17 results on '"Gouker, Pascale M."'
Search Results
2. Effects of ionizing radiation on digital single event transients in an 180-nm fully depleted SOI process
3. Radiation Effects in 3D Integrated SOl SRAM Circuits
4. SET Characterization in Logic Gates Circuits Fabricated in a 3DIC Technology
5. Direct Comparison of Charge Collection in SOI Devices from Single-Photon and Two-Photon Laser Testing Techniques
6. Effects of Ionizing Radiation on Digital Single Event Transients in a 180-nm Fully Depleted SOI Process
7. Channel engineering of SOI MOSFETs for RF applications
8. Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies
9. Wafer-scale 3D integration of silicon-on-insulator RF amplifiers
10. Radiation effects in MIT Lincoln Lab 3DIC technology
11. Heavy-ion-induced digital single event transients in a 180 nm fully depleted SOI process
12. Hardness Assurance Testing for Proton Direct Ionization Effects
13. Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs
14. Radiation Effects in 3D Integrated SOI SRAM Circuits
15. SET Characterization in Logic Circuits Fabricated in a 3DIC Technology
16. Hardness assurance testing for proton direct ionization effects
17. Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.