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1. The ASTRO-H X-ray Astronomy Satellite

2. The ASTRO-H X-ray Observatory

3. Molecular-beam epitaxial growth of a far-infrared transparent electrode for extrinsic Germanium photoconductors

4. The ASTRO-H Mission

7. Delphi Method Consensus-Based Identification of Primary Trauma Care Skills Required for General Surgeons in Japan

10. Data-Retention-Voltage-Based Analysis of Systematic Variations in SRAM SEU Hardness: A Possible Solution to Synergistic Effects of TID

11. Data-Retention-Voltage-Based Analysis of Systematic Variations in SRAM SEU Hardness: A Possible Solution to Synergistic Effects of TID

12. Radiation Tolerance of Perovskite Solar Cells for Use in Space

14. An SRAM SEU Cross Section Curve Physics Model

15. The ASTRO-H (Hitomi) X-Ray Astronomy Satellite

16. Understanding the Difference in Soft-Error Sensitivity of Back-Biased Thin-BOX SOI SRAMs to Space and Terrestrial Radiation

17. Proton Irradiation Tolerance of High-Efficiency Perovskite Absorbers for Space Applications

18. Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage

19. Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage

20. Evaluation of Damage Coefficient for Minority-Carrier Diffusion Length of Triple-Cation Perovskite Solar Cells under 1 MeV Electron Irradiation for Space Applications

21. Soft-error rate in a logic LSI estimated from SET pulse-width measurements

22. Device-physics-based analytical model for single-event transients in SOI CMOS logic

23. LET dependence of single event transient pulse-widths in SOI logic cell

24. Evaluation of Damage Coefficient for Minority-Carrier Diffusion Length of Triple-Cation Perovskite Solar Cells under 1 MeV Electron Irradiation for Space Applications

25. Investigation of Buried-Well Potential Perturbation Effects on SEU in SOI DICE-Based Flip-Flop Under Proton Irradiation

26. Waveform observation of digital single-event transients employing monitoring transistor technique

27. Scan-architecture-based evaluation technique of SET and SEU soft-error rates at each flip-flop in logic VLSI systems

28. 極薄ペロブスカイト太陽電池と搭載用太陽電池測定系の開発と課題

29. JAXAの次世代MPU(SOI-SOC MPU)開発状況

30. Feasibility study of a table-based SET-pulse estimation in logic cells from heavy-ion-induced transient currents measured in a single MOSFET

31. Estimation of single event transient voltage pulses in VLSI circuits from heavy-ion-induced transient currents measured in a single MOSFET

32. Resistance-Based Modeling for Soft Errors in SOI SRAMs Caused by Radiation-Induced Potential Perturbation Under the BOX

33. Characterization of stability of benchmark organic photovoltaic films after proton and electron bombardments

34. The Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM

35. Tolerance of Perovskite Solar Cell to High-Energy Particle Irradiations in Space Environment

36. Time-domain component analysis of heavy-ion-induced transient currents in fully-depleted SOI MOSFETs

40. The Impact of Technology Scaling on the Single-Event Transient Response of SiGe HBTs

41. 極薄ペロブスカイト太陽電池の気球飛翔実験

42. 極薄ペロブスカイト太陽電池の気球飛翔実験計画

46. The Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM

47. Time-domain study on reproducibility of laser-based soft-error simulation

48. Influence of Heavy Ion Irradiation on Perpendicular-Anisotropy CoFeB-MgO Magnetic Tunnel Junctions

49. 宇宙で活躍する半導体デバイス

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