181 results on '"Fujii Mami"'
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2. Concise synthesis and antiproliferative activity evaluation of ellipticine quinone and its analogs
3. Atomic Imaging of Interface Defects in an Insulating Film on Diamond
4. Reactivity and stability of thallium oxide for fabricating TlSnZnO toward thin-film transistors with high mobility
5. A novel one-pot synthesis of carbazole-1,4-quinones through Pd-catalyzed cyclocarbonylation, desilylation and oxidation processes from 3-iodo-2-propenylindoles
6. Basal cell carcinoma of the nipple‐areola complex with multiple lesions: Possible causative role of radiation
7. Basalzellkarzinom des Mamillen‐Areola‐Komplexes mit multiplen Läsionen: Bestrahlung als mögliche Ursache
8. Orientation dependent etching of polycrystalline diamond by hydrogen plasma
9. Atomic structure analysis of gallium oxide at the Al2O3/GaN interface using photoelectron holography
10. Hot Carrier Effects in Oxide‐TFTs
11. Improved Thermoelectric Power Factor of InGaZnO/SiO₂ Thin Film Transistor via Gate-Tunable Energy Filtering
12. 29.1: Invited Paper: Degradation Mechanism of High Mobility Oxide Thin Film Transistors for Next Generation Display
13. Atomic structure analysis of gallium oxide at the Al2O3/GaN interface using photoelectron holography.
14. Analysis of Electron Traps in a-IGZO Thin Films after High Pressure Vapor Annealing by Capacitance–Voltage Method
15. Impact of the unplanned initiation of maintenance hemodialysis on patient nutritional status and activities of daily living at hospital admission and discharge
16. Enhancement in Reliability of a-InZnO TFT by Fluorine-Doped Polysilsesquioxane Passivation with Spray Pyrolysis
17. Low Temperature Solution Processed Hybrid Gate Insulators for High Performance Oxide Thin-Film Transistors
18. (Invited) Highly Reliable Metal Oxide Thin Film Transistors for Flexible Devices
19. (Invited) Hot Carrier Phenomena in Oxide Thin-Film Transistors
20. Improvement in Bias Stress Stability of Solution-Processed Amorphous InZnO Thin-Film Transistors via Low-Temperature Photosensitive Passivation
21. P‐11: High Performance All‐Solution Processed InZnO Thin‐Film Transistors via Photo‐Functionalization at Varying Fluence and Annealing Environment
22. 7‐2: Invited Paper: Hot Carrier Degradation in High Mobility Metal Oxide Thin Film Transistors
23. High-Performance Fully Solution-Processed Oxide Thin-Film Transistors via Photo-Assisted Role Tuning of InZnO
24. Erratum: High Performance Amorphous In–Ga–Zn–O Thin-Film Transistors with Low Temperature High-k Solution Processed Hybrid Gate Insulator [ ECS J. Solid State Sci. Technol., 9, 025002 (2020)]
25. Unique degradation under AC stress in high-mobility amorphous In–W–Zn–O thin-film transistors
26. Bias stress and humidity exposure of amorphous InGaZnO thin-film transistors with atomic layer deposited Al2O3 passivation using dimethylaluminum hydride at 200 °C
27. High Performance Amorphous In–Ga–Zn–O Thin-Film Transistors with Low Temperature High-k Solution Processed Hybrid Gate Insulator
28. Rapid photo-assisted activation and enhancement of solution-processed InZnO thin-film transistors
29. High reliability InGaZnO TFT by inductively coupled plasma sputtering system
30. Electrical and thermal stress analysis of In2O3−Ga2O3-ZnO thin-film transistors
31. Hot carrier effects in InGaZnO thin-film transistor
32. Low Temperature High-k Solution Processed Hybrid Gate Insulator for High Performance Amorphous In-Ga-Zn-O Thin-Film Transistors
33. 30‐3: High Performance All Solution Processed Oxide Thin‐Film Transistor via Photo‐induced Semiconductor‐to‐Conductor Transformation of a‐InZnO
34. P‐193: Late‐News Poster: Low Temperature Solution Processed InZnO TFT Annealed in Wet Ambient
35. Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression
36. Highly reliable low-temperature (180 °C) solution-processed passivation for amorphous In–Zn–O thin-film transistors
37. Improvement of the stability of an electric double-layer transistor using a 1H,1H,2H,2H-perfluorodecyltriethoxysilane barrier layer
38. Tuberculosis cutis colliquativa bei tuberkulöser Daktylitis bei einem Erwachsenen
39. Tuberculosis cutis colliquativa due to tuberculous dactylitis in an adult
40. SrTa2O6 induced low voltage operation of InGaZnO thin-film transistors
41. 29.1: Invited Paper:Degradation Mechanism of High Mobility Oxide Thin Film Transistors for Next Generation Display
42. Properties of TlZnSnO film fabricated via sputtering from TlZnSnO target
43. Self-Heating Suppressed Structure of a-IGZO Thin-Film Transistor
44. High performance top gate a-IGZO TFT utilizing siloxane hybrid material as a gate insulator
45. (Invited) High Density IGZO Film for Highly Reliable TFT By Inductively Coupled Plasma Sputtering Technology in Low Temperature Process
46. Reliability Enhancement of Solution Processed Amorphous In-Zn-O Thin-Film Transistors via a Low Temperature (180 °C) Solution Processed Passivation
47. Threshold Voltage Control of In-Ga-Zn-O TFT without Thermal Annealing Process by Inductively Coupled Plasma Sputtering System
48. Instantaneous Semiconductor-to-Conductor Transformation of a Transparent Oxide Semiconductor a-InGaZnO at 45 °C
49. Dimethylaluminum hydride for atomic layer deposition of Al2O3 passivation for amorphous InGaZnO thin-film transistors
50. Significant mobility improvement of amorphous In-Ga-Zn-O thin-film transistors annealed in a low temperature wet ambient environment
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