1. Critical Discussion of Ex situ and In situ TEM Measurements on Memristive Devices
- Author
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Gronenberg, Ole, Haberfehlner, Georg, Zahari, Finn, Marquardt, Richard, Kübel, Christian, Kothleitner, Gerald, Kienle, Lorenz, Kasabov, Nikola, Series Editor, Amari, Shun-ichi, Editorial Board Member, Avesani, Paolo, Editorial Board Member, Benuskova, Lubica, Editorial Board Member, Brown, Chris M., Editorial Board Member, Duro, Richard J., Editorial Board Member, Georgieva, Petia, Editorial Board Member, Hou, Zeng-Guang, Editorial Board Member, Indiveri, Giacomo, Editorial Board Member, King, Irwin, Editorial Board Member, Kozma, Robert, Editorial Board Member, König, Andreas, Editorial Board Member, Mandic, Danilo, Editorial Board Member, Masulli, Francesco, Editorial Board Member, Thivierge, JeanPhilippe, Editorial Board Member, Villa, Allessandro E.P., Editorial Board Member, Ziegler, Martin, editor, Mussenbrock, Thomas, editor, and Kohlstedt, Hermann, editor
- Published
- 2024
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