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Your search keyword '"Hamai, Takamasa"' showing total 13 results

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1. Single-component molecular material hosting antiferromagnetic and spin-gapped Mott subsystems

6. Mechanism of HfO2-FeFET Memory Operation Revealed by Quantitative Analysis of Spontaneous Polarization and Trap Charge

7. Accurate Picture of Cycling Degradation in HfO2-FeFET Based on Charge Trapping Dynamics Revealed by Fast Charge Centroid Analysis

13. Recovery of cycling-induced degradation of interfacial SiO2in HfO2-FeFET and its impact on retention characteristics

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