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An extension of the problem of reflection from a flat dielectric-chiral interface is presented. A dielectric-chiral rough interface is assumed and scattered field is calculated using small perturbation method (SPM). Zeroth-order solution in SPM corresponds to that of a flat interface and is used to make a comparison with the earlier reported solution for a dielectric-chiral flat interface. The recursive nature of the problem has been utilized to obtain the solution to any order. First case deals with chiral grating with sinusoidal profile and diffraction efficiency is calculated. Secondly, a rough surface with the arbitrary profile is assumed and the incoherent bi-static scattering coefficient is given in terms of Gaussian roughness spectrum. Numerical results are reported for chirality parameter, permittivity, height and correlation length of the surface. Result for a dielectric rough surface is obtained by selecting chirality equal to zero. This analysis shows how much scattering differs due to chirality. [ABSTRACT FROM AUTHOR]

Scattering from a perfect electric conducting cylinder with random radius buried below a half space dielectric homogenous interface is studied. The cylindrical wave scattered by cylinder is expanded in terms of plane wave spectrum. Small perturbation method is used to study the interaction of each plane wave with the interface. The zeroth order term yields solution for a flat interface, whereas scattering from a rough surface is given by first-order term. Results are obtained for both TM and TE polarizations. Analytical expressions of the average scattered field are obtained and verified using numerical evaluation. Different scattering scenarios are simulated by varying the distribution of the radius. It is observed that average scattering cross section of an ensemble with normal/uniform distribution is almost equal to that of a cylinder with mean radius. [ABSTRACT FROM PUBLISHER]