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4. Influence of ultraviolet irradiation on excitation efficiency and space charge in ZnS thin-film electroluminescent devices

Author

Zeinert, A., Benalloul, P., Benoit, J., Barthou, C., and Gumlich, H.-E.

Subjects
Thin films -- Electric properties, Optoelectronic devices -- Research, Ultraviolet radiation -- Usage, Physics
Abstract

Continuous wave ultraviolet (UV) irradiation of ZnS thin-film electroluminescent devices results in the elimination of residual polarization between two electric pulses originating from the stored charges in semiconductor-insulator and semiconductor interfaces. Photodielectric effects are not seen in the UV-irradiated films. Reduction in space charge due to UV irradiation renders the electric field homogeneous.

Published
1994

5. On the excitation efficiency in ZnS:Mn thin-film electroluminescent devices

Author

Zeinert, A., Benalloul, P., Benoit, J., Barthou, C., Dreyhsig, J., and Gumlich, H.-E.

Subjects
Electroluminescent display systems -- Research, Physics
Abstract

The direct measurement of dependence of excitation efficiency (eta sub exc) on applied voltage showed an increase in eta (sub exc) with increasing excitation level and its non-dependence on applied voltage for optimized devices used in industrial production. The decrease in total deficiency of eta at high excitation levels is partly due to a decrease in eta (sub x) and not entirely to radiative efficiency.

Published
1992

6. Palladium as impurity in ZnTe

Author

Hermann, S., primary, Mahnke, H.-E., additional, Schumann, D., additional, Spellmeyer, B., additional, Sulzer, G., additional, Bollmann, J., additional, Reinhold, B., additional, Röhrich, J., additional, Wienecke, M., additional, Yankov, R., additional, and Gumlich, H.-E., additional

Published
1996
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7. List of contributors

Author

Accomo, R., primary, Achtziger, N., additional, Adams, S.J.A., additional, Akasaki, I., additional, Albert, J.P., additional, Amano, H., additional, André, R., additional, Antonelli, A., additional, Asif Khan, M., additional, Aulombard, R.L., additional, Austin, R.F., additional, Balestrino, G., additional, Baltramiejūnas, R., additional, Bechstedt, F., additional, Bécourt, N., additional, Bergman, L., additional, Bernholc, J., additional, Bertho, D., additional, Bertoni, CM., additional, Billat, S., additional, Boćkowski, M., additional, Bodin, C., additional, Bodin-Deshayes, C., additional, Boiko, E.B., additional, Boring, P., additional, Bouhelal, A., additional, Bratina, G., additional, Brennan, K.F., additional, Briddon, P.R., additional, Briot, O., additional, Broser, I., additional, Bsiesy, A., additional, Bucher, E., additional, Burchard, A., additional, Cantwell, G., additional, Carter, C.H., additional, Castro, T., additional, Cavenett, B.C., additional, Chadi, D.J., additional, Chen, K.M., additional, Chen, X., additional, Cheng, H., additional, Choyke, W.J., additional, Christensen, N.E., additional, Cibert, J., additional, Cingolani, R., additional, Cloitre, T., additional, Cohen, P.I., additional, Collins, A.T., additional, Cotal, H.L., additional, Cricenti, A., additional, Dabbicco, M., additional, Dang, L.S., additional, Davis, R.F., additional, Deicher, M., additional, DePuydt, J.M., additional, Dischler, B., additional, Dmitriev, V.A., additional, Donegan, J.F., additional, Doran, J.P., additional, Dubowski, J.J., additional, Eckey, L., additional, Edmond, J.A., additional, Efros, A.L., additional, Egan, R.J., additional, Engelbrecht, F., additional, Evstropov, W., additional, Fanciulli, M., additional, Feldman, R.D., additional, Felici, A.C., additional, Ferrara, M., additional, Ferrari, L., additional, Ferry, D.K., additional, Feuillet, G., additional, Fiedler, M., additional, Finocchi, F., additional, Fischer, R., additional, Fishman, G., additional, Franciosi, A., additional, Fricke, Ch., additional, Frolov, S.I., additional, Fuchs, D., additional, Galli, G., additional, Gaponenko, S.V., additional, Gaspard, F., additional, Gavrilenko, V.I., additional, Gavryushin, V., additional, Gebhardt, W., additional, Germanenko, I.N., additional, Geurts, J., additional, Geyzers, K.P., additional, Gil, B., additional, Gladfelter, W., additional, Gleitsman, G., additional, Göbel, E.O., additional, Godet, C., additional, Goede, O., additional, Gorczyca, I., additional, Gribkovskii, V.P., additional, Grzegory, I., additional, Gumlich, H.-E., additional, Gunshor, R.L., additional, Gurskii, A.L., additional, Gutowski, J., additional, Gygi, F., additional, Haase, M.A., additional, Haberstroh, C, additional, Harsch, W.C., additional, Hauksson, I., additional, Hayashi, S., additional, Hegarty, J., additional, Heimbrodt, W., additional, Heime, K., additional, Heine, V., additional, Heitz, R., additional, Helbig, R., additional, Henderson, B., additional, Henneberger, F., additional, Hérino, R., additional, Hermans, J., additional, Heuken, M., additional, Hoffmann, A., additional, Hoffmann, H., additional, Hoffmann, N., additional, Hofsäss, H., additional, Humphreys, T.P., additional, Hunt, R.W., additional, Iarlori, S., additional, Iida, S., additional, Ikoma, K., additional, Itie, J.P., additional, Jacobs, K., additional, Jahn, S.G., additional, Jancu, J.M., additional, Jaussaud, C., additional, Jentzsch, T., additional, Johnson, R.L., additional, Jones, R., additional, Jouanin, C., additional, Jouneau, P.H., additional, Jun, J., additional, Jungnickel, V., additional, Juodžbalis, D., additional, Kajihara, S.A., additional, Kanicki, J., additional, Karmann, S., additional, Katayama-Yoshida, H., additional, Kawakami, Y., additional, Kazlauskas, A., additional, Kean, A., additional, Khan, M.R.H., additional, King-Smith, R.D., additional, Kinto, H., additional, Kißmann, U., additional, Klimakow, A., additional, Klyui, N.I., additional, Koide, N., additional, Koidl, P., additional, Kong, H.-S., additional, Kong, H.S., additional, König, Th., additional, Kono, J., additional, Kononenko, V.K., additional, Kotaki, M., additional, Kreß, C., additional, Krings, T., additional, Krukowski, St., additional, Kubertavicius, V., additional, Kudlek, G.H., additional, Kuhn, W., additional, Kunc, K., additional, Kuroda, Y., additional, Kuznia, J.N., additional, Kwak, K.W., additional, Labrunie, G., additional, Laks, D.B., additional, Lambrecht, W.R.L., additional, Lankes, S., additional, Lebed, V. Yu., additional, Lei, T., additional, Leibenzeder, S., additional, Lepore, M., additional, Licht, T., additional, Ligeon, M., additional, Linkov, I. Yu., additional, Litwin-Staszewska, E., additional, Logothetidis, S., additional, Luce, G., additional, Lutsenko, E.V., additional, Lux-Steiner, M. Ch., additional, Madéore, F., additional, Magerle, R., additional, Mahnke, H.-E., additional, Maier, K., additional, Malinovskii, I.E., additional, Manabe, K., additional, Marinelli, M., additional, Markey, B.G., additional, Markwitz, A., additional, Marshall, T., additional, Mathieu, H., additional, Matsunami, H., additional, McCaldin, J.O., additional, McGill, T.C., additional, McKeever, S.W.S., additional, Meier, J., additional, Mihalcescu, I., additional, Milani, E., additional, Mitcovets, A.I., additional, Mitsuyu, T., additional, Miura, N., additional, Molnar, R.J., additional, Molva, E., additional, Morohashi, M., additional, Morozenko, Ya.V., additional, Moustakas, T.D., additional, Mujica, A., additional, Mula, G., additional, Muller, F., additional, Müller-Sebert, W., additional, Muñoz, A., additional, Mura, A., additional, Naumov, A., additional, Needs, R.J., additional, Nemanich, R.J., additional, Nicolini, R., additional, Nurmikko, A.V, additional, O'Donnell, K.P., additional, Oguchi, T., additional, Ohkawa, K., additional, Okamoto, S., additional, Okazaki, N., additional, Okumura, H., additional, Osman, M.A., additional, Palmour, J.W., additional, Paloura, E.C., additional, Palummo, M., additional, Paoletti, A., additional, Papon, A.M., additional, Paroli, P., additional, Parrinello, M., additional, Pensl, G., additional, Pereira, E., additional, Perlin, P., additional, Petalas, J., additional, Pfeiffer, W., additional, Phillips, M.C., additional, Pikus, F.G, additional, Pinter, I., additional, Pirzer, M., additional, Pohl, U., additional, Pohl, U.W., additional, Polatoglou, H.M., additional, Polian, A., additional, Polini, R., additional, Ponga, B.E., additional, Ponthenier, J.L., additional, Porowski, S., additional, Prins, J.F., additional, Prior, K.A., additional, Puls, J., additional, Qiu, J., additional, Qteish, A., additional, Raciukaitis, G., additional, Reining, L., additional, Reisinger, T., additional, Restle, M., additional, Righini, M., additional, Rodríguez-Hernández, P., additional, Rolfe, S.J., additional, Romestain, R., additional, Ryzhikov, VD., additional, Sailer, B., additional, Sander, D., additional, Santos, L., additional, Sasaki, T., additional, Sawada, M., additional, Scamarcio, G., additional, Scarselli, M.A., additional, Schadt, M., additional, Schneider, A., additional, Schneider, J., additional, Schöner, A., additional, Schülzgen, A., additional, Selci, S., additional, Shinohara, M., additional, Simpson, J., additional, Sorba, L., additional, Spellmeyer, B., additional, Stanley, R.P., additional, Stanzl, H., additional, Stein, R.A., additional, Stewart, H., additional, Suemune, I., additional, Sulzer, G., additional, Suski, T., additional, Suttrop, W., additional, Swenberg, J.F., additional, Taghizadeh, M.R., additional, Takeyama, S., additional, Tansley, T.L., additional, Tebano, A., additional, Thurian, P., additional, Tosatti, E., additional, Trager-Cowan, C., additional, Troullier, N., additional, Tschentscher, I., additional, Tsuboi, N., additional, Tsujimura, A., additional, Tsukioka, K., additional, Tupenevich, P.A., additional, Turner, K.F., additional, Uchiki, H., additional, Uhrmacher, M., additional, Ullrich, B., additional, Uttamchandani, D., additional, Van de Walle, C.G., additional, van der Weide, J., additional, Van Hove, J.M., additional, Vanderbilt, D., additional, Vanzetti, L., additional, Vasileska, D., additional, Vial, J.C., additional, Wagner, H.P., additional, Wahl, U., additional, Waldmann, H., additional, Walker, CT., additional, Wang, E.G., additional, Wang, M.W., additional, Wang, S.Y., additional, Wang, Y., additional, Weinhold, V., additional, Wiehert, T., additional, Wild, C., additional, Witthuhn, W., additional, Wolf, H., additional, Wolf, K., additional, Wörz, M., additional, Yablonskii, G.P., additional, Yagi, M., additional, Yamaga, S., additional, Yamanaka, M., additional, Yang, F., additional, Yoshii, S., additional, Yoshikawa, A., additional, Yu, X., additional, Zeitz, W., additional, and Zimin, L.G., additional

Published
1993
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9. Defect characterization in ZnGeP2 by time-resolved photoluminescence

Author

Dietz, N, Wood, G, Bachmann, K. J, Busse, W, Gumlich, H. E, Ruderman, W, and Tsveybak, I

Subjects
Solid-State Physics
Abstract

The native defect-related optical properties of ZnGeP2 are studied by steady-state and time-resolved photoluminescence. ZnGeP2 crystals grown from the vapor phase by high pressure physical vapor transport (HPVT) and from the melt by gradient freezing (GF) show a broad infrared emission with peak position at 1.2 eV with a decay time constant of a few micro-s and a faster recombination center peaked at 1.68 eV. The decay transient for the emission at 1.2 eV exhibits features of classical donor-acceptor recombination and is linked to close-pairs that are tentatively associated with germanium-on-zinc antisite donors and zinc vacancy acceptors. Higher energetic luminescence structures at 1.6eV and 1.7eV are revealed after annealing of the ZnGeP2 crystals and are associated with the formation zinc and phosphorous vacancies in the near surface region. ZnGeP2 crystals grown by HPVT from zinc and phosphorus supersaturated vapor compositions show additional emission structure at 1.8 eV and a sharp donor-acceptor emission at 1.778 eV that is related to the presence of additional donor states.

Published
1995

30. Pd diffusion in ZnTe and CdTe

Author

Herrmann, S., Mahnke, H.-E., Spellmeyer, B., Wienecke, M., Reinhold, B., Yankov, R. A., and Gumlich, H.-E.

Published
1998

32. VUV-visible measurements on different samples of amorphous carbon

Author

Blanco, A, Borghesi, A, Bussoletti, E, Colangeli, Luigi, Fonti, Sergio, Gumlich, H. E, Jung, CH, Orofino, Vincenso, and Schwehm, G

Subjects
Astronomy
Abstract

Among various candidate materials for interstellar dust, amorphous carbon (AC) is playing an increasingly important role (Greenstein, 1981; Hecht et al., 1984; Jura, 1983, 1986). Furthermore, recent in situ measurements have clearly shown the presence of carbonaceous grains in the coma of comet Halley (Kissel et al., 1986). Laboratory investigations on AC grains may be very useful to better interpret observations and to support theoretical elaborations. Recently, the authors started an international research program which also includes UV extinction analyses on AC samples, by using synchrotron light. Preliminary results obtained in a first shift of measurements, last June, are given. At the present stage of the data analysis, the authors can only draw some preliminary considerations. A wide band falling at around 240 nm is detected in all the analyzed samples. It intensity seems to decrease with increasing the dust collecting distance. A peak at 150 nm decreases in intensity with increasing the collecting distance. The band seems absent in the samples characterized by a larger amount of dust. A feature at about 200 nm is detected in some samples. At the moment the authors tend to attribute it to the transmission properties of the LiF substrates at the wavelength and/or to some problems in the experimental setup. It is unclear if a hump at 120 nm is real or due to instrumental effects. The profile of the spectra does not show substantial changes when the samples are cooled down to about 100 K. The present results appear to be in general agreement with previous findings, but their analysis is in progress and the interpretation is still on the way.

Published
1989

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