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Voltage-controlled magnetoresistive random access memory (VC-MRAM) is an emerging nonvolatile memory based on the voltage-controlled magnetic anisotropy (VCMA) effect. It has been garnering considerable attention because of its fast and low-power operation. However, two major issues must be addressed for practical applications. First, the voltage-induced switching of the free layer magnetization is sensitive to ultrashort voltage pulse duration. Second, the write error rate (WER) of the voltage-induced switching is high. To address these issues, a magnetic tunnel junction (MTJ) structure with an exchange coupled free layer, consisting of a precession layer with the VCMA effect and an anchor layer without the VCMA effect, is proposed. The anchor layer prevents the precession layer from returning to its initial direction, thereby reducing the WER without requiring the voltage pulse duration to be precisely controlled. The write operation of the proposed MTJ with an exchange coupled free layer was analyzed using the macrospin model. Using optimized MTJ parameters, a low WER of approximately 10−6 was obtained for an 80 nm MTJ without requiring the pulse duration to be precisely controlled. These results facilitate the reduction of the WER for VC-MRAM and improve its usability, thereby expanding its range of applications. [ABSTRACT FROM AUTHOR]

The reliability in magnetoresistance random access memory (MRAM) write operation is investigated for both toggle and asteroid memory chips developed with 0.18 mum CMOS process. Theoretical and experimental study is done on the thermally activated magnetization reversal.