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4. Electronic Structure of Deep Defects in SiC

11. EPR, ESE and Pulsed ENDOR Study of Nitrogen Related Centers in 4H-SiC Wafers Grown by Different Technologies

20. Electronic Structure of Deep Defects in SiC

21. Electrical detection of electron paramagnetic resonance: new possibilities for the study of point defects

25. Enhanced room temperature ferromagnetism in electrodeposited Co-doped ZnO nanostructured thin films by controlling the oxygen vacancy defects.

36. Experimental verification of apparent negative refraction in low-epsilon material in the microwave regime

37. Identification of the Nitrogen Split Interstitial

39. EPR, ESE and pulsed ENDOR study of nitrogen related centers in 4H-SiC wafers grown by different technologies

40. Multiphysics software gazes into photonic crystals

42. Magnetic characterization of conductance electrons in GaN

43. EPR, ESE and Pulsed ENDOR Study of Nitrogen Related Centers in 4H-SiC Wafers Grown by Different Technologies

44. Identification of the Nitrogen Split Interstitial(N−N)Nin GaN

45. Electronic structure of deep defects in SiC

47. Magnetic characterization of conductance electrons in GaN

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