1. Deep Neural Networks for Analysis of Microscopy Images—Synthetic Data Generation and Adaptive Sampling
- Author
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Patrick Trampert, Dmitri Rubinstein, Faysal Boughorbel, Christian Schlinkmann, Maria Luschkova, Philipp Slusallek, Tim Dahmen, and Stefan Sandfeld
- Subjects
microscopy image segmentation ,deep learning ,data augmentation ,synthetic training data ,parametric models ,Crystallography ,QD901-999 - Abstract
The analysis of microscopy images has always been an important yet time consuming process in materials science. Convolutional Neural Networks (CNNs) have been very successfully used for a number of tasks, such as image segmentation. However, training a CNN requires a large amount of hand annotated data, which can be a problem for material science data. We present a procedure to generate synthetic data based on ad hoc parametric data modelling for enhancing generalization of trained neural network models. Especially for situations where it is not possible to gather a lot of data, such an approach is beneficial and may enable to train a neural network reasonably. Furthermore, we show that targeted data generation by adaptively sampling the parameter space of the generative models gives superior results compared to generating random data points.
- Published
- 2021
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