1. Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction
- Author
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Sang Yeon Park, Sang Soo Kim, Daeho Sung, Hyun Chol Kang, Makina Yabashi, Kyung Sook Kim, Jiadong Fan, Kangwoo Ahn, Changyong Song, Kensuke Tono, Daewoong Nam, Do Hyung Cho, Heemin Lee, Tetsuya Ishikawa, Chulho Jung, Jae-Yong Shin, Do Young Noh, and Huaidong Jiang
- Subjects
Diffraction ,Physics ,Nuclear and High Energy Physics ,Radiation ,business.industry ,Photon flux ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Laser ,01 natural sciences ,law.invention ,Optics ,law ,0103 physical sciences ,Femtosecond ,010306 general physics ,0210 nano-technology ,Pulse energy ,business ,Instrumentation ,Lasing threshold ,Coherence (physics) - Abstract
With each single X-ray pulse having its own characteristics, understanding the individual property of each X-ray free-electron laser (XFEL) pulse is essential for its applications in probing and manipulating specimens as well as in diagnosing the lasing performance. Intensive research using XFEL radiation over the last several years has introduced techniques to characterize the femtosecond XFEL pulses, but a simple characterization scheme, while not requiring ad hoc assumptions, to address multiple aspects of XFEL radiation via a single data collection process is scant. Here, it is shown that single-particle diffraction patterns collected using single XFEL pulses can provide information about the incident photon flux and coherence property simultaneously, and the X-ray beam profile is inferred. The proposed scheme is highly adaptable to most experimental configurations, and will become an essential approach to understanding single X-ray pulses.
- Published
- 2020
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