1. Characterization of Mn 5 Ge 3 Contacts on a Shallow Ge/SiGe Heterostructure.
- Author
-
Hutchins-Delgado, Troy A., Addamane, Sadhvikas J., Lu, Ping, and Lu, Tzu-Ming
- Subjects
- *
SPINTRONICS , *ENERGY dispersive X-ray spectroscopy , *ELECTRON energy loss spectroscopy , *SCHOTTKY barrier , *QUANTUM wells , *QUANTUM Hall effect , *SCHOTTKY barrier diodes , *X-ray imaging , *SCANNING transmission electron microscopy - Abstract
M n 5 G e 3 is a ferromagnetic phase of the Mn-Ge system that is a potential contact material for efficient spin injection and detection. Here, we investigate the creation of M n 5 G e 3 -based contacts on a Ge/SiGe quantum well heterostructure via solid-state synthesis. X-ray diffraction spectra fitting indicates the formation of M n 5 G e 3 -based contacts on bulk Ge and Ge/SiGe. High-resolution scanning transmission electron microscopy imaging and energy dispersive X-ray spectroscopy verify the correct M n 5 G e 3 -based phase formation. Schottky diode measurements, transmission line measurements, and Hall measurements reveal that M n 5 G e 3 -based contacts serve as good p-type contacts for Ge/SiGe quantum well heterostructures due to having a low Schottky barrier height of 0.10 e V (extracted from a M n 5 G e 3 /n-Ge analogue) and a contact resistance in the order of 1 k Ω. Furthermore, we show that these electrical characteristics have a gate-voltage dependence, thereby providing tunability. [ABSTRACT FROM AUTHOR]
- Published
- 2024
- Full Text
- View/download PDF