13 results on '"Hamai, Takamasa"'
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2. Recovery of cycling-induced degradation of interfacial SiO2 in HfO2-FeFET and its impact on retention characteristics
3. Effects of tunneling-based access resistance in layered single-crystalline organic transistors
4. High-Endurance (>1011cycles) and Thermally-Stable Sub-100nm TiO2 Channel FeFET for Low-Power Memory Centric 3D-LSI Applications
5. Novel Operation Scheme for Suppressing Disturb in HfO2-based FeFET Considering Charge- Trapping-Coupled Polarization Dynamics
6. Mechanism of HfO2-FeFET Memory Operation Revealed by Quantitative Analysis of Spontaneous Polarization and Trap Charge
7. Accurate Picture of Cycling Degradation in HfO2-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis
8. 層状結晶性有機半導体トランジスタのキャリア輸送に関する研究
9. Trap-state suppression and band-like transport in bilayer-type organic semiconductor ultrathin single crystals
10. Semiconductive Single Molecular Bilayers Realized Using Geometrical Frustration
11. Tunneling and Origin of Large Access Resistance in Layered-Crystal Organic Transistors
12. Single-component molecular material hosting antiferromagnetic and spin-gapped Mott subsystems
13. Recovery of cycling-induced degradation of interfacial SiO2in HfO2-FeFET and its impact on retention characteristics
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