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3. Radiation Effects in 3D Integrated SOl SRAM Circuits

4. SET Characterization in Logic Gates Circuits Fabricated in a 3DIC Technology

5. Direct Comparison of Charge Collection in SOI Devices from Single-Photon and Two-Photon Laser Testing Techniques

6. Effects of Ionizing Radiation on Digital Single Event Transients in a 180-nm Fully Depleted SOI Process

7. Channel engineering of SOI MOSFETs for RF applications

8. Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies

9. Wafer-scale 3D integration of silicon-on-insulator RF amplifiers

10. Radiation effects in MIT Lincoln Lab 3DIC technology

11. Heavy-ion-induced digital single event transients in a 180 nm fully depleted SOI process

12. Hardness Assurance Testing for Proton Direct Ionization Effects

13. Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs

14. Radiation Effects in 3D Integrated SOI SRAM Circuits

15. SET Characterization in Logic Circuits Fabricated in a 3DIC Technology

16. Hardness assurance testing for proton direct ionization effects

17. Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques

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