1. Performance of YBCO Step Edge Josephson Junctions for Different Film Thickness to Step Height Ratio.
- Author
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Kandari, Rajni, Dahiya, Mamta, and Khare, Neeraj
- Subjects
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ETCHING techniques , *CRITICAL currents , *SUPERCONDUCTING circuits , *CRITICAL temperature , *SUBSTRATES (Materials science) - Abstract
Step edge Josephson junction devices of YBa2Cu3O7‐
x films on SrTiO3 substrates are fabricated, and the device performance is studied for differentt /h (t : the thickness of the film,h : step height) ratios. After depositing YBCO films on the step etched substrates, photolithography, and ion beam etching techniques are used to fabricate three devices witht /h ratios of ≈0.4, 0.7, and 1.2. The critical temperatures (T c) of the devices are ≈82, 85, and 88 K, respectively. The critical current (I c) and normal state resistance (R n ) are observed to bet /h ratio dependent. The critical current values at 70 K for the devices witht /h ratios of 0.4, 0.7, and 1.2 are ≈425, 550, and 820 μA, respectively. TheI cR n product at 70 K is ≈2.06, 2.76, and 0.43 mV fort /h ratios 0.4, 0.7, and 1.2, respectively, which indicates that thet /h ratio of 0.7 is optimum for the device performance. The current versus voltage curves at 68 K are fitted using the resistively shunted junction model using the Portable Superconducting Circuit Analyzer (PSCAN2) simulator, which suggests that there can be normal conducting links present across the microbridge, and it becomes effective forI >I c, contributing to excess current. [ABSTRACT FROM AUTHOR]- Published
- 2024
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