110 results on '"Fujii, Mami N."'
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2. Reactivity and stability of thallium oxide for fabricating TlSnZnO toward thin-film transistors with high mobility
3. Atomic Imaging of Interface Defects in an Insulating Film on Diamond
4. Atomic structure analysis of gallium oxide at the Al2O3/GaN interface using photoelectron holography
5. Hot Carrier Effects in Oxide‐TFTs
6. Improved Thermoelectric Power Factor of InGaZnO/SiO₂ Thin Film Transistor via Gate-Tunable Energy Filtering
7. Atomic structure analysis of gallium oxide at the Al2O3/GaN interface using photoelectron holography.
8. Enhancement in Reliability of a-InZnO TFT by Fluorine-Doped Polysilsesquioxane Passivation with Spray Pyrolysis
9. Low Temperature Solution Processed Hybrid Gate Insulators for High Performance Oxide Thin-Film Transistors
10. (Invited) Highly Reliable Metal Oxide Thin Film Transistors for Flexible Devices
11. (Invited) Hot Carrier Phenomena in Oxide Thin-Film Transistors
12. Improvement in Bias Stress Stability of Solution-Processed Amorphous InZnO Thin-Film Transistors via Low-Temperature Photosensitive Passivation
13. P‐11: High Performance All‐Solution Processed InZnO Thin‐Film Transistors via Photo‐Functionalization at Varying Fluence and Annealing Environment
14. 7‐2: Invited Paper: Hot Carrier Degradation in High Mobility Metal Oxide Thin Film Transistors
15. High-Performance Fully Solution-Processed Oxide Thin-Film Transistors via Photo-Assisted Role Tuning of InZnO
16. Erratum: High Performance Amorphous In–Ga–Zn–O Thin-Film Transistors with Low Temperature High-k Solution Processed Hybrid Gate Insulator [ ECS J. Solid State Sci. Technol., 9, 025002 (2020)]
17. Unique degradation under AC stress in high-mobility amorphous In–W–Zn–O thin-film transistors
18. Bias stress and humidity exposure of amorphous InGaZnO thin-film transistors with atomic layer deposited Al2O3 passivation using dimethylaluminum hydride at 200 °C
19. High Performance Amorphous In–Ga–Zn–O Thin-Film Transistors with Low Temperature High-k Solution Processed Hybrid Gate Insulator
20. Rapid photo-assisted activation and enhancement of solution-processed InZnO thin-film transistors
21. High reliability InGaZnO TFT by inductively coupled plasma sputtering system
22. Hot carrier effects in InGaZnO thin-film transistor
23. Low Temperature High-k Solution Processed Hybrid Gate Insulator for High Performance Amorphous In-Ga-Zn-O Thin-Film Transistors
24. 30‐3: High Performance All Solution Processed Oxide Thin‐Film Transistor via Photo‐induced Semiconductor‐to‐Conductor Transformation of a‐InZnO
25. P‐193: Late‐News Poster: Low Temperature Solution Processed InZnO TFT Annealed in Wet Ambient
26. Degradation phenomenon in metal-oxide-semiconductor thin-film transistors and techniques for its reliability evaluation and suppression
27. Highly reliable low-temperature (180 °C) solution-processed passivation for amorphous In–Zn–O thin-film transistors
28. Improvement of the stability of an electric double-layer transistor using a 1H,1H,2H,2H-perfluorodecyltriethoxysilane barrier layer
29. SrTa2O6 induced low voltage operation of InGaZnO thin-film transistors
30. Properties of TlZnSnO film fabricated via sputtering from TlZnSnO target
31. Self-Heating Suppressed Structure of a-IGZO Thin-Film Transistor
32. High performance top gate a-IGZO TFT utilizing siloxane hybrid material as a gate insulator
33. (Invited) High Density IGZO Film for Highly Reliable TFT By Inductively Coupled Plasma Sputtering Technology in Low Temperature Process
34. Reliability Enhancement of Solution Processed Amorphous In-Zn-O Thin-Film Transistors via a Low Temperature (180 °C) Solution Processed Passivation
35. Threshold Voltage Control of In-Ga-Zn-O TFT without Thermal Annealing Process by Inductively Coupled Plasma Sputtering System
36. Instantaneous Semiconductor-to-Conductor Transformation of a Transparent Oxide Semiconductor a-InGaZnO at 45 °C
37. Dimethylaluminum hydride for atomic layer deposition of Al2O3 passivation for amorphous InGaZnO thin-film transistors
38. Significant mobility improvement of amorphous In-Ga-Zn-O thin-film transistors annealed in a low temperature wet ambient environment
39. P-196: Late-News Poster: Off Current Reduction of BG poly-Si TFT by PLAS Process
40. Improvement of Amorphous InGaZnO Thin-Film Transistor Using High-k SrTa2 O6 as Gate Insulator Deposited by Sputtering Method
41. Evaluation of stress stabilities in amorphous In–Ga–Zn–O thin-film transistors: Effect of passivation with Si-based resin
42. H and Au diffusion in high mobility a-InGaZnO thin-film transistors via low temperature KrF excimer laser annealing
43. 7‐2: Invited Paper:Hot Carrier Degradation in High Mobility Metal Oxide Thin Film Transistors
44. Nano-crystallization in ZnO-doped In2O3 thin films via excimer laser annealing for thin-film transistors
45. Reliability Improvement of Amorphous InGaZnO Thin-Film Transistors by Less Hydroxyl-Groups Siloxane Passivation
46. Self-heating induced instability of oxide thin film transistors under dynamic stress
47. Effect of Fluorine in a Gate Insulator on the Reliability of Indium-Gallium-Zinc Oxide Thin-Film Transistors
48. Effect of excimer laser annealing ona-InGaZnO thin-film transistors passivated by solution-processed hybrid passivation layers
49. High-density carrier-accumulated and electrically stable oxide thin-film transistors from ion-gel gate dielectric
50. P‐193: Late‐News Poster:Low Temperature Solution Processed InZnO TFT Annealed in Wet Ambient
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