation analysis and ion-beam methods. The results indicate potential of the methods for characterization of materials with very low content of impurities (carbon black) as well as those with relatively high content of certain transition metals (e.g., single walled carbon nanotubes, SWCNT). A batch-to-batch variability of elemental impurities was found for commercial SWCNT. Quality control was performed by analysis of CRM SWCNT-1, NIST SRM 1633b, NIST SRM 2711, and NIST SRM 1547. [ABSTRACT FROM AUTHOR]
- Published
- 2018
- Full Text
- View/download PDF
13. CHARACTERIZATION OF BISMUTH OXIDE THIN FILMS DEPOSITED VIA UNBALANCED MAGNETRON SPUTTERING.
- Author
-
Orozco-Hernández, G., López-Córdoba, L. M., Esquivel-Puentes, H.A., Olaya, J. J., Alfonso, J. E., and Pineda-Vargas, C. A.
- Subjects
- *
BISMUTH oxides , *MAGNETRON sputtering , *X-ray diffraction , *SCANNING electron microscopy , *MORPHOLOGY - Abstract
Bismuth oxide thin films (250 nm) were deposited via unbalanced DC magnetron sputtering on Ti-6Al:4V, and common glass substrates. After being deposited, the films were heated (annealed) for 1 h between 473 and 1073 K in steps of 100 K. The morphology was characterized via scanning electron microscopy (SEM), the micro-structure was analyzed through x-ray diffraction (XRD), and the electrochemical behavior was analyzed with the potentiodynamic polarization test. Additionally, a proton-induced X-ray emission (PIXE) test was done on one of the samples in order to check the chemical distribution of the elements in the surface. The SEM and XRD analyses showed that the post-annealing process affects both the morphology and the structure of the films for all the samples. Finally, the electrochemical tests showed that films grown at 773 K have the highest degree of corrosion resistance. [ABSTRACT FROM AUTHOR]
- Published
- 2017
14. Insights from two-dimensional mapping of otolith chemistry.
- Author
-
Limburg, K. E. and Elfman, M.
- Subjects
- *
OTOLITH organs , *MICROCHEMISTRY , *CLASSIFICATION of fish , *SYNCHROTRONS , *CRYSTALLIZATION - Abstract
Non-destructive microbeam-based methods were used for 2-D mapping of trace elements to gain a greater appreciation of otolith composition and spatial configuration. Based on studies of a wide variety of fish taxa, this approach more fully captures the nature of otolith chemical heterogeneity. Such variations may be due to a number of factors, including differences in crystallization, genetics, growth or even sample preparation or contamination. Examples presented here highlight research conducted at the Lund Ion Beam Analysis Facility (LIBAF) and at the Cornell High-Energy Synchrotron Source (CHESS). [ABSTRACT FROM AUTHOR]
- Published
- 2017
- Full Text
- View/download PDF
15. Invited Review
- Author
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Elżbieta Fortuna-Zaleśna, Bastiaan J. Braams, Daisuke Nishijima, Thomas Schwarz-Selinger, R.P. Doerner, Marek Rubel, E. Safi, Dmitriy Borodin, Kalle Heinola, Christian Linsmeier, Kai Nordlund, Anna Widdowson, Christian Hill, Michael Probst, Hyun-Kyung Chung, Gregory De Temmerman, Juri Romazanov, S. Brezinsek, Institut des Hautes Etudes pour l’Innovation et l’Entrepreneuriat (IHEIE) (IHEIE), Mines Paris - PSL (École nationale supérieure des mines de Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL), International Atomic Energy Agency [Vienna] (IAEA), Forschungszentrum Jülich GmbH | Centre de recherche de Juliers, Helmholtz-Gemeinschaft = Helmholtz Association, Center for Energy Research [La Jolla], University of California [San Diego] (UC San Diego), University of California (UC)-University of California (UC), Royal Institute of Technology [Stockholm] (KTH ), Warsaw University of Technology [Warsaw], Physique des interactions ioniques et moléculaires (PIIM), Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS), Helsinki Institute of Physics (HIP), Helsingin yliopisto = Helsingfors universitet = University of Helsinki, Leopold Franzens Universität Innsbruck - University of Innsbruck, Max-Planck-Institut für Plasmaphysik [Garching] (IPP), Culham Science Centre [Abingdon], Centrum Wiskunde & Informatica (CWI), Korea Institute of Fusion Energy, European Project, Centrum Wiskunde & Informatica, Amsterdam (CWI), The Netherlands, MINES ParisTech - École nationale supérieure des mines de Paris, University of California-University of California, University of Helsinki, University of Innsbruck, Department of Physics, Helsinki Institute of Sustainability Science (HELSUS), Helsinki Institute of Urban and Regional Studies (Urbaria), and Doctoral Programme in Materials Research and Nanosciences
- Subjects
Nuclear and High Energy Physics ,JET-ILW ,Materials Science (miscellaneous) ,Nuclear engineering ,chemistry.chemical_element ,114 Physical sciences ,01 natural sciences ,ISOTOPE RETENTION ,010305 fluids & plasmas ,[SPI]Engineering Sciences [physics] ,NEUTRON-IRRADIATED BERYLLIUM ,0103 physical sciences ,Plasma-facing material ,010306 general physics ,Erosion-deposition ,Erosion–deposition ,[PHYS]Physics [physics] ,DEUTERIUM RETENTION ,TK9001-9401 ,CORE-LEVEL SHIFTS ,Dust ,Plasma ,Research needs ,respiratory tract diseases ,ION-BEAM ANALYSIS ,ELECTRONIC-STRUCTURE ,Nuclear Energy and Engineering ,chemistry ,Hydrogen fuel ,[SDE]Environmental Sciences ,TRITIUM RELEASE ,Erosion ,Nuclear engineering. Atomic power ,Environmental science ,ITER-LIKE WALL ,Critical assessment ,Beryllium ,BE-9(P,ALPHA(0))LI-6 CROSS-SECTIONS ,Literature survey ,Controlled fusion ,ddc:624 - Abstract
International audience; ITER will use beryllium as a plasma-facing material in the main chamber, covering a total surface area of about 620 m. Given the importance of beryllium erosion and co-deposition for tritium retention in ITER, significant efforts have been made to understand the behaviour of beryllium under fusion-relevant conditions with high particle and heat loads. This paper provides a comprehensive report on the state of knowledge of beryllium behaviour under fusion-relevant conditions: the erosion mechanisms and their consequences, beryllium migration in JET, fuel retention and dust generation. The paper reviews basic laboratory studies, advanced computer simulations and experience from laboratory plasma experiments in linear simulators of plasma–wall interactions and in controlled fusion devices using beryllium plasma-facing components. A critical assessment of analytical methods and simulation codes used in beryllium studies is given. The overall objective is to review the existing set of data with a broad literature survey and to identify gaps and research needs to broaden the database for ITER.
- Published
- 2021
- Full Text
- View/download PDF
16. Quantitative ion beam analysis of M–C–O systems: application to an oxidized uranium carbide sample.
- Author
-
Martin, G., Raveu, G., Garcia, P., Carlot, G., Khodja, H., Vickridge, I., Barthe, M.F., and Sauvage, T.
- Subjects
- *
ION beams , *URANIUM compounds , *OXIDIZING agents , *CARBIDES , *NUCLEAR reactors - Abstract
A large variety of materials contain both carbon and oxygen atoms, in particular oxidized carbides, carbon alloys (as ZrC, UC, steels, etc.), and oxycarbide compounds (SiCO glasses, TiCO, etc.). Here a new ion beam analysis methodology is described which enables quantification of elemental composition and oxygen concentration profile over a few microns. It is based on two procedures. The first, relative to the experimental configuration relies on a specific detection setup which is original in that it enables the separation of the carbon and oxygen NRA signals. The second concerns the data analysis procedure i.e. the method for deriving the elemental composition from the particle energy spectrum. It is a generic algorithm and is here successfully applied to characterize an oxidized uranium carbide sample, developed as a potential fuel for generation IV nuclear reactors. Furthermore, a micro-beam was used to simultaneously determine the local elemental composition and oxygen concentration profiles over the first microns below the sample surface. This method is adapted to the determination of the composition of MCOcompounds with a sensitivity on elemental atomic concentrations around 1000 ppm. [ABSTRACT FROM AUTHOR]
- Published
- 2014
- Full Text
- View/download PDF
17. A review of external microbeams for ion beam analyses.
- Author
-
Giuntini, L.
- Subjects
- *
ION bombardment , *BACKSCATTERING , *SCATTERING (Physics) , *LUMINESCENCE , *RADIATION - Abstract
Ion microbeam facilities are analytical tools with high spatial resolution exploiting MeV ion beams. The interactions of beam particles with atoms and nuclei of the target induce the emission of characteristic radiation, the energy of which provides signatures of the compositional and/or structural properties of the target; Ion-Beam Analysis (IBA) techniques, based on the detection of such radiation, enable characterisation of samples of interest, e.g. in material and earth sciences, cultural heritage, biology, medicine, and environmental studies. External beams, obtained by extracting the particles into the atmosphere through a thin window, have many attractive features, e.g. non-destructive/non-invasive analysis and ease of working, so many laboratories have dedicated beam-lines to ex-vacuo IBA analyses. External microprobes have made it possible to obtain probes in the micron range by adopting strong focusing lenses, ultra-thin windows for beam extraction, and short/ultra-short external path of beam particles in light gases; they have also made possible the use of new external IBA techniques, e.g. BS, ERDA, STIM, and IBIC. By adopting systems to raster scan the beam over the sample, imaging capabilities have also become available for ex-vacuo analysis. External scanning microprobes + IBA techniques have enabled the characterisation of samples with high spatial resolution, comparable with that achievable in-vacuum for thick samples, avoiding sample damage. [Figure not available: see fulltext.] [ABSTRACT FROM AUTHOR]
- Published
- 2011
- Full Text
- View/download PDF
18. An analytical energy-loss line shape for high depth resolution in ion-beam analysis
- Author
-
Grande, P.L., Hentz, A., Pezzi, R.P., Baumvol, I.J.R., and Schiwietz, G.
- Subjects
- *
ENERGY dissipation , *NUCLEAR reactions , *SCATTERING (Physics) , *GAUSSIAN processes - Abstract
Abstract: The knowledge of the energy-loss distribution in a single ion-atom collision is a prerequisite for subnanometric resolution in depth-profiling techniques such as nuclear-reaction profiling (NRP) and medium energy ion-scattering (MEIS). The usual Gaussian approximation specified by the stopping power and energy straggling is not valid for near surface regions of solids, where subnanometric or monolayer resolution can be achieved. In this work we propose an analytical formula for the line shape to replace the usual Gaussian distribution widely used in low-resolution ion-beam analysis. Furthermore, we provide a simple physical method to derive the corresponding shape parameters. We also present a comparison with full coupled-channel calculations as well as with experimental data at nearly single collision conditions. [Copyright &y& Elsevier]
- Published
- 2007
- Full Text
- View/download PDF
19. Atom ingress from synthetic body fluid into nanoporous layers formed in titanium by helium ion-implantation
- Author
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Johnson, Peter B., Kennedy, V. John, and Markwitz, Andreas
- Subjects
- *
HELIUM ions , *NUCLEAR physics , *INTERACTING boson models , *PHOTOSYNTHETIC oxygen evolution - Abstract
Abstract: Helium ion-implantation can be used to form a buried layer of nanoscale cavities in Ti. This offers the potential for diffusing dopant atoms of interest for biomedical applications, into a Ti surface. Disc specimens were taken from a He-implanted foil and a small spot in the centre was eroded to a different depth on each disc before treatment with synthetic biological fluid. IBA techniques (including RBS, NRA and PIXE) were used to determine the uptake of specific elements in two regions: the central eroded spot and the outer (un-eroded) region. The most significant effect was for oxygen. A small amount of prior erosion resulted in a threefold increase in the oxygen in both regions. Whereas, greater erosion caused a rapid reduction in the uptake in the centre, the strong enhancement in the outer region remained a striking feature. This provides convincing evidence that oxygen can move laterally over large distances through the nanoporous layer. [Copyright &y& Elsevier]
- Published
- 2006
- Full Text
- View/download PDF
20. On the use of ion beams for the selection of radioactive waste matrices
- Author
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Garrido, Frédérico, Gentils, Aurélie, and Thomé, Lionel
- Subjects
- *
RADIOACTIVE wastes , *ION bombardment , *NUCLEAR facilities , *NUCLEAR energy - Abstract
Abstract: The safe and long-term control of radioactive waste arising from nuclear power plants is one of the major challenges to the future use of nuclear energy. The evaluation of nuclear waste matrices relies on numerous conditions regarding the physico-chemical properties of the selected materials, such as resistance against oxidation or aqueous corrosion, stability in a radioactive environment, and ability to confine radioactive elements. Ion beams provide efficient tools for the evaluation of radwaste matrices since they allow to address three major issues: (i) the simulation of ion irradiation; (ii) the doping of the matrix with stable elements simulating the nuclei to be confined; and (iii) the characterization of the material by the use of nuclear microanalysis techniques. Illustrative examples are provided in the case of urania and zirconia. [Copyright &y& Elsevier]
- Published
- 2005
- Full Text
- View/download PDF
21. PIXE/PIGE characterization of medieval glass
- Author
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Šmit, Ž., Pelicon, P., Holc, M., and Kos, M.
- Subjects
- *
GLASS , *PROTON-induced X-ray emission - Abstract
The glasses of Ljubljana, related historically to the spread of glassworks in the Venetian style, were studied by a combined PIXE/PIGE method based on the in-air proton beam. The contribution of PIGE was determination of Na, Mg and Al oxides that provided (1) non-ambiguous characterization of the alkali and limestone component, (2) stable concentration evaluation algorithm relying on the normalization of all metal oxides to 100%. The majority of investigated samples form a compact group with small variations due to the alkalis used; a clear distinction from a few imported objects confirms local production. The raw materials in medieval glassworks differ significantly from those of Late Antiquity. [Copyright &y& Elsevier]
- Published
- 2002
22. Influence of Implantation Dose on the High-Temperature Oxidation of Al-Implanted AISI-321 Steel.
- Author
-
Noli, F., Misaelides, P., Pavlidou, E., Theodossiu, W., and Riviere, J.-P.
- Abstract
The influence of implantation dose on the oxidation behavior of AISI-321 stainless steel was investigated. The steel samples were implanted with Al+ ions of energy 40 keV (doses, 0.5 to 3×1017 ions/cm2) and oxidized in air at 650°C for 48 hr. For comparison purposes, samples were also implanted with a dose of 2×1017 ions/cm2 of energy 200 keV and treated in a similar way. Nuclear-reaction analysis (NRA) and Rutherford backscattering spectrometry (RBS) were used in order to investigate the oxidized samples and to determine the oxygen-depth distribution on the implanted samples. The depth distribution of the steel constituents was determined by secondary-ion mass spectroscopy (SIMS), whereas X-ray diffraction (XRD) was applied to the investigation of the formed oxide scales. The composition and the morphology of the modified region were examined by scanning electron microscopy (SEM-EDS). Al-implantation improves the oxidation resistance of the steel and affects the thermal behavior of the material depending on the implantation dose and energy. The influence of the implantation dose and energy are discussed and mechanisms to explain the experimental results are proposed. [ABSTRACT FROM AUTHOR]
- Published
- 2001
- Full Text
- View/download PDF
23. Determination of the Mg-Concentration Profile in Near-Surface Layers of Materials Using the 24Mg(α,p)27Al Nuclear Reaction.
- Author
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Noli, Fotini, Misaelides, Panagiotis, and Theodossiu, Evangelos
- Abstract
The
24 Mg(α, p)27 Al nuclear reaction was applied for the determination of the magnesium distribution in near-surface layers of materials. The cross sections of this reaction were determined in the energy region between 4.5 and 5.5 MeV in steps of 5 to 10 KeV (θlab : 158°) using thin magnesium films. The investigated projectile energy region included five main resonances allowing the determination of magnesium. The uncertainty of the cross-section determination was of the order of 7%. The applicability of the technique was tested using Mg-implanted AISI 321 steel samples. Depth resolution of 100 nm and detection limits of the order of 0.1 ppm were achieved for the determination of magnesium in steel samples using the 4805 keV resonance of the24 Mg(α, p)27 Al nuclear reaction. The shape and height of the magnesium depth-profile in the Mg-implanted steel samples were compared with corresponding values obtained by X-ray photoelectron spectroscopy. [ABSTRACT FROM AUTHOR]- Published
- 2000
- Full Text
- View/download PDF
24. The Effect of Al Implantation on the Thermal Oxidation of Stainless Steel in Aggressive Environments.
- Author
-
Noli, F., Misaelides, P., Giorginis, G., Baumann, H., and Pavlidou, E.
- Abstract
AISI-321 steel samples were implanted with Al ions (implantation-energy:40 keV; dose: 2×1017 ions/cm2). Thermal oxidationof the samples was performed at 450, 550, 600, and 650°C for periodsvarying from 1 to 6 days in air and in a corrosive CO2-containingenvironment. Nuclear Reaction Analysis (NRA) and Rutherford BackscatteringSpectrometry (RBS) were used to investigate the oxidized samples. Asignificant improvement of the oxidation resistance of the implantedmaterial in comparison to the nonimplanted material was observed. Thisespecially applies for samples oxidized at high temperatures. The aluminumdepth distribution determined by NRA [using the resonance at 992 keV of the27Al(p, γ )28Si nuclear reaction] and RBS,indicated no variation of the Al profile in the temperature region450–600°C, whereas at 650°C a slight Al diffusion wasobserved. Scanning electron microscopy (SEM–EDS) was applied to studythe surface morphology and the constitution of the oxide scale formed, aswell as to explain the influence of Al implantation on the oxidation behaviorof AISI-321 austenitic stainless steel. [ABSTRACT FROM AUTHOR]
- Published
- 2000
- Full Text
- View/download PDF
25. Material migration and fuel retention studies during the JET carbon divertor campaigns
- Author
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Alexander Lukin, Stefan Matejcik, Sebastijan Brezinsek, Matej Mayer, Anna Widdowson, Bohdan Bieg, Vladislav Plyusnin, José Vicente, Alberto Loarte, Andrea Murari, Axel Jardin, Rajnikant Makwana, CHIARA MARCHETTO, Choong-Seock Chang, Manuel Garcia-munoz, Department of Physics, Materials Physics, Universidad de Sevilla. Departamento de Física Atómica, Molecular y Nuclear, Universidad de Sevilla. RNM138: Física Nuclear Aplicada, and JET Contributors
- Subjects
Materials science ,EROSION ,Nuclear engineering ,chemistry.chemical_element ,INVENTORY ,01 natural sciences ,Wall material ,114 Physical sciences ,Methane ,010305 fluids & plasmas ,Fusion, plasma och rymdfysik ,chemistry.chemical_compound ,Divertor ,0103 physical sciences ,Plasma-facing components ,ddc:530 ,General Materials Science ,SURFACE-LAYERS ,ta216 ,010306 general physics ,Fusion ,ta218 ,Civil and Structural Engineering ,ta212 ,ta214 ,Ion beam analysis ,ta114 ,PLASMA ,Physics ,Mechanical Engineering ,Time resolution ,DEPTH PROFILES ,Plasma ,SCRAPE-OFF LAYER ,TRITIUM RETENTION ,Fusion, Plasma and Space Physics ,Carbon ,ION-BEAM ANALYSIS ,Nuclear Energy and Engineering ,chemistry ,JET ,DEPOSITED LAYERS ,HYDROGEN ISOTOPE RETENTION ,Fundamental change ,Beryllium - Abstract
The first divertor was installed in the JET machine between 1992 and 1994 and was operated with carbon tiles and then beryllium tiles in 1994-5. Post-mortem studies after these first experiments demonstrated that most of the impurities deposited in the divertor originate in the main chamber, and that asymmetric deposition patterns generally favouring the inner divertor region result from drift in the scrape-off layer. A new monolithic divertor structure was installed in 1996 which produced heavy deposition at shadowed areas in the inner divertor corner, which is where the majority of the tritium was trapped by co-deposition during the deuterium-tritium experiment in 1997. Different divertor geometries have been tested since such as the Gas-Box and High-Delta divertors; a principle objective has been to predict plasma behaviour, transport and tritium retention in ITER. Transport modelling experiments were carried out at the end of four campaigns by puffing C-13-labelled methane, and a range of diagnostics such as quartz-microbalance and rotating collectors have been installed to add time resolution to the post-mortem analyses. The study of material migration after D-D and D-T campaigns clearly revealed important consequences of fuel retention in the presence of carbon walls. They gave a strong impulse to make a fundamental change of wall materials. In 2010 the carbon divertor and wall tiles were removed and replaced with tiles with Be or W surfaces for the ITER-Like Wall Project. For complete list of authors see http://dx.doi.org/10.1016/j.fusengdes.2018.10.002
- Published
- 2019
- Full Text
- View/download PDF
26. Role of nuclear analytical probe techniques in biological trace-element research.
- Author
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Jones, K. and Pounds, J.
- Abstract
Many biomedical experiments require the qualitative and quantitative localization of trace elements with high sensitivity and good spatial resolution. The feasibility of measuring the chemical form of the elements, the time course of trace element metabolism, and conducting experiments in living biological systems are also important requirements for biological trace element research. Nuclear analytical techniques that employ ion or photon beams have grown in importance in the past decade and have led to several new experimental approaches. Some of the important features of these methods are reviewed here along with their role in trace element research. Examples of their use are given to illustrate potential for new research directions. It is emphasized that the effective application of these methods necessitates a closely integrated multidisciplinary scientific team. [ABSTRACT FROM AUTHOR]
- Published
- 1987
- Full Text
- View/download PDF
27. Subcellular mass determination by 4 He + energy-loss micro-spectrometry
- Author
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Guillaume Devès, Richard Ortega, Chimie Nucléaire Analytique et Bio-environnementale (CNAB), and Université Sciences et Technologies - Bordeaux 1-Centre National de la Recherche Scientifique (CNRS)
- Subjects
Microscopy, Electron, Scanning Transmission ,Analytical chemistry ,Adenocarcinoma ,Mass spectrometry ,Helium ,Biochemistry ,Microanalysis ,030218 nuclear medicine & medical imaging ,Analytical Chemistry ,Matrix (chemical analysis) ,03 medical and health sciences ,0302 clinical medicine ,Ion-beam analysis ,Spectrophotometry ,Microscopy ,medicine ,Humans ,[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det] ,Ovarian Neoplasms ,medicine.diagnostic_test ,Epoxy Resins ,Polyethylene Terephthalates ,Chemistry ,Spectrophotometry, Atomic ,Spectrometry, X-Ray Emission ,Scanning transmission ion microscopy ,Microbeam ,Fluorescence ,030220 oncology & carcinogenesis ,Cellular mass ,Female ,Field ion microscope ,Subcellular Fractions ,Chemical imaging - Abstract
International audience; The scanning transmission ion microscope (STIM) has been used to determine the intracellular mass of human cultured cells. A 4He+ microbeam of 2.0 MeV energy was chosen to obtain enhanced ion-energy-loss sensitivity through the micron-thick freeze-dried cells. Local sample mass calculation, based on energy-loss conversion by use of appropriate matrix stopping powers, was performed by use of dedicated software. The method was validated with epoxy resin sections and polymer foil as analogues of biological samples in the range of (intra) cellular thickness, 150 to 3000 nm. STIM analysis resulted in less than 5% error in mass determination. 4He+ energy-loss micro-spectrometry was performed on freezedried human ovarian cancer cells, the mean areal mass obtained was 120 µg cm–2 (200 µg cm–2 in the nucleus and 250 µg cm–2 in nucleoli). This method is particularly useful for mass normalization of X-ray fluorescence yields resulting from particle-induced X-ray emission microanalysis (micro-PIXE). When performed successively these two ion-beam micro-analytical methods enable the mapping of true element concentrations within single cells.
- Published
- 2002
- Full Text
- View/download PDF
28. Paintings? a challenge for XRF and PIXE analysis
- Author
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T. Tuurnala, L. Martinot, Guy Demortier, I. Brissaud, M. Mäder, A. Hautojärvi, C. Neelmeijer, Manfred Schreiner, Georges Weber, and Thomas Calligaro
- Subjects
Painting ,Paint layers ,Computer science ,XRF ,Metallurgy ,Mineralogy ,Analyse qualitative ,Qualitative analysis ,paint layer identification ,ion-beam analysis ,Inorganic pigments ,non-destructive analysis ,PIXE ,RBS ,x-ray fluorescence analysis ,Spectroscopy - Abstract
Conventional pigment analysis of paintings requires the removal of micro-samples followed by the preparation of cross-sections. There are also requirements for investigating several locations within a painting in order to obtain information about dating and provenance or the reason for aesthetic impressions of the paint materials. The need to carry out such work without removing samples prompted the present project, in which the authors aimed to examine the possibility of applying XRF and PIXE methods in a complementary manner. The ion beam techniques of external PIXE plus Rutherford backscattering could distinguish painting techniques, i.e. paint layer arrangements and pigment admixtures, whereas portable XRF represents a valuable tool for preselecting the objects of interest which could be transported to the ion beam laboratory. This procedure was tested using samples of prepared paint layers. It is shown that it is possible to distinguish between two or three layers. The situation would be more difficult for more complex paint layer arrangements. Copyright © 2000 John Wiley & Sons, Ltd.
- Published
- 2000
- Full Text
- View/download PDF
29. Recent Exploits of the ISOLTRAP Mass Spectrometer
- Author
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Thomas Elias Cocolios, Alexander Herlert, S. Naimi, D. Neidherr, D. Beck, Alban Kellerbauer, Frank Wienholtz, J. Stanja, Christopher Borgmann, E. Minaya Ramirez, Kai Zuber, Klaus Blaum, Ulli Köster, Dinko Atanasov, Magda Kowalska, R.E. Rossel, Robert Wolf, Christine Böhm, D. Lunney, Vladimir Manea, T. Nicol, Lutz Schweikhard, Marco Rosenbusch, M. Breitenfeldt, D. A. Fink, Susanne Kreim, Sebastian George, CSNSM SNO, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11)-Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Université Paris-Sud - Paris 11 (UP11), Centre Interdisciplinaire de Recherche Ions Lasers (CIRIL), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Normandie Université (NU)-Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Centre National de la Recherche Scientifique (CNRS), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)-Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), and Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)
- Subjects
Penning-trap mass spectrometry ,Nuclear and High Energy Physics ,Large Hadron Collider ,Ion beam analysis ,Chemistry ,010401 analytical chemistry ,Measurement of pure ion ensembles ,[PHYS.NEXP]Physics [physics]/Nuclear Experiment [nucl-ex] ,Mass spectrometry ,Penning trap ,01 natural sciences ,ISOLTRAP ,Multi-reflection time-of-flight mass separator ,0104 chemical sciences ,Secondary ion mass spectrometry ,Nuclear physics ,Ion-beam analysis ,0103 physical sciences ,Beam purification ,Ion trap ,Atomic physics ,010306 general physics ,Nuclear Experiment ,Instrumentation ,Hybrid mass spectrometer - Abstract
The Penning-trap mass spectrometer ISOLTRAP, located at the isotope-separator facility ISOLDE (CERN), is presented in its current form taking into account technical developments since 2007. Three areas of developments are presented. The reference ion sources have been modified to guarantee a sufficient supply of reference ions for mass measurements and systematic studies. Different excitation schemes have been investigated for manipulation of the ion motion in the Penning trap, to enhance either the purification or measurement process. A multi-reflection time-of-flight mass separator has been implemented and can now be routinely used for purification and as a versatile tool for beam analysis.
- Published
- 2013
- Full Text
- View/download PDF
30. High temperature diffraction study of in-situ crystallization of nanostructured TiO2 photocatalysts
- Author
-
Low, It Meng, Curtain, Ben, Philipps, M., Liu, Z., Ionescu, M., Low, It Meng, Curtain, Ben, Philipps, M., Liu, Z., and Ionescu, M.
- Abstract
The in-situ crystallization of anatase and rutile on chemically-treated Ti-foils in the temperature range 20-900ºC has been investigated using synchrotron radiation diffraction and x-ray diffraction. The processing methodology has a profound influence on the morphology, crystallite size and growth rate of nanostructured TiO2. The anatase formed was metastable and transformed to rutile at ~800ºC. Increasing the temperature from 400 to 900ºC caused the sharpening of anatase (101) peaks and resulted in a concomitant coarsening in crystallite size. The surface of annealed samples exhibited TiO2 nanorods, nanowires or nanotubes depending on the processing method. Ion-beam analysis has indicated the existence of composition gradation within the annealed TiO2 samples at the near-surface.
- Published
- 2012
31. Kunstwerke - zerstörungsfreie Materialanalyse
- Author
-
Neelmeijer, C. and Neelmeijer, C.
- Abstract
Kunstwerke sind Unikate, unwiederbringliche Zeugen vergangener Zeit. Ähnlich wie Patienten können sie erkranken, unterliegen der Alterung und bedürfen der Pflege. Das Material, woraus sie bestehen und das Klima, in dem sie aufbewahrt werden, bestimmen ihr Wohlbefinden. Die Oberfläche von Kunstwerken aus Glas, zum Beispiel, kann rosten wie Metall. Wenn das Glasobjekt matt und rissig erscheint, kommt Abhilfe schon sehr spät. Präventive Konservierung heißt das Zauberwort, Vorsorge also. Entscheidend dafür ist die Früherkennung von Veränderungen besser noch die Einschätzung möglicher Schädigungen. Dazu dient die zerstörungsfreie Materialanalyse. Das kann der Protonenstrahl an Luft im Zusammenspiel mit empfindlicher Messtechnik. Am Beispiel Glas, aber auch an Gemälden, Zeichnungen, Tinten auf Urkunden gibt die Präsentation Antworten auf die typischen Fragen von Restauratoren und Kunstwissenschaftlern: Wie gefährdet ist das Kunstwerk, welche Technologien hat der Künstler verwandt um bestimmte ästhetische Eindrücke zu erlangen, gibt es Anzeichen für eine Kopie anstelle des Originals?
- Published
- 2010
32. Zerstörungsfreie Materialanalyse an Kunstwerken
- Author
-
Neelmeijer, C. and Neelmeijer, C.
- Abstract
Kunstwerke sind Unikate, unwiederbringliche Zeugen vergangener Zeit. Ähnlich wie Patienten können sie erkranken, unterliegen der Alterung und bedürfen der Pflege. Das Material, woraus sie bestehen und das Klima, in dem sie aufbewahrt werden, bestimmen ihr Wohlbefinden. Die Oberfläche von Kunstwerken aus Glas, zum Beispiel, kann rosten wie Metall. Wenn das Glasobjekt matt und rissig erscheint, kommt Abhilfe schon sehr spät. Präventive Konservierung heißt das Zauberwort, Vorsorge also. Entscheidend dafür ist die Früherkennung von Veränderungen besser noch die Einschätzung möglicher Schädigungen. Dazu dient die zerstörungsfreie Materialanalyse. Das kann der Protonenstrahl an Luft im Zusammenspiel mit empfindlicher Messtechnik. Am Beispiel Glas, aber auch an Gemälden, Zeichnungen, Tinten auf Urkunden gibt die Präsentation Antworten auf die typischen Fragen von Restauratoren und Kunstwissenschaftlern: Wie gefährdet ist das Kunstwerk, welche Technologien hat der Künstler verwandt um bestimmte ästhetische Eindrücke zu erlangen, gibt es Anzeichen für eine Kopie anstelle des Originals?
- Published
- 2009
33. On the use of ion beams for the selection of radioactive waste matrices
- Author
-
Lionel Thomé, F. Garrido, A. Gentils, Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS), R. Wei, G. Dearnaley, and J. Arps
- Subjects
Materials science ,Ion beam ,Nuclear engineering ,ceramic ,02 engineering and technology ,7. Clean energy ,01 natural sciences ,Microanalysis ,Matrix (mathematics) ,0103 physical sciences ,Materials Chemistry ,010302 applied physics ,nuclear waste ,Ion beam analysis ,business.industry ,Radiochemistry ,ion irradiation ,retention capacity ,Radioactive waste ,Surfaces and Interfaces ,General Chemistry ,Nuclear power ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,Surfaces, Coatings and Films ,Characterization (materials science) ,13. Climate action ,ion-beam analysis ,[PHYS.PHYS.PHYS-CHEM-PH]Physics [physics]/Physics [physics]/Chemical Physics [physics.chem-ph] ,0210 nano-technology ,business ,Radioactive decay - Abstract
The safe and long-term control of radioactive waste arising from nuclear power plants is one of the major challenges to the future use of nuclear energy. The evaluation of nuclear waste matrices relies on numerous conditions regarding the physico-chemical properties of the selected materials, such as resistance against oxidation or aqueous corrosion, stability in a radioactive environment, and ability to confine radioactive elements. Ion beams provide efficient tools for the evaluation of radwaste matrices since they allow to address three major issues: (i) the simulation of ion irradiation; (ii) the doping of the matrix with stable elements simulating the nuclei to be confined; and (iii) the characterization of the material by the use of nuclear microanalysis techniques. Illustrative examples are provided in the case of urania and zirconia.
- Published
- 2003
- Full Text
- View/download PDF
34. Analysis of plasma facing materials : material migration and fuel retention
- Author
-
Rubel, Marek J. and Rubel, Marek J.
- Abstract
Key issues in the characterization and analysis of plasma facing materials are presented. The influence of plasma operation on the material modification and fuel inventory is emphasized. The role of analysis in the process of material selection and qualification for usage in controlled fusion devices is also addressed. Various methods for the determination of fuel species in wall components are reviewed. The underlying physics of methods, practical aspects of analysis procedures and special instrumentation for studies of plasma facing components are described., QC 20100525 QC 20111003. Conference: 5th International Workshop and Summer School on Plasma Physics. POLAND. JUN 06-10, 2005
- Published
- 2006
- Full Text
- View/download PDF
35. Paintings - a challenge for XRF and PIXE analysis
- Author
-
Neelmeijer, C., Brissaud, I., Calligaro, T., Demortier, G., Hautojärvi, A., Mäder, M., Martinot, L., Schreiner, M., Tuurnala, T., Weber, G., Neelmeijer, C., Brissaud, I., Calligaro, T., Demortier, G., Hautojärvi, A., Mäder, M., Martinot, L., Schreiner, M., Tuurnala, T., and Weber, G.
- Abstract
Conventional pigment analysis of paintings requires the removal of micro-samples followed by the preparation of cross-sections. There are also requirements for investigating several locations within a painting in order to obtain information about dating and provenance or the reason for aesthetic impressions of the paint materials. The need to carry out such work without removing samples prompted the present project, in which the authors aimed to examine the possibility of applying XRF and PIXE methods in a complementary manner. The ion beam techniques of external PIXE plus Rutherford backscattering could distinguish painting techniques, i.e. paint layer arrangements and pigment admixtures, whereas portable XRF represents a valuable tool for preselecting the objects of interest which could be transported to the ion beam laboratory. This procedure was tested using samples of prepared paint layers. It is shown that it is possible to distinguish between two or three layers. The situation would be more difficult for more complex paint layer arrangements.
- Published
- 2000
36. Alternativní přístupy přípravy tenké vrstvy nitridu hliníku pomocí metody depozice atomárních vrstev
- Author
-
Sedlák, Petr, Krčma, František, Kolařík, Vladimír, Dallaev, Rashid, Sedlák, Petr, Krčma, František, Kolařík, Vladimír, and Dallaev, Rashid
- Abstract
Nitrid hliníku (AlN) je slibný polovodivý materiál s velkou mezerou v pásu. Tenké filmy AlN nacházejí uplatnění v různých elektronických a optoelektronických zařízeních. V první řadě je cílem výzkumu prezentovaného v rámci této disertační práce představit nové prekurzory do procesu ALD pro depozici tenkých vrstev AlN. Navrhované prekurzory jsou lepší než tradiční prekurzory buď v nákladové efektivnosti nebo reaktivitě. Část disertační práce je věnována prohloubení porozumění chemickým procesům, které probíhají během a po depozici. V tomto ohledu bylo navrženo pracovní řešení ke zlepšení chemického složení výsledných filmů a ke zmírnění nedostatků, například oxidace. Dalším důležitým aspektem této studie je důkladná analýza fenoménu vodíku v tenkých vrstvách AlN ALD. Vodíkové nečistoty byly zkoumány pomocí přesných a pokročilých technik patřících do skupin analýzy iontovým paprskem (IBA)., Aluminum nitride (AlN) is a promising semi-conductive material with a wide band gap. Thin films of AlN find implementation in a variety of electronic and optoelectronic devices. First and foremost, the aim of the research presented within the scope of this dissertation is to introduce new precursors into ALD process for deposition of AlN thin films. The proposed precursors are superior to traditional ones either in cost-efficiency or reactivity. A part of the dissertation is devoted to enhancement of the understanding of chemical processes which take place during and after deposition. In this regard, a working solution to improving the chemical composition of the resulting films, as well as ameliorating deficiencies, for instance, oxidization, has been proposed. Another important aspect of this study has to do with a thorough analysis of hydrogen phenomenon in AlN ALD thin films. Hydrogen impurities have been investigated with the use of accurate and advanced techniques belonging to ion-beam analysis (IBA) groups.
37. Alternativní přístupy přípravy tenké vrstvy nitridu hliníku pomocí metody depozice atomárních vrstev
- Author
-
Sedlák, Petr, Krčma, František, Kolařík, Vladimír, Dallaev, Rashid, Sedlák, Petr, Krčma, František, Kolařík, Vladimír, and Dallaev, Rashid
- Abstract
Nitrid hliníku (AlN) je slibný polovodivý materiál s velkou mezerou v pásu. Tenké filmy AlN nacházejí uplatnění v různých elektronických a optoelektronických zařízeních. V první řadě je cílem výzkumu prezentovaného v rámci této disertační práce představit nové prekurzory do procesu ALD pro depozici tenkých vrstev AlN. Navrhované prekurzory jsou lepší než tradiční prekurzory buď v nákladové efektivnosti nebo reaktivitě. Část disertační práce je věnována prohloubení porozumění chemickým procesům, které probíhají během a po depozici. V tomto ohledu bylo navrženo pracovní řešení ke zlepšení chemického složení výsledných filmů a ke zmírnění nedostatků, například oxidace. Dalším důležitým aspektem této studie je důkladná analýza fenoménu vodíku v tenkých vrstvách AlN ALD. Vodíkové nečistoty byly zkoumány pomocí přesných a pokročilých technik patřících do skupin analýzy iontovým paprskem (IBA)., Aluminum nitride (AlN) is a promising semi-conductive material with a wide band gap. Thin films of AlN find implementation in a variety of electronic and optoelectronic devices. First and foremost, the aim of the research presented within the scope of this dissertation is to introduce new precursors into ALD process for deposition of AlN thin films. The proposed precursors are superior to traditional ones either in cost-efficiency or reactivity. A part of the dissertation is devoted to enhancement of the understanding of chemical processes which take place during and after deposition. In this regard, a working solution to improving the chemical composition of the resulting films, as well as ameliorating deficiencies, for instance, oxidization, has been proposed. Another important aspect of this study has to do with a thorough analysis of hydrogen phenomenon in AlN ALD thin films. Hydrogen impurities have been investigated with the use of accurate and advanced techniques belonging to ion-beam analysis (IBA) groups.
38. Alternativní přístupy přípravy tenké vrstvy nitridu hliníku pomocí metody depozice atomárních vrstev
- Author
-
Sedlák, Petr, Krčma, František, Kolařík, Vladimír, Dallaev, Rashid, Sedlák, Petr, Krčma, František, Kolařík, Vladimír, and Dallaev, Rashid
- Abstract
Nitrid hliníku (AlN) je slibný polovodivý materiál s velkou mezerou v pásu. Tenké filmy AlN nacházejí uplatnění v různých elektronických a optoelektronických zařízeních. V první řadě je cílem výzkumu prezentovaného v rámci této disertační práce představit nové prekurzory do procesu ALD pro depozici tenkých vrstev AlN. Navrhované prekurzory jsou lepší než tradiční prekurzory buď v nákladové efektivnosti nebo reaktivitě. Část disertační práce je věnována prohloubení porozumění chemickým procesům, které probíhají během a po depozici. V tomto ohledu bylo navrženo pracovní řešení ke zlepšení chemického složení výsledných filmů a ke zmírnění nedostatků, například oxidace. Dalším důležitým aspektem této studie je důkladná analýza fenoménu vodíku v tenkých vrstvách AlN ALD. Vodíkové nečistoty byly zkoumány pomocí přesných a pokročilých technik patřících do skupin analýzy iontovým paprskem (IBA)., Aluminum nitride (AlN) is a promising semi-conductive material with a wide band gap. Thin films of AlN find implementation in a variety of electronic and optoelectronic devices. First and foremost, the aim of the research presented within the scope of this dissertation is to introduce new precursors into ALD process for deposition of AlN thin films. The proposed precursors are superior to traditional ones either in cost-efficiency or reactivity. A part of the dissertation is devoted to enhancement of the understanding of chemical processes which take place during and after deposition. In this regard, a working solution to improving the chemical composition of the resulting films, as well as ameliorating deficiencies, for instance, oxidization, has been proposed. Another important aspect of this study has to do with a thorough analysis of hydrogen phenomenon in AlN ALD thin films. Hydrogen impurities have been investigated with the use of accurate and advanced techniques belonging to ion-beam analysis (IBA) groups.
39. Alternativní přístupy přípravy tenké vrstvy nitridu hliníku pomocí metody depozice atomárních vrstev
- Author
-
Sedlák, Petr, Krčma, František, Kolařík, Vladimír, Sedlák, Petr, Krčma, František, and Kolařík, Vladimír
- Abstract
Nitrid hliníku (AlN) je slibný polovodivý materiál s velkou mezerou v pásu. Tenké filmy AlN nacházejí uplatnění v různých elektronických a optoelektronických zařízeních. V první řadě je cílem výzkumu prezentovaného v rámci této disertační práce představit nové prekurzory do procesu ALD pro depozici tenkých vrstev AlN. Navrhované prekurzory jsou lepší než tradiční prekurzory buď v nákladové efektivnosti nebo reaktivitě. Část disertační práce je věnována prohloubení porozumění chemickým procesům, které probíhají během a po depozici. V tomto ohledu bylo navrženo pracovní řešení ke zlepšení chemického složení výsledných filmů a ke zmírnění nedostatků, například oxidace. Dalším důležitým aspektem této studie je důkladná analýza fenoménu vodíku v tenkých vrstvách AlN ALD. Vodíkové nečistoty byly zkoumány pomocí přesných a pokročilých technik patřících do skupin analýzy iontovým paprskem (IBA)., Aluminum nitride (AlN) is a promising semi-conductive material with a wide band gap. Thin films of AlN find implementation in a variety of electronic and optoelectronic devices. First and foremost, the aim of the research presented within the scope of this dissertation is to introduce new precursors into ALD process for deposition of AlN thin films. The proposed precursors are superior to traditional ones either in cost-efficiency or reactivity. A part of the dissertation is devoted to enhancement of the understanding of chemical processes which take place during and after deposition. In this regard, a working solution to improving the chemical composition of the resulting films, as well as ameliorating deficiencies, for instance, oxidization, has been proposed. Another important aspect of this study has to do with a thorough analysis of hydrogen phenomenon in AlN ALD thin films. Hydrogen impurities have been investigated with the use of accurate and advanced techniques belonging to ion-beam analysis (IBA) groups.
40. Alternativní přístupy přípravy tenké vrstvy nitridu hliníku pomocí metody depozice atomárních vrstev
- Author
-
Sedlák, Petr, Krčma, František, Kolařík, Vladimír, Sedlák, Petr, Krčma, František, and Kolařík, Vladimír
- Abstract
Nitrid hliníku (AlN) je slibný polovodivý materiál s velkou mezerou v pásu. Tenké filmy AlN nacházejí uplatnění v různých elektronických a optoelektronických zařízeních. V první řadě je cílem výzkumu prezentovaného v rámci této disertační práce představit nové prekurzory do procesu ALD pro depozici tenkých vrstev AlN. Navrhované prekurzory jsou lepší než tradiční prekurzory buď v nákladové efektivnosti nebo reaktivitě. Část disertační práce je věnována prohloubení porozumění chemickým procesům, které probíhají během a po depozici. V tomto ohledu bylo navrženo pracovní řešení ke zlepšení chemického složení výsledných filmů a ke zmírnění nedostatků, například oxidace. Dalším důležitým aspektem této studie je důkladná analýza fenoménu vodíku v tenkých vrstvách AlN ALD. Vodíkové nečistoty byly zkoumány pomocí přesných a pokročilých technik patřících do skupin analýzy iontovým paprskem (IBA)., Aluminum nitride (AlN) is a promising semi-conductive material with a wide band gap. Thin films of AlN find implementation in a variety of electronic and optoelectronic devices. First and foremost, the aim of the research presented within the scope of this dissertation is to introduce new precursors into ALD process for deposition of AlN thin films. The proposed precursors are superior to traditional ones either in cost-efficiency or reactivity. A part of the dissertation is devoted to enhancement of the understanding of chemical processes which take place during and after deposition. In this regard, a working solution to improving the chemical composition of the resulting films, as well as ameliorating deficiencies, for instance, oxidization, has been proposed. Another important aspect of this study has to do with a thorough analysis of hydrogen phenomenon in AlN ALD thin films. Hydrogen impurities have been investigated with the use of accurate and advanced techniques belonging to ion-beam analysis (IBA) groups.
41. Alternativní přístupy přípravy tenké vrstvy nitridu hliníku pomocí metody depozice atomárních vrstev
- Author
-
Sedlák, Petr, Krčma, František, Kolařík, Vladimír, Sedlák, Petr, Krčma, František, and Kolařík, Vladimír
- Abstract
Nitrid hliníku (AlN) je slibný polovodivý materiál s velkou mezerou v pásu. Tenké filmy AlN nacházejí uplatnění v různých elektronických a optoelektronických zařízeních. V první řadě je cílem výzkumu prezentovaného v rámci této disertační práce představit nové prekurzory do procesu ALD pro depozici tenkých vrstev AlN. Navrhované prekurzory jsou lepší než tradiční prekurzory buď v nákladové efektivnosti nebo reaktivitě. Část disertační práce je věnována prohloubení porozumění chemickým procesům, které probíhají během a po depozici. V tomto ohledu bylo navrženo pracovní řešení ke zlepšení chemického složení výsledných filmů a ke zmírnění nedostatků, například oxidace. Dalším důležitým aspektem této studie je důkladná analýza fenoménu vodíku v tenkých vrstvách AlN ALD. Vodíkové nečistoty byly zkoumány pomocí přesných a pokročilých technik patřících do skupin analýzy iontovým paprskem (IBA)., Aluminum nitride (AlN) is a promising semi-conductive material with a wide band gap. Thin films of AlN find implementation in a variety of electronic and optoelectronic devices. First and foremost, the aim of the research presented within the scope of this dissertation is to introduce new precursors into ALD process for deposition of AlN thin films. The proposed precursors are superior to traditional ones either in cost-efficiency or reactivity. A part of the dissertation is devoted to enhancement of the understanding of chemical processes which take place during and after deposition. In this regard, a working solution to improving the chemical composition of the resulting films, as well as ameliorating deficiencies, for instance, oxidization, has been proposed. Another important aspect of this study has to do with a thorough analysis of hydrogen phenomenon in AlN ALD thin films. Hydrogen impurities have been investigated with the use of accurate and advanced techniques belonging to ion-beam analysis (IBA) groups.
42. Material migration and fuel retention studies during the JET carbon divertor campaigns
- Author
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Coad, J. P., Rubel, M., Likonen, J., Bekris, N., Brezinsek, S., Matthew, G. F., Mayer, M., Widdowson, A. M., Abduallev, S., Abhangi, M., Abreu, P., Afzal, M., Aggarwal, K. M., Ahlgren, T., Ahn, J. H., Aho-Mantila, L., Aiba, N., Airila, M., Albanese, R., Aldred, V., Alegre, D., Alessi, E., Aleynikov, P., Alfier, A., Alkseev, A., Allinson, M., Alper, B., Alves, E., Ambrosino, G., Ambrosino, R., Amicucci, L., Amosov, V., Sunden, E. Andersson, Angelone, M., Anghel, M., Angioni, C., Appel, L., Appelbee, C., Arena, P., Ariola, M., Arnichand, H., Arshad, S., Ash, A., Ashikawa, N., Aslanyan, V., Asunta, O., Auriemma, F., Austin, Y., Avotina, L., Axton, M. D., Ayres, C., Bacharis, M., Baciero, A., Baiao, D., Bailey, S., Baker, A., Balboa, I., Balden, M., Balshaw, N., Bament, R., Banks, J. W., Baranov, Y. F., Barnard, M. A., Barnes, D., Barnes, M., Barnsley, R., Wiechec, A. Baron, Orte, L. Barrera, Baruzzo, M., Basiuk, V., Bassan, M., Bastow, R., Batista, A., Batistoni, P., Baughan, R., Bauvir, B., Baylor, L., Bazylev, B., Beal, J., Beaumont, P. S., Beckers, M., Beckett, B., Becoulet, A., Beldishevski, M., Bell, K., Belli, F., Bellinger, M., Belonohy, E., Ben Ayed, N., Benterman, N. A., Bergsaker, H., Bernardo, J., Bernert, M., Berry, M., Bertalot, L., Besliu, C., Beurskens, M., Bieg, B., Bielecki, J., Biewer, T., Bigi, M., Bilkova, P., Binda, F., Bisoffi, A., Bizarro, J. P. S., Bjorkas, C., Blackburn, J., Blackman, K., Blackman, T. R., Blanchard, P., Blatchford, P., Bobkov, V., Boboc, A., Bodnar, G., Bogar, O., Bolshakova, I., Bolzonella, T., Bonanomi, N., Bonelli, F., Boom, J., Booth, J., Borba, D., Borodin, D., Borodkina, I., Botrugno, A., Bottereau, C., Boulting, P., Bourdelle, C., Bowden, M., Bower, C., Bowman, C., Boyce, T., Boyd, C., Boyer, H. J., Bradshaw, J. M. A., Braic, V., Bravanec, R., Breizman, B., Bremond, S., Brennan, P. D., Breton, S., Brett, A., Bright, M. D. J., Brix, M., Broeckx, W., Brombin, M., Broslawski, A., Brown, D. P. D., Brown, M., Bruno, E., Bucalossi, J., Buch, J., Buchanan, J., Buckley, M. A., Budny, R., Bufferand, H., Bulman, M., Bulmer, N., Bunting, P., Buratti, P., Burckhart, A., Buscarino, A., Busse, A., Butler, N. K., Bykov, I., Byrne, J., Cahyna, P., Calabro, G., Calvo, I., Camenen, Y., Camp, P., Campling, D. C., Cane, J., Cannas, B., Capel, A. J., Card, P. J., Cardinali, A., Carman, P., Carr, M., Carralero, D., Carraro, L., Carvalho, B. B., Carvalho, I., Carvalho, P., Casson, F. J., Castaldo, C., Catarino, N., Caumont, J., Causa, F., Cavazzana, R., Cave-Ayland, K., Cavinato, M., Cecconello, M., Ceccuzzi, S., Cecil, E., Cenedese, A., Cesario, R., Challis, C. D., Chandler, M., Chandra, D., Chang, C. S., Chankin, A., Chapman, I. T., Chapman, S. C., Chernyshova, M., Chitarin, G., Ciraolo, G., Ciric, D., Citrin, J., Clairet, F., Clark, E., Clark, M., Clarkson, R., Clatworthy, D., Clements, C., Cleverly, M., Coates, P. A., Cobalt, A., Coccorese, V., Cocilovo, V., Coda, S., Coelho, R., Coenen, J. W., Coffey, I., Colas, L., Collins, S., Conka, D., Conroy, S., Conway, N., Coombs, D., Cooper, D., Cooper, S. R., Corradino, C., Corre, Y., Corrigan, G., Cortes, S., Coster, D., Couchman, A. S., Cox, M. P., Craciunescu, T., Cramp, S., Craven, R., Crisanti, F., Croci, G., Croft, D., Crombe, K., Crowe, R., Cruz, N., Cseh, G., Cufar, A., Cullen, A., Curuia, M., Czarnecka, A., Dabirikhah, H., Dalgliesh, P., Dalley, S., Dankowski, J., Darrow, D., Davies, O., Davis, W., Day, C., Day, I. E., De Bock, M., de Castro, A., de la Cal, E., de la Luna, E., De Masi, G., de Pablos, J. L., De Temmerman, G., De Tommasi, G., de Vries, P., Deakin, K., Deane, J., Agostini, F. Degli, Dejarnac, R., Delabie, E., den Harder, N., Dendy, R. O., Denis, J., Denner, P., Devaux, S., Devynck, P., Di Maio, F., Di Siena, A., Di Troia, C., Dinca, P., D'Inca, R., Ding, B., Dittmar, T., Doerk, H., Doerner, R. P., Donne, T., Dorling, S. E., Dormido-Canto, S., Doswon, S., Douai, D., Doyle, P. T., Drenik, A., Drewelow, P., Drews, P., Duckworth, Ph., Dumont, R., Dumortier, P., Dunai, D., Dunne, M., Duran, I., Durodie, F., Dutta, P., Duval, B. P., Dux, R., Dylst, K., Dzysiuk, N., Edappala, P. V., Edmond, J., Edwards, A. M., Edwards, J., Eich, Th., Ekedahl, A., El-Jorf, R., Elsmore, C. G., Enachescu, M., Ericsson, G., Eriksson, F., Eriksson, J., Eriksson, L. G., Esposito, B., Esquembri, S., Esser, H. G., Esteve, D., Evans, B., Evans, G. E., Evison, G., Ewart, G. D., Fagan, D., Faitsch, M., Falie, D., Fanni, A., Fasoli, A., Faustin, J. M., Fawlk, N., Fazendeiro, L., Fedorczak, N., Felton, R. C., Fenton, K., Fernades, A., Fernandes, H., Ferreira, J., Fessey, J. A., Fevrier, O., Ficker, O., Field, A., Fietz, S., Figueiredo, A., Figueiredo, J., Fil, A., Finburg, P., Firdaouss, M., Fischer, U., Fittill, L., Fitzgerald, M., Flammini, D., Flanagan, J., Fleming, C., Flinders, K., Fonnesu, N., Fontdecaba, J. M., Formisano, A., Forsythe, L., Fortuna, L., Fortuna-Zalesna, E., Fortune, M., Foster, S., Franke, T., Franklin, T., Frasca, M., Frassinetti, L., Freisinger, M., Fresa, R., Frigione, D., Fuchs, V., Fuller, D., Futatani, S., Fyvie, J., Gal, K., Galassi, D., Galazka, K., Galdon-Quiroga, J., Gallagher, J., Gallart, D., Galvao, R., Gao, X., Gao, Y., Garcia, J., Garcia-Carrasco, A., Garcia-Munoz, M., Gardarein, J. -L., Garzotti, L., Gaudio, P., Gauthier, E., Gear, D. F., Gee, S. J., Geiger, B., Gelfusa, M., Gerasimov, S., Gervasini, G., Gethins, M., Ghani, Z., Ghate, M., Gherendi, M., Giacalone, J. C., Giacomelli, L., Gibson, C. S., Giegerich, T., Gil, C., Gil, L., Gilligan, S., Gin, D., Giovannozzi, E., Girardo, J. B., Giroud, C., Giruzzi, G., Gloeggler, S., Godwin, J., Goff, J., Gohil, P., Goloborod'ko, V., Gomes, R., Goncalves, B., Goniche, M., Goodliffe, M., Goodyear, A., Gorini, G., Gosk, M., Goulding, R., Goussarov, A., Gowland, R., Graham, B., Graham, M. E., Graves, J. P., Grazier, N., Grazier, P., Green, N. R., Greuner, H., Grierson, B., Griph, F. S., Grisolia, C., Grist, D., Groth, M., Grove, R., Grundy, C. N., Grzonka, J., Guard, D., Guerard, C., Guillemaut, C., Guirlet, R., Gurl, C., Utoh, H. H., Hackett, L. J., Hacquin, S., Hagar, A., Hager, R., Hakola, A., Halitovs, M., Hall, S. J., Cook, S. P. Hallworth, Hamlyn-Harris, C., Hammond, K., Harrington, C., Harrison, J., Harting, D., Hasenbeck, F., Hatano, Y., Hatch, D. R., Haupt, T. D. V., Hawes, J., Hawkes, N. C., Hawkins, J., Hawkins, P., Haydon, P. W., Hayter, N., Hazel, S., Heesterman, P. J. L., Heinola, K., Hellesen, C., Hellsten, T., Helou, W., Hemming, O. N., Hender, T. C., Henderson, M., Henderson, S. S., Henriques, R., Hepple, D., Hermon, G., Hertout, P., Hidalgo, C., Highcock, E. G., Hill, M., Hillairet, J., Hillesheim, J., Hillis, D., Hizanidis, K., Hjalmarsson, A., Hobirk, J., Hodille, E., Hogben, C. H. A., Hogeweij, G. M. D., Hollingsworth, A., Hollis, S., Homfray, D. A., Horacek, J., Hornung, G., Horton, A. R., Horton, L. D., Horvath, L., Hotchin, S. P., Hough, M. R., Howarth, P. J., Hubbard, A., Huber, A., Huber, V., Huddleston, T. M., Hughes, M., Huijsmans, G. T. A., Hunter, C. L., Huynh, P., Hynes, A. M., Iglesias, D., Imazawa, N., Imbeaux, F., Imrisek, M., Incelli, M., Innocente, P., Irishkin, M., Ivanova-Stanik, I., Jachmich, S., Jacobsen, A. S., Jacquet, P., Jansons, J., Jardin, A., Jarvinen, A., Jaulmes, F., Jednorog, S., Jenkins, I., Jeong, C., Jepu, I., Joffrin, E., Johnson, R., Johnson, T., Johnston, Jane, Joita, L., Jones, G., Jones, T. T. C., Hoshino, K. K., Kallenbach, A., Kamiya, K., Kaniewski, J., Kantor, A., Kappatou, A., Karhunen, J., Karkinsky, D., Karnowska, I., Kaufman, M., Kaveney, G., Kazakov, Y., Kazantzidis, V., Keeling, D. L., Keenan, T., Keep, J., Kempenaars, M., Kennedy, C., Kenny, D., Kent, J., Kent, O. N., Khilkevich, E., Kim, H. T., Kim, H. S., Kinch, A., King, C., King, D., King, R. F., Kinna, D. J., Kiptily, V., Kirk, A., Kirov, K., Kirschner, A., Kizane, G., Klepper, C., Klix, A., Knight, P., Knipe, S. J., Knott, S., Kobuchi, T., Koechl, F., Kocsis, G., Kodeli, I., Kogan, L., Kogut, D., Koivuranta, S., Kominis, Y., Koeppen, M., Kos, B., Koskela, T., Koslowski, H. R., Koubiti, M., Kovari, M., Kowalska-Strzeciwilk, E., Krasilnikov, A., Krasilnikov, V., Krawczyk, N., Kresina, M., Krieger, K., Krivska, A., Kruezi, U., Ksiazek, I., Kukushkin, A., Kundu, A., Kurki-Suonio, T., Kwak, S., Kwiatkowski, R., Kwon, O. J., Laguardia, L., Lahtinen, A., Laing, A., Lam, N., Lambertz, H. T., Lane, C., Lang, P. T., Lanthaler, S., Lapins, J., Lasa, A., Last, J. R., Laszynska, E., Lawless, R., Lawson, A., Lawson, K. D., Lazaros, A., Lazzaro, E., Leddy, J., Lee, S., Lefebvre, X., Leggate, H. J., Lehmann, J., Lehnen, M., Leichtle, D., Leichuer, P., Leipold, F., Lengar, I., Lennholm, M., Lerche, E., Lescinskis, A., Lesnoj, S., Letellier, E., Leyland, M., Leysen, W., Li, L., Liang, Y., Linke, J., Linsmeier, Ch., Lipschultz, B., Liu, G., Liu, Y., Lo Schiavo, V. P., Loarer, T., Loarte, A., Lobel, R. C., Lomanowski, B., Lomas, P. J., Lonnroth, J., Lopez, J. M., Lopez-Razola, J., Lorenzini, R., Losada, U., Lovell, J. J., Loving, A. B., Lowry, C., Luce, T., Lucock, R. M. A., Lukin, A., Luna, C., Lungaroni, M., Lungu, C. P., Lungu, M., Lunniss, A., Lupelli, I., Lyssoivan, A., Macdonald, N., Macheta, P., Maczewa, K., Magesh, B., Maget, P., Maggi, C., Maier, H., Mailloux, J., Makkonen, T., Makwana, R., Malaquias, A., Malizia, A., Manas, P., Manning, A., Manso, M. E., Mantica, P., Mantsinen, M., Manzanares, A., Maquet, Ph., Marandet, Y., Marcenko, N., Marchetto, C., Marchuk, O., Marinelli, M., Marinucci, M., Markovic, T., Marocco, D., Marot, L., Marren, C. A., Marshal, R., Martin, A., Martin, Y., Martin de Aguilera, A., Martinez, F. J., Martin-Solis, J. R., Martynova, Y., Maruyama, S., Masiello, A., Maslov, M., Matejcik, S., Mattei, M., Matthews, G. F., Maviglia, F., Mayoral, M. L., May-Smith, T., Mazon, D., Mazzotta, C., McAdams, R., McCarthy, P. J., McClements, K. G., McCormack, O., McCullen, P. A., McDonald, D., McIntosh, S., McKean, R., McKehon, J., Meadows, R. C., Meakins, A., Medina, F., Medland, M., Medley, S., Meigh, S., Meigs, A. G., Meisl, G., Meitner, S., Meneses, L., Menmuir, S., Mergia, K., Merrigan, I. R., Mertens, Ph., Meshchaninov, S., Messiaen, A., Meyer, H., Mianowski, S., Michling, R., Middleton-Gear, D., Miettunen, J., Militello, F., Militello-Asp, E., Miloshevsky, G., Mink, F., Minucci, S., Miyoshi, Y., Mlynar, J., Molina, D., Monakhov, I., Moneti, M., Mooney, R., Moradi, S., Mordijck, S., Moreira, L., Moreno, R., Moro, F., Morris, A. W., Morris, J., Moser, L., Mosher, S., Moulton, D., Murari, A., Muraro, A., Murphy, S., Asakura, N. N., Na, Y. S., Nabais, F., Naish, R., Nakano, T., Nardon, E., Naulin, V., Nave, M. F. F., Nedzelski, I., Nemtsev, G., Nespoli, F., Neto, A., Neu, R., Neverov, V. S., Newman, M., Nicholls, K. J., Nicolas, T., Nielsen, A. H., Nielsen, P., Nilsson, E., Nishijima, D., Noble, C., Nocente, M., Nodwell, D., Nordlund, K., Nordman, H., Nouailletas, R., Nunes, I., Oberkofler, M., Odupitan, T., Ogawa, M. T., O'Gorman, T., Okabayashi, M., Olney, R., Omolayo, O., O'Mullane, M., Ongena, J., Orsitto, F., Orszagh, J., Oswuigwe, B. I., Otin, R., Owen, A., Paccagnella, R., Pace, N., Pacella, D., Packer, L. W., Page, A., Pajuste, E., Palazzo, S., Pamela, S., Panja, S., Papp, P., Paprok, R., Parail, V., Park, M., Diaz, F. Parra, Parsons, M., Pasqualotto, R., Patel, A., Pathak, S., Paton, D., Patten, H., Pau, A., Pawelec, E., Soldan, C. Paz, Peackoc, A., Pearson, I. J., Pehkonen, S. -P., Peluso, E., Penot, C., Pereira, A., Pereira, R., Puglia, P. P. Pereira, von Thun, C. Perez, Peruzzo, S., Peschanyi, S., Peterka, M., Petersson, P., Petravich, G., Petre, A., Petrella, N., Petrzilka, V., Peysson, Y., Pfefferle, D., Philipps, V., Pillon, M., Pintsuk, G., Piovesan, P., Pires dos Reis, A., Piron, L., Pironti, A., Pisano, F., Pitts, R., Pizzo, F., Plyusnin, V., Pomaro, N., Pompilian, O. G., Pool, P. J., Popovichev, S., Porfiri, M. 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- Subjects
fusion ,carbon ,scrape-off layer ,plasma-facing components ,erosion ,surface-layers ,hydrogen isotope retention ,inventory ,jet ,tritium retention ,depth profiles ,divertor ,ion-beam analysis ,deposited layers ,plasma - Abstract
The first divertor was installed in the JET machine between 1992 and 1994 and was operated with carbon tiles and then beryllium tiles in 1994-5. Post-mortem studies after these first experiments demonstrated that most of the impurities deposited in the divertor originate in the main chamber, and that asymmetric deposition patterns generally favouring the inner divertor region result from drift in the scrape-off layer. A new monolithic divertor structure was installed in 1996 which produced heavy deposition at shadowed areas in the inner divertor corner, which is where the majority of the tritium was trapped by co-deposition during the deuterium-tritium experiment in 1997. Different divertor geometries have been tested since such as the Gas-Box and High-Delta divertors; a principle objective has been to predict plasma behaviour, transport and tritium retention in ITER. Transport modelling experiments were carried out at the end of four campaigns by puffing C-13-labelled methane, and a range of diagnostics such as quartz-microbalance and rotating collectors have been installed to add time resolution to the post-mortem analyses. The study of material migration after D-D and D-T campaigns clearly revealed important consequences of fuel retention in the presence of carbon walls. They gave a strong impulse to make a fundamental change of wall materials. In 2010 the carbon divertor and wall tiles were removed and replaced with tiles with Be or W surfaces for the ITER-Like Wall Project.
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