Descriptor: "HP 54710A (Electronic test device) -- Design and construction" - Searchworks@Jio Institute Digital Library Search Results

Author: Long, David W. and Duff, Christopher P.
Subjects: Embedded system, System on a chip, Multiprocessing, Hewlett-Packard Co. -- Product information, HP 54720A (Electronic test device) -- Design and construction, HP 54710A (Electronic test device) -- Design and construction, HP 54710D (Electronic test device) -- Design and construction, HP 54720D (Electronic test device) -- Design and construction, Multiprocessing -- Product information, Firmware -- Product information, Microcode -- Product information, Embedded systems -- Design and construction -- Product information
Abstract: In using structured design methods to develop a large multiprocessor embedded system, the HP 54720/10 oscilloscope design team learned that these methodologies can be very helpful if applied appropriately and […]
Published: 1993

Author: Campbell, John W., Johnson, Kenneth W., Helgoth, Wayne F., and Escovitz, William H.
Subjects: System design, Hewlett-Packard Co. -- Product information, HP 54720A (Electronic test device) -- Design and construction, HP 54710A (Electronic test device) -- Design and construction, HP 54710D (Electronic test device) -- Design and construction, HP 54720D (Electronic test device) -- Design and construction, System design -- Product information, Systems analysis -- Product information
Abstract: A completely new mainframe design for the HP 54720/10 oscilloscopes includes a unibody chassis and four plug-in slots that provide superior EMI performance and anticipate future enhancements. Mechanical design of […]
Published: 1993

Author: Johnson, Dana L. and Magnuson, Christopher J.
Subjects: System design, Hewlett-Packard Co. -- Product information, HP 54720A (Electronic test device) -- Design and construction, HP 54710A (Electronic test device) -- Design and construction, HP 54720D (Electronic test device) -- Design and construction, HP 54710D (Electronic test device) -- Design and construction, System development -- Product information, System design -- Product information, Systems analysis -- Product information
Abstract: Optimum allocation of tasks to various software and hardware subsystems, a separate display processor, multiple lookthrough tables, flicker reduction techniques, and other design features support the performance of the HP […]
Published: 1993

Author: Scharrer, John A.
Subjects: Integrated circuit design, Circuit designer, Hewlett-Packard Co. -- Product information, HP 54720A (Electronic test device) -- Design and construction, HP 54710A (Electronic test device) -- Design and construction, HP 54710D (Electronic test device) -- Design and construction, HP 54720D (Electronic test device) -- Design and construction, Circuit design -- Product information
Abstract: For the first time, a digitizing sampling oscilloscope achieves single-shot bandwidths exceeding even the fastest laboratory analog oscilloscopes. The HP 54720/10 oscilloscope combines a 2-GSa/s digitizer, plug-in modularity, and software […]
Published: 1993

Author: Eskeldson, David D., Kellum, Reginald, and Whiteman, Donald A.
Subjects: Integrated circuit design, Circuit designer, Hewlett-Packard Co. -- Product information, HP 54720A (Electronic test device) -- Design and construction, HP 54710A (Electronic test device) -- Design and construction, HP 54720D (Electronic test device) -- Design and construction, HP 54710D (Electronic test device) -- Design and construction, Circuit design -- Product information, Interpolation -- Product information
Abstract: Careful attention to low-noise coupling results in robust performance far exceeding what is normally considered possible with off-the-shelf ECL. A new interpolator design increases resolution by a factor of ten, […]
Published: 1993

Author: McTigue, Michael T. and Byrne, Patrick J.
Subjects: Integrated circuit design, Circuit designer, Hewlett-Packard Co. -- Product information, HP 54722A (Electronic test device) -- Design and construction -- Product information, HP 54713A (Electronic test device) -- Design and construction -- Product information, HP 54712A (Electronic test device) -- Design and construction -- Product information, HP 54721A (Electronic test device) -- Design and construction -- Product information, HP 54720A (Electronic test device) -- Design and construction, HP 54710A (Electronic test device) -- Design and construction, HP 54710D (Electronic test device) -- Design and construction, HP 54720D (Electronic test device) -- Design and construction, HP 54714A (Electronic test device) -- Design and construction -- Product information, HP 54711A (Electronic test device) -- Design and construction -- Product information, Circuit design -- Product information
Abstract: Within the HP 54720/10 acquisition system are sixteen separate sampling and digitizing paths that can be allocated by the user to capture 16K samples at 8 GSa/s or 256K samples […]
Published: 1993

Author: Hamling, Daniel T.
Subjects: Standard IC, Semiconductor production equipment, Hewlett-Packard Co. -- Product information, HP 54720A (Electronic test device) -- Design and construction, HP 54710A (Electronic test device) -- Design and construction, HP 54720D (Electronic test device) -- Design and construction, HP 54710D (Electronic test device) -- Design and construction, Integrated circuits -- Product information -- Design and construction, Semiconductor chips -- Product information -- Design and construction, Testing -- Product information, Semiconductor production equipment -- Product information -- Design and construction
Abstract: This new probe fixture offers both a wide bandwidth and a high probe count, along with flexible interfacing and low maintenance. The fixture is used to perform at-speed wafer testing […]
Published: 1993

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