11 results on '"Enkisch, Hartmut"'
Search Results
2. Determining the transmission of thin foil filters for soft X-ray free-electron laser radiation: an ablation imprint approach
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Burian, Tomáš, Hájková, Věra, Saksl, Karel, Vozda, Vojtěch, Makhotkin, Igor A., Louis, Eric, Schreiber, Siegfried, Tiedtke, Kai, Toleikis, Sven, Keitel, Barbara, Plönjes, Elke, Ruiz-Lopez, Maria Isabel, Kuhlmann, M., Wodzinski, A., Enkisch, Hartmut, Hermann, Martin, Strobel, Sebastian, Loch, R.A., Sobierajski, Ryszard, Jacyna, Iwanna, Klinger, Dorota, Jurek, Marek, Pełka, Jerzy B., de Vries, Gosse, Störmer, Michael, Scholze, Frank, Siewert, Frank, Mey, Tobias, Chalupský, Jaromir, and XUV Optics
- Abstract
An accurate transmission measurement of thin foils (usually made of elemental metals and/or semiconductors), which routinely are used as attenuators in soft x-ray beamlines, end-stations and instruments, represents a long standing problem over the wide experimentation field with photon beams, see for example [1-4]. Such foils are also frequently utilized for blocking long wavelength emission, i.e., UV-Vis-IR radiation, from plasma and high order harmonic sources, whilst soft x-rays emitted from the source pass through the foil with only a slight attenuation. Despite the enormous amount of data available in the literature, e.g., Henke’s tables [5], measurements made on real foils often provide surprising results. In this study, a procedure based on the ablation imprints method is utilized for determination of soft x-ray filter transmission, namely the f-scan technique [6,7]. This technique combines the GMD (Gas Monitor Detector) pulse energy measurement and attenuation of the beam by foils (made of different metallic/semiconducting elements of varying thickness) with areas of ablation imprints created on a suitable target, e.g. PMMA – Poly(methyl methacrylate). The results show only a partial overlap with transmission values found in Henke’s tables. Nevertheless, a good agreement with transmission values determined by conventional radiometry techniques at synchrotron radiation beamlines has been found. Such a difference between the experimentally obtained values and transmissions calculated for a pure element is usually explained by spontaneous formation of oxidized layers on the filter surface and in the near-surface layer and their possible alteration by intense FEL radiation. The first results obtained with Al, Nb, Zr and Si filters at FLASH/FLASH2 (Free-electron LASer in Hamburg tuned to 13.5 nm) facilities will be shown and discussed in this presentation.
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- 2019
3. Determining the transmission of thin foil filters for soft X-ray free-electron laser radiation: an ablation imprint approach (Conference Presentation)
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Burian, Tomáš, primary, Hájková, Vera, additional, Juha, Libor, additional, Saksl, Karel, additional, Vozda, Vojtech, additional, Makhotkin, Igor A., additional, Louis, Eric, additional, Schreiber, Siegfried, additional, Tiedtke, Kai, additional, Toleikis, Sven, additional, Keitel, Barbara, additional, Plönjes, Elke, additional, Ruiz-Lopez, Mabel, additional, Kuhlmann, Marion, additional, Wodzinski, Thomas A., additional, Enkisch, Hartmut, additional, Hermann, Martin, additional, Strobel, Sebastian, additional, Loch, Rolf A., additional, Sobierajski, Ryszard, additional, Jacyna, Iwanna, additional, Klinger, Dorota, additional, Jurek, Marek, additional, Pelka, Jerzy, additional, de Vries, Gosse, additional, Störmer, Michael, additional, Scholze, Frank, additional, Siewert, Frank, additional, Mey, Tobias, additional, and Chalupský, Jaromír, additional
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- 2019
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4. Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold
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Makhotkin, Igor A., primary, Milov, Igor, additional, Chalupský, Jaromir, additional, Tiedtke, Kai, additional, Enkisch, Hartmut, additional, de Vries, Gosse, additional, Scholze, Frank, additional, Siewert, Frank, additional, Sturm, Jacobus M., additional, Nikolaev, Konstantin V., additional, van de Kruijs, Robbert W. E., additional, Smithers, Mark A., additional, van Wolferen, Henk A. G. M., additional, Keim, Enrico G., additional, Louis, Eric, additional, Jacyna, Iwanna, additional, Jurek, Marek, additional, Klinger, Dorota, additional, Pelka, Jerzy B., additional, Juha, Libor, additional, Hájková, Věra, additional, Vozda, Vojtěch, additional, Burian, Tomáš, additional, Saksl, Karel, additional, Faatz, Bart, additional, Keitel, Barbara, additional, Plönjes, Elke, additional, Schreiber, Siegfried, additional, Toleikis, Sven, additional, Loch, Rolf, additional, Hermann, Martin, additional, Strobel, Sebastian, additional, Donker, Rilpho, additional, Mey, Tobias, additional, and Sobierajski, Ryszard, additional
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- 2018
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5. Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser
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Milov, Igor, primary, Makhotkin, Igor A., additional, Sobierajski, Ryszard, additional, Medvedev, Nikita, additional, Lipp, Vladimir, additional, Chalupský, Jaromir, additional, Sturm, Jacobus M., additional, Tiedtke, Kai, additional, de Vries, Gosse, additional, Störmer, Michael, additional, Siewert, Frank, additional, van de Kruijs, Robbert, additional, Louis, Eric, additional, Jacyna, Iwanna, additional, Jurek, Marek, additional, Juha, Libor, additional, Hájková, Věra, additional, Vozda, Vojtěch, additional, Burian, Tomáš, additional, Saksl, Karel, additional, Faatz, Bart, additional, Keitel, Barbara, additional, Plönjes, Elke, additional, Schreiber, Siegfried, additional, Toleikis, Sven, additional, Loch, Rolf, additional, Hermann, Martin, additional, Strobel, Sebastian, additional, Nienhuys, Han-Kwang, additional, Gwalt, Grzegorz, additional, Mey, Tobias, additional, Enkisch, Hartmut, additional, and Bijkerk, Fred, additional
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- 2018
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6. Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold
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Makhotkin, Igor A., primary, Sobierajski, Ryszard, additional, Chalupský, Jaromir, additional, Tiedtke, Kai, additional, de Vries, Gosse, additional, Störmer, Michael, additional, Scholze, Frank, additional, Siewert, Frank, additional, van de Kruijs, Robbert W. E., additional, Milov, Igor, additional, Louis, Eric, additional, Jacyna, Iwanna, additional, Jurek, Marek, additional, Klinger, Dorota, additional, Nittler, Laurent, additional, Syryanyy, Yevgen, additional, Juha, Libor, additional, Hájková, Věra, additional, Vozda, Vojtěch, additional, Burian, Tomáš, additional, Saksl, Karel, additional, Faatz, Bart, additional, Keitel, Barbara, additional, Plönjes, Elke, additional, Schreiber, Siegfried, additional, Toleikis, Sven, additional, Loch, Rolf, additional, Hermann, Martin, additional, Strobel, Sebastian, additional, Nienhuys, Han-Kwang, additional, Gwalt, Grzegorz, additional, Mey, Tobias, additional, and Enkisch, Hartmut, additional
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- 2018
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7. Role of heat accumulation in the multi-shot damage of silicon irradiated with femtosecond XUV pulses at a 1 MHz repetition rate
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Sobierajski, Ryszard, primary, Jacyna, Iwanna, additional, Dłużewski, Piotr, additional, Klepka, Marcin T., additional, Klinger, Dorota, additional, Pełka, Jerzy B., additional, Burian, Tomáš, additional, Hájková, Věra, additional, Juha, Libor, additional, Saksl, Karel, additional, Vozda, Vojtěch, additional, Makhotkin, Igor, additional, Louis, Eric, additional, Faatz, Bart, additional, Tiedtke, Kai, additional, Toleikis, Sven, additional, Enkisch, Hartmut, additional, Hermann, Martin, additional, Strobel, Sebastian, additional, Loch, Rolf A., additional, and Chalupsky, Jaromir, additional
- Published
- 2016
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8. Optical Systems for EUVL
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Migura, Sascha, primary, Kaiser, Winfried, primary, Neumann, Jens Timo, primary, Enkisch, Hartmut, primary, and Hellweg, Dirk, primary
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9. Bloch k-selective resonant inelastic scattering of hard X-rays from valence electrons of 3d-metals
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Enkisch, Hartmut, Schülke, Winfried, and Eberhardt, W.
- Subjects
spectator hole ,Valenzfluoreszenz ,dipole approximation ,radiativeAuger satellite ,Übergangsmatrixelement ,resonant Ramaneffect ,Zuschauerlochzustand ,Bloch k-selectivity ,DFT ,resonantinelastic scattering ,Rumpf-Loch ,Sättigungsenergie ,valence fluorescence ,x-ray scattering ,supercell ,core hole ,DOS ,Cu ,polarization dependence ,radiativerAugersatellite ,KMM ,Quadrupolübergang ,onset energy ,Polarisationsabhängigkeit ,LAPW ,shake processes ,Shakeprozesse ,Bloch k-momentumconservation ,resonantinelastische Streuung ,density of states ,Bloch-k-Impulserhaltung ,Röntgenstreuung ,transition matrix element ,Bloch-k-Selektivität ,line shape ,RIXS ,energy loss ,KNN ,saturationenergy ,shakeup ,Zustandsdichte ,Energieverlust ,NiAl ,elektronische Bandstruktur ,Temperaturabhängigkeit ,temperature dependence ,screening ,resonanterRamaneffekt ,quadrupolartransition ,threshold energy ,Linienform ,Superzelle ,electronic band structure ,Dipolnäherung ,Abschirmung ,Schwellenenergie - Abstract
Die Form von resonant angeregen Valenz-Fluoreszenzspektren hängt sowohl vonder Energie der einfallenden Strahlung, als auch von Größe und Richtung desImpulsübertrags q ab, falls harte Röntgenstrahlen benutzt werden. DieserEffekt ist auf die elektronische Bandstruktur der Valenz- undLeitungselektronen der Probe, in Kombination mit der Energie- undImpulserhaltung des Streuprozesses zurückzuführen, woraus dieBloch-k-Impulserhaltung des resonant inelastischen Streuprozesses folgt.In dieser Arbeit wird die Gültigkeit der Bloch-k-Impulserhaltung im Bereichder harten Röntgenstrahlen und ihre Anwendbarkeit auf metallische Probengezeigt. Dazu werden die K-Kante von Cu und die K-Kante von Ni in NiAluntersucht. Ausgehend von einer LAPW Bandstrukturrechnung werden resonantangerege Valenz-Fluoreszensspektren berechnet. Diese stimmen gut mit dengemessenen Spektren überein.Weiterhin werden mehrere Effekte untersucht, die den Bloch-k-erhaltendenresonant inelasischen Röntgenstreuprozess beeinflussen.Im Gegensatz zur Streuung im Bereich der weichen Röntgenstrahlung ist an derK-Kante von Cu keine Zerstörung der Bloch-k-Erhaltung durchElektron-Phonon-Wechselwirkung im Zwischenzustand meßbar. In der Tat ist nurein kleiner nicht-k-erhaltender Anteil von wenigen Prozent zu erwarten, dadie Lebensdauer des 1s Rumpf-Lochs von Cu kürzer als dieElektron-Phonon-Wechselwirkungszeit ist.Mit Hilfe einer Superzellen-Rechnung an Cu wird gezeigt, daß die Abschirmungdes 1s-Rumpf-Lochs keinen Einfluß auf den Streuprozeß hat, falls an denK-Kanten der schweren 3d-Übergangsmetalle angeregt wird. DieSuperzellen-Methode wird im Detail beschrieben, und die Konvergenz derLadungsdichte bezüglich der Größe der Superzelle wird ausführlichuntersucht.Die Intensität des 3d-nach-1s-Quadupolübergangs relativ zum4p-nach-1s-Dipolübergang wird durch die Berechnung der entsprechendenÜbergangs-Matrixelemente bestimmt. Das Ergebnis wird anhand von Ga, Ge undAs überprüft, indem berechnete Floreszenzspektren mit gemessenen verglichenwerden, da für diese Elemente die 3d-Fluoreszenzlinie von der4p-Fluoreszenzlinie getrennt ist. Ferner wird die Abschirmung des3d9-Endzustands im Fall des 3d-nach-1s-Quadrupolübergangs untersucht. Damitist es möglich, sowohl die Intensität als auch die energetische Position desQuadrupolbeitrags zur Fluoreszenz für Cu zu bestimmen.Die Valenz-Fluoreszenzlinie der schweren 3d-Übergangsmetalle wird teilweisevom radiativen KNN Auger-Satelliten ueberdeckt. Die Intensität diesesSatelliten, dem ein Doppelionisationsprozess während der Emission einesFluoreszenzphotons zugrunde liegt, wird für die Elemente Co bis Asuntersucht. Um die Satellitenlinie in der Auswertung von Bloch-k-selektivenValenz-Fluoreszenzspektren richtig berücksichtigen zu können, wird derKNN-Satellit im Rahmen eines semiempirischen Modells behandelt, das aus demresonant inelastischen Streuquerschnitt hergeleitet und anhand derradiativen KMN- und KMM-Auger-Satelliten von Cu bestätigt wird Darüber hinaus werden die Cu K beta' und Cu K beta'' Satelliten der Cu Kbeta_1,3 Fluoreszenzlinie untersucht. Diese Satelliten stammen von einemDoppelionisationsprozeß während der Absorption eines Photons. Aus ihrerSchwellenenergie kann geschlossen werden, daß ihnen ein3d-Zuschauer-Lochzustand zugrunde liegt, während der kurze Sättigungsbereichdarauf hindeutet, daß diese Satelliten von shakeup-Prozessen dominiertwerden., The shape of resonantly excited valence fluorescence spectra depends on theenergy of the incident radiation as well as on the size and the direction ofthe momentum transfer q if hard x-rays are used. This effect is due to theelectronic band structure of the valence and conduction electrons of thesample in combination with the energy and momentum conservation of thescattering process, giving rise to the law of Bloch k-momentum conservationof the resonant inelastic scattering process.In this thesis, the validity of the Bloch k-momentum conservation in thehard x-ray regime and its applicability to metallic samples are demonstratedby probing the K edge of Cu and the K edge of Ni in NiAl. Based on a LAPWbandstructure calculation resonantly excited valence fluorescence spectraare calculated. These agree well with the measured spectra.Four effects influencing the Bloch k-conserving resonant inelastic x-rayscattering process have been investigated. In contrast to scattering in the soft x-ray regime a destruction of thek-conservation due to electron-phonon interaction in the intermediate stateis not measurable at the K edge of Cu. Indeed, only a small k-unselectivefraction of a few percent is expected, since the lifetime of the 1s corehole in Cu is shorter than the electron-phonon interaction time.By means of a supercell calculation of Cu it is found that screening of the1s core hole does not alter the scattering process if the K edges of thelate 3d elements are probed. A detailed description of the supercellapproach is given. The convergence of the charge density with respect to thesize of the supercell is thoroughly investigated.The intensity of the quadrupolar 3d-to-1s transition relative to the dipolar4p-to-1s transition is obtained from the calculation of the correspondingtransition matrix elements. The result is verified by comparing calculatedto measured fluorescence spectra in the case of Ga, Ge, and As, where the 3dfluorescence line is separated from the 4p fluorescence line. Moreover, thescreening of the 3d9 final state configuration in case of the quadrupolar3d-to-1s transition is investigated. This allows to determine properly theintensity and the energetic position of the quadrupolar fluorescencecontribution in the case of Cu.The valence fluorescence lines of the late 3d elements is partly obscured bythe KNN radiative Auger satellite. The intensity of this satellite line,which is due to a double ionization process during the emission of afluorescence photon, is investigated for the elements from Co to As. Inorder to be properly considered in the interpretation of the Blochk-selective valence floresence spectra, the shape of the KNN satellite isaccounted for by a semiempirical model, which is derived from the resonantinelastic scattering cross section. The model is confirmed by investigatingthe KMN and KMM radiative Auger satellites of Cu.Moreover, the Cu K beta' and Cu K beta'' satellites of the Cu K beta_1,3fluorescence line are examined. These satellites stem from a doubleionization process during the absorption of a photon. From their thresholdenergy it is possible to confirm that they are due to a 3d spectator hole.The short saturation range indicates that these satellites are dominated byshakeup processes.
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- 2002
10. Characterization of the measurement uncertainty of a laboratory EUV reflectometer for large optics
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Scholze, Frank, primary, Böttger, Thomas, additional, Enkisch, Hartmut, additional, Laubis, Christian, additional, Loyen, Ludwig van, additional, Macco, Fritz, additional, and Schädlich, Stefan, additional
- Published
- 2006
- Full Text
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11. Characterization of large off-axis EUV mirrors with high accuracy reflectometry at PTB
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Laubis, Christian, primary, Buchholz, Christian, additional, Fischer, Andreas, additional, Plöger, Sven, additional, Scholz, Frank, additional, Wagner, Heike, additional, Scholze, Frank, additional, Ulm, Gerhard, additional, Enkisch, Hartmut, additional, Müllender, Stephan, additional, Wedowski, Marco, additional, Louis, Eric, additional, and Zoethout, Erwin, additional
- Published
- 2006
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