21 results on '"Enichlmair, Hubert"'
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2. Impact of single-defects on the variability of CMOS inverter circuits
3. The role of cold carriers and the multiple-carrier process of Si–H bond dissociation for hot-carrier degradation in n- and p-channel LDMOS devices
4. Toward Automated Defect Extraction From Bias Temperature Instability Measurements
5. Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures
6. Investigation of NBTI Recovery During Measurement
7. Modeling of hot-carrier degradation in LDMOS devices using a drift-diffusion based approach
8. Predictive and efficient modeling of hot-carrier degradation in nLDMOS devices
9. A model for hot-carrier degradation in nLDMOS transistors based on the exact solution of the Boltzmann transport equation versus the drift-diffusion scheme
10. Modeling of hot-carrier degradation in LDMOS devices using a drift-diffusion based approach.
11. Local oxide capacitance as a crucial parameter for characterization of hot-carrier degradation in long-channel n-MOSFETs
12. Hot-carrier behaviour and ron-BV trade-off optimization for p-channel LDMOS transistors in a 180 nm HV-CMOS technology
13. Analysis of worst-case hot-carrier degradation conditions in the case of n- and p-channel high-voltage MOSFETs
14. Impact of the carrier distribution function on hot-carrier degradation modeling
15. Secondary generated holes as a crucial component for modeling of HC degradation in high-voltage n-MOSFET
16. Accurate Extraction of MOSFET Unstressed Interface State Spatial Distribution from Charge Pumping Measurements
17. Physics-Based Hot-Carrier Degradation Modeling
18. Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation.
19. Statistical Modelling of MOS Transistor Mismatch for High-voltage CMOS Processes
20. Optimization of a wet-patterning bottom antireflective i-line coating for both poly gate and metal lithography processes
21. Novel optomagnetic tool: light-modulated superconducting quantum interference devices (SQUIDs) susceptometer
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