1. Operation of Photo Electron Spectrometers for Non-Invasive Photon Diagnostics at the European X-Ray Free Electron Laser.
- Author
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Laksman, Joakim, Dietrich, Florian, Maltezopoulos, Theophilos, Liu, Jia, Ferreira de Lima, Danilo Enoque, Gerasimova, Natalia, Karpics, Ivars, Kujala, Naresh, Schmidt, Philipp, Karabekyan, Suren, Serkez, Svitozar, and Grünert, Jan
- Subjects
POLARIZED photons ,HARD X-rays ,X-ray lasers ,SOFT X rays ,MICROCHANNEL plates ,FREE electron lasers - Abstract
Angle-resolved photoelectron spectrometers with microchannel plate detectors and fast digitizer electronics are versatile and powerful devices for providing non-invasive single-shot photon diagnostics at a MHz repetition rate X-ray free-electron lasers. In this contribution, we demonstrate and characterize the performance of our two operational photoelectron spectrometers for the application of hard X-rays and soft X-rays as well as new automation tools and online data analysis that enable continuous support for machine operators and instrument scientists. Customized software has been developed for the real-time monitoring of photon beam polarization and spectral distribution both in single-color and two-color operation. Hard X-ray operation imposes specific design challenges due to poor photoionization cross-sections and very high photoelectron velocities. Furthermore, recent advancements in machine learning enable resolution enhancement by training the photoelectron spectrometer together with an invasive high-resolution spectrometer, which generates a response function model. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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