1. Synchrotron-based X-ray Tomographic Microscopy at the Swiss Light Source for Industrial Applications
- Author
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Bernd R. Pinzer, Marco Stampanoni, A. Isenegger, F. Marone, Kevin Mader, Julie L. Fife, S. Irvine, Rajmund Mokso, G. Mikuljan, Peter Modregger, University of Zurich, and Marone, F
- Subjects
Nuclear and High Energy Physics ,Materials science ,business.industry ,Resolution (electron density) ,X-ray ,Industrial research ,610 Medicine & health ,3107 Atomic and Molecular Physics, and Optics ,Atomic and Molecular Physics, and Optics ,Synchrotron ,Third generation ,law.invention ,170 Ethics ,Optics ,law ,Microscopy ,10237 Institute of Biomedical Engineering ,3106 Nuclear and High Energy Physics ,Penetration depth ,business ,Swiss Light Source - Abstract
The potential of X-rays for the non-invasive investigation of the interior of bulky samples has long been recognized and their penetration depth is presently widely exploited [1]. Although initially third generation synchrotron sources were almost exclusively the realm of academic scientific experiments, the use of synchrotron light for industrial research is becoming increasingly important and relevant for both technology development and non-destructive testing, in particular when the requirements in terms of spatial, temporal, and density resolution are exceptional.
- Published
- 2011
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