8 results on '"Hames, Greg A."'
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2. Electrical properties of composite gate oxides formed by rapid thermal processing
3. Establishing a MOEMS process to realise microshutters for coded aperture imaging applications
4. A 0.25 μm MOSFET Technology Using In Situ Rapid Thermal Gate Dielectrics
5. Degradation in Oxide Reliability Due to the Presence of Nitrogen in the Oxidation Ambient
6. Extended SWIR high performance and high definition colloidal quantum dot imagers.
7. Establishing a MOEMS process to realise microshutters for coded aperture imaging applications
8. Degradation in Oxide Reliability Due to the Presence of Nitrogen in the Oxidation Ambient.
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