14 results on '"Hossain, T. Z."'
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2. Applications of neutron activation to microelectronic materials research at the Cornell TRIGA reactor
3. Determination of boron by the neutron depth profile (NDP) technique for VLSI processing application
4. The measurement of boron at silicon wafer surfaces by neutron depth profiling.
5. Investigation of critical charge and sensitive volume of the Neutron Intercepting Silicon Chip (NISC)
6. Impurity Characterization of Si1−xGex Circuit Structures with the Use of Neutron Activation Analysis
7. 1266-keV gamma branch inSi31decay
8. ChemInform Abstract: Measurement and Control of the Boron and Phosphorus Concentration in LPCVD Borophosphosilicate Glass
9. Impurity study of alumina and aluminum nitride ceramics: microelectronics packaging applications
10. Depth Profiles of Nitrogen and Chlorine in Pure Materials Through AMS of the Neutron Activation Products 14C and 36Cl
11. Neutron activation analysis of aluminum in Mg~2SiO~4
12. Infrared spectroscopy of the stretching modes of SeH^- and TeH^- in KCl and KBr
13. Multielement matrix analysis using reactor spectrum neutrons
14. The endoscopy corner. Introduction of a pneumatic dilator with the help of a gastroscope in achalasia--a new, nontraumatic technic.
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