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3. Prenatal exposure to nickel and atopic dermatitis at age 3 years: a birth cohort study with cytokine profiles

4. DS_10.1177_0022034519864519 – Supplemental material for MiR-361-3p/Nfat5 Signaling Axis Controls Cementoblast Differentiation

5. Highly efficient production of hyaluronic acid byStreptococcus zooepidemicusR42 derived from heterologous expression of bacterial haemoglobin and mutant selection

6. The adhesion and corrosion resistance of Ti–O films on CoCrMo alloy fabricated by high power pulsed magnetron sputtering (HPPMS)

7. Pivotal role of microRNA-9 in osteosarcoma tumorigenesis and tumor progression

8. Self-formation of single-crystal metal particles driven by inhomogeneous stress in thin films

9. Effect of Substrate Constraint on Stress-Induced Deformation Mechanism of Tungsten Thin Film

10. Microstructure and Mechanical Properties of Nanocrystalline Tungsten Thin Films

11. Microstructure, mechanical and tribological properties of CrN/W2N multilayer films deposited by DC magnetron sputtering

12. Stress relaxation induced faceted Cu and W particles on the surfaces of Cu–Zr and W thin films

13. Review Article: Aneurysmal Bone Cysts of the Jaws

14. Impact of Pt bottom electrode on the properties of ferroelectric Bi3.25La0.75Ti3O12 capacitors

17. Microstructure and formation mechanism of titanium dioxide nanotubes

18. The Structural Integrity of Cast Aluminium Automotive Components Subjected to Fatigue Loads

19. The behaviour of the first kind of dumbbell domains with both static bias field and temperature

20. An overview of projectile-charge-state dependence of K-, L-, and M-shell ionization in thin solid targets for a variety of incident heavy ions from 0.1 to 5.7 MeV/u

21. M-shell ionization of rare earth elements by proton impact in the energy range 0.6–4.6 MeV

22. M-shell X-ray production cross sections of rare-earth elements by 4He2+ impact in the energy range 0.7–7.0 MeV

23. Self-formed submicron-scale faceted copper particles on the surface of annealed Cu-Zr films

26. Spike anneal qualification for 0.13 μm USJ technology on Radiance/spl trade/ Centura/spl reg

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