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1. Highly-Doped Region Optimization for Reduced Hot-Carrier Effects in Dual-Gate Low Temperature Polysilicon TFTs.

2. Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes

3. Back-Biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs.

4. Effects of Redundant Electrode Width on Stability of a-InGaZnO Thin-Film Transistors Under Hot-Carrier Stress

5. Abnormal Increment Substrate Current After Hot Carrier Stress in n-FinFET

6. Impacts of NBTI and hot-carrier stress on silicon nanowire transistor characteristics

7. Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process.

8. Plasma process induced damage detection by fast wafer level reliability monitoring for automotive applications.

9. Hot carrier effect on a single SiGe HBT's EMI response.

10. Comprehensive study on hot carrier reliability of radiation hardened H-gate PD SOI NMOSFET after gamma radiation

11. Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node

13. Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs

14. Investigation of Hot Carrier Stress and Constant Voltage Stress in High- $\kappa$ Si-Based TFETs.

15. The device characteristics of Ir- and Ti-based Schottky gates AlSb/InAs high electron mobility transistors.

16. Hot carrier effect on the bipolar transistors’ response to electromagnetic interference.

17. Investigation of temperature-dependent asymmetric degradation behavior induced by hot carrier effect in oxygen ambiance in In–Ga–Zn-O thin film transistors.

18. Over-voltage stressed dual-resonance injection-locked frequency divider with series-peaking injection device.

19. Analysis of Contrasting Degradation Behaviors in Channel and Drift Regions Under Hot Carrier Stress in PDSOI LD N-Channel MOSFETs.

20. HCS degradation of 5 nm oxide high-voltage PLDMOS.

21. Experimental evaluation of hot-carrier stressed series-tuned injection-locked frequency divider.

22. Degradation Mechanism of Short Channel p- FinFETs under Hot Carrier Stress and Constant Voltage Stress

23. Back-Biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs

24. Advanced Energetic and Lateral Sensitive Charge Pumping Profiling Methods for MOSFET Device Characterization—Analytical Discussion and Case Studies.

25. High-Pressure Deuterium Annealing Effect on Nanoscale Strained CMOS Devices.

26. Effects of hot-carrier stress on high performance polycrystalline silicon thin film transistor with a single perpendicular grain boundary

27. Fowler–Nordheim and hot carrier reliabilities of U-shaped trench-gated transistors studied by three terminal charge pumping

29. Hot carrier degradation of HfSiON gate dielectrics with TiN electrode.

30. CMOS RF and DC reliability subject to hot carrier stress and oxide soft breakdown.

31. NMOSFET ESD self-protection strategy and underlying failure mechanism in advanced 0.13-μm CMOS technology.

32. On Correlation between Hot-Carrier Stress Induced Device Parameter Degradation and Time-Zero Variability

33. Compact Model of the Entire I-V Characteristic for Accurate Description of the Asymmetric Degradation of pMOSFETs during Off-State Stress

34. Impact of Hot Carrier Stress on RF FOMs in 10-nm Bulk N-Channel FinFETs

35. Correlation between low-frequency noise and interface traps of fully-depleted silicon-on-insulator tunneling FETs induced by hot carrier stress

36. Channel-length dependence of the generation of interface states and oxide-trapped charges on drain avalanche hot carrier degradation of HfSiON/SiO2 p-channel MOSFETs with strained Si/SiGe channel

37. Channel hot carrier induced volatile oxide traps responsible for random telegraph signals in submicron pMOSFETs

38. On the Origin of Anomalous Off–Current Under Hot Carrier Stress in p-Channel DDDMOS Transistors With STI Structure.

39. Investigation of Hot Carrier Stress and Constant Voltage Stress in High- <tex-math notation='LaTeX'>$\kappa$</tex-math> Si-Based TFETs

40. Crystallographic-orientation-dependent GIDL current in Tri-gate MOSFETs under hot carrier stress

41. Hot carrier effects in n-MOSFETs with SiO2/HfO2/HfSiO gate stack and TaN metal gate

42. Impacts of Fluorine Ion Implantation With Low-Temperature Solid-Phase Crystallized Activation on High-κk LTPS-TFT.

43. Impact of back gate biases on hot carrier effects in multiple gate junctionless transistors

44. A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors

45. Characteristics and reliabilities on the Dicing before Grinding (DBG) process in nMOSFETs

46. Investigation of abnormal off-current in p-channel double diffused drain metal-oxide-semiconductor transistors after hot carrier stress

47. Hot carrier stress: Aging modeling and analysis of defect location

49. Investigating Degradation Behavior under Hot Carrier Stress in InGaZnO TFT with Symmetric and Asymmetric Structure

50. Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier Stress

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