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The field electron emission properties of carbon nanotube (CNT) films composed of densely packed and highly aligned CNTs were investigated. The CNT films were produced by a continuous film casting process and are spooled into long lengths with the CNTs aligned lengthwise in the film. The anisotropic nature of the CNT film morphology was confirmed by performing specific conductivity measurements in directions both parallel and perpendicular to the aligned CNT microstructure. Field emission experiments were performed on 5 and 10 mm wide films that were mechanically cut into small samples and then vertically mounted so that the emission occurred from the film edge. The films were mounted with the aligned CNT microstructure oriented either parallel or perpendicular to the direction of the applied electric field. The highest emission currents were produced by films mounted in the parallel alignment configuration. Additional experiments were performed on films that were folded, which eliminated surface irregularities at the film edge due to the cutting process. SEM imaging performed at the ridge of the folded film before and after field emission (FE) experiments showed that films mounted in the parallel alignment configuration had minimal surface damage after FE, while films mounted in the perpendicular alignment configuration showed substantial damage. The effective emission area and field enhancement factor were extracted from the FE data using the orthodox Fowler–Nordheim theory. Folded CNT film cathodes mounted in the parallel alignment configuration produced the highest emission currents, while demonstrating a larger emission area and lower field enhancement factor. [ABSTRACT FROM AUTHOR]

This work seeks to understand how the topography of a surface can be engineered to control secondary electron emission (SEE) for multipactor suppression. Two unique, semi-empirical models for the secondary electron yield (SEY) of a micro-porous surface are derived and compared. The first model is based on a two-dimensional (2D) pore geometry. The second model is based on a three-dimensional (3D) pore geometry. The SEY of both models is shown to depend on two categories of surface parameters: chemistry and topography. An important parameter in these models is the probability of electron emissions to escape the surface pores. This probability is shown by both models to depend exclusively on the aspect ratio of the pore (the ratio of the pore height to the pore diameter). The increased accuracy of the 3D model (compared to the 2D model) results in lower electron escape probabilities with the greatest reductions occurring for aspect ratios less than two. In order to validate these models, a variety of micro-porous gold surfaces were designed and fabricated using photolithography and electroplating processes. The use of an additive metal-deposition process (instead of the more commonly used subtractive metal-etch process) provided geometrically ideal pores which were necessary to accurately assess the 2D and 3D models. Comparison of the experimentally measured SEY data with model predictions from both the 2D and 3D models illustrates the improved accuracy of the 3D model. For a micro-porous gold surface consisting of pores with aspect ratios of two and a 50% pore density, the 3D model predicts that the maximum total SEY will be one. This provides optimal engineered surface design objectives to pursue for multipactor suppression using gold surfaces. [ABSTRACT FROM AUTHOR]

A numerical calculation of the patch-field distribution across nanopatchwork surfaces has been developed. Results show that the low work-function nanosize zones are intrinsically protected by an electrostatic screen, which is induced by the surrounding area having a higher work function. In presence of an applied field, during field emission, a preferential opening of the surface barrier above the nanopatches induces a field emission array of parallel e-beams whose geometrical distribution is defined by the positions of the nanopatches. [ABSTRACT FROM AUTHOR]

Thin films of lanthanum monosulfide (LaS) have been deposited on Si (100) substrates by pulsed laser deposition. The films are golden yellow in appearance with a mirrorlike surface morphology and a sheet resistance around 0.1 Ω/□, as measured using a four-probe measurement technique. The thin films are characterized by atomic force microscopy (AFM), x-ray diffraction (XRD) analysis, high resolution transmission electron microscopy (HRTEM), ellipsometry, and Raman spectroscopy. The root-mean-square variation of (1 μm thick) film surface roughness measured over a 1 μm2 area by AFM was found to be 1.74 nm. XRD analysis of fairly thick films (micrometer size) reveals the growth of the cubic rocksalt structure with a lattice constant of 5.863(7) Å, which is close to the bulk LaS value. HRTEM images reveal that the films are comprised of nanocrystals separated by regions of amorphous material. Two beam bright field TEM images show that there is a strain contrast in the Si substrate right under the interface with the LaS film and penetrating into the Si substrate. This suggests that there is an initial epitaxial-like growth of the LaS film on the Si substrate that introduces a strain as a result of the 8% lattice mismatch between the film and substrate. Ellipsometry measurements of the LaS films are well characterized by a Drude-Lorentz model from which an electron concentration of about 2.52×1022 cm-3 and a mobility around 8.5 cm2/V s are derived. Typical crystalline LaS features were evident in Raman spectra of the films, but the spectra also revealed their disordered (polycrystalline) nature. [ABSTRACT FROM AUTHOR]

This paper studies field emission (FE) from a single carbon nanotube (CNT) fiber with different anode-cathode (AK) gap distances. It is found that the field enhancement factor depends strongly on the finite AK gap distance, due to the combination of geometrical effects and possible fiber morphology change. The geometrical effects of AK gap distance on the field enhancement factor are confirmed using COMSOL simulations. The slope drop in the Fowler-Northeim (FN) plot of the FE data in the high voltage is related to the electrical contact resistance between the CNT fiber and the substrate. It is found that even a small series resistance to the field emitter (<30% of the emission gap impedance) can strongly modify the FE characteristics in the high voltage regime, inducing a strong deviation from the linear FN plot. [ABSTRACT FROM AUTHOR]