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137 results on '"Endo, Junji"'

2. Utilization of deep learning to evaluate the measurement results of forced oscillation technique

Author

Funaita, Chiune, primary, Furuie, Wakaba, additional, Koike, Fumika, additional, Oyama, Saki, additional, Endo, Junji, additional, Otani, Yoshio, additional, Ichikawa, Yuri, additional, Ito, Minako, additional, Nakamura, Yoichi, additional, Komatuzaki, Keiko, additional, Hirata, Akira, additional, Miyazaki, Yasunari, additional, and Sumi, Yuki, additional

Published
2023
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3. Bulk micromachined tunneling tips integrated with positioning actuators

Author

Mita, Makoto, Kawara, Hiroaki, Toshiyoshi, Hiroshi, Endo, Junji, and Fujita, Hiroyuki

Subjects
Actuators -- Mechanical properties, Microelectromechanical systems -- Product development, Engineering and manufacturing industries, Science and technology
Abstract

In this paper, we have successfully developed an integrated micromechanical system for controlling tunneling current. A pair of nanoscale tunneling tips have been integrated with a silicon micromachined electrostatic actuator of high-aspect ratio. The tip sharpness has been observed to be as sharp as commercial tips by scanning over surface of carbon graphite as an atom scale. We have also succeeded to observe the tunneling current in the air and in the vacuum condition (in TEM). [0941] Index Terms--Deep-reactive ion etching (DRIE), ICP-RIE, microactuators, scanning tunneling microscopy (STM), tunneling current.

Published
2005

4. Transmission laser microscope using the phase-shifting technique and its application to measurement of optical waveguides

Author

Endo, Junji, Chen, Jun, Kobayashi, Dai, Wada, Yauo, and Fujita, Hiroyuki

Subjects
Optics -- Usage, Microscope and microscopy -- Innovations, Astronomy, Physics
Abstract

A type of a transmission phase-shifting laser microscope, believed to be new, has been developed. In this microscope a biprism located between a magnifying lens and an observation plane was used as a beam splitter. The biprism is laterally translated to introduce phase shifts required for quantitative phase measurement with a phase-shifting technique. The disturbance caused by a Fresnel-diffracted wave from the splitting edge of the biprism is reduced by placement of a linear beam stopper at the center of an intermediate image plane. As the first application, the developed microscope is used to measure a refractive-index distribution in optical waveguides. A difference of refractive indices of less than 6 x [10.sup.-5] is clearly measured in the submicrometer region. OCIS codes: 180.3170, 120.3180, 120.5050, 120.7000, 230.7370, 000.2170.

Published
2002

12. Sensitivity-enhanced electron holography and its application to magnetic recording investigations.

Author

Hasegawa, Shuji, Kawasaki, Takeshi, Endo, Junji, Tonomura, Akira, Honda, Yukio, Futamoto, Masaaki, Yoshida, Kazuetsu, Kugiya, Fumio, and Koizumi, Makoto

Subjects
ELECTRON holography, MAGNETIC flux, MAGNETIC fields
Abstract

Examines the sensitivity-enhanced electron holography and its application to magnetic recording investigations. Information on the quantitative measurement of magnetic flux; Distribution of a leakage magnetic field; Calculation of the magnetic field vector component.

Published
1989
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13. Microelectromechanical Digital-to-Analog Converters of Displacement for Step Motion Actuators

Author

Toshiyoshi, Hiroshi, Kobayashi, Dai, Mita, Makoto, Hashiguchi, Gen, Fujita, Hiroyuki, Endo, Junji, and Wada, Yasuo

Subjects
Electromechanical devices -- Design and construction, Digital-to-analog converters -- Research, Engineering and manufacturing industries, Science and technology
Abstract

This paper presents a novel micromechanism for precise positioning by using an N-bit digital code. The mechanism is an N-stage network of connected suspensions, in which an electrostatic actuator is attached to the longer suspensions of compliance 2C, and N of such unit structures are connected side by side with the shorter suspensions of compliance C. Each actuator is an electrostatic shuttle moving back and forth between the driving electrodes, and is operated by the corresponding digit of the input code. The N-bits of local displacement accumulate in the suspension network to synthesize an analog output, which is proportional to the analog value coded with the N-bit input. The output displacement is independent of the fluctuation of the driving voltage since the traveling distance of the shuttle is clipped by mechanical stoppers. We call the mechanism a microelectromechanical digital-to-analog converter (MEMDAC) since the function is equivalent to the electrical digital-to-analog converter known as the R-2R resistor network. Three different types of MEMDAC's are compared. Preliminary results of a silicon micromachined 4-bit MEMDAC successfully showed a total stroke of 5.8 [micro]m with a step of 0.38 [micro]m. The positioning resolution can be made finer by simply increasing the number of chained units. [477] Index Terms--Digital-analog conversion, displacement control, MEMS, microactuators.

Published
2000

17. Exceptional plasticity of silicon nanobridges

Author

Ishida, Tadashi, primary, Cleri, Fabrizio, additional, Kakushima, Kuniyuki, additional, Mita, Makoto, additional, Sato, Takaaki, additional, Miyata, Masaki, additional, Itamura, Noriaki, additional, Endo, Junji, additional, Toshiyoshi, Hiroshi, additional, Sasaki, Naruo, additional, Collard, Dominique, additional, and Fujita, Hiroyuki, additional

Published
2011
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19. Exceptional plasticity of silicon nanobridges

Author

Cleri, Fabrizio, Collard, Dominique, Ishida, Tadashi, Kakushima, Kuniyuki, Mita, Makoto, Sato, Takaaki, Miyata, Masaki, Itamura, Noriaki, Endo, Junji, Toshiyoshi, Hiroshi, Sasaki, Naruo, Fujita, Hiroyuki, Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), and Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

Subjects
Surface diffusion, Materials science, Silicon, Mechanical Engineering, chemistry.chemical_element, Bioengineering, Nanotechnology, 02 engineering and technology, General Chemistry, Plasticity, 021001 nanoscience & nanotechnology, 01 natural sciences, Brittleness, chemistry, Mechanics of Materials, Transmission electron microscopy, 0103 physical sciences, General Materials Science, Electrical and Electronic Engineering, Diffusion (business), Composite material, Deformation (engineering), 010306 general physics, 0210 nano-technology, Nanoscopic scale
Abstract

著者人数: 12名, 資料番号: SA1003124000

Published
2011
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29. Development of natural circulation analysis methods for a sodium cooled fast reactor

Author

Oyama, Kazuhiro, Endo, Junji, Doda, Norihiro, Ono, Ayako, Murakami, Takahiro, and Watanabe, Osamu

Abstract

A natural circulation evaluation methodology has been developed to insure safety of a sodium cooled fast reactor (SFR) of 1500 MWe adopting a natural circulation decay heat removal system (NC-DHRS). The methodology consists of a one-dimensional safety analysis which can be applied to safety evaluation for SFR licensing taking into account the temperature flattening effect due to buoyancy force in the core, and a three-dimensional fluid flow analysis which can evaluate thermal-hydraulics for local convection and thermal stratification in the primary system and DHRSs. The one-dimensional safety analysis method and the three-dimensional fluid flow analysis method have been validated using the test results of a water test apparatus and a sodium test loop for some typical transient events selected from the design basis events of the SFR. Finally, it has been confirmed that a good agreement between the test results and analysis results has been obtained, and reliability of each method has been demonstrated.

Published
2016
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30. Shot noise in a coherent electron beam.

Author

Kodama, Tetsuji, Osakabe, Nobuyuki, Endo, Junji, Tonomura, Akira, and Ohbayashi, Kohji

Subjects
ELECTRON beams, NOISE
Abstract

The counting statistics of beams of free electrons, released by field emission from a cold metal and propagating through a vacuum region, is studied. Since 1/f noise has been observed for field-emission current over the frequency 10[sup 2] to 10[sup 5] Hz, electron counts were taken with a sampling rate of 2.3×10[sup 6] samples/s. The probability distributions, which are distorted by the presence of a dead time, are compared with dead-time-corrected Poissonian and verified that the Poissonian describes the probability distributions by means of the χ[sup 2] test of the distributions. The present work shows that shot noise suppression due to correlated electron transmission induced by the Pauli exclusion principle could be detected using a field-emission electron beam. © 2000 American Institute of Physics. [ABSTRACT FROM AUTHOR]

Published
2000

39. Feasibility of observing two-electron interference

Author

Kodama, Tetsuji, primary, Osakabe, Nobuyuki, additional, Endo, Junji, additional, Tonomura, Akira, additional, Ohbayashi, Kohji, additional, Urakami, Tsuneyuki, additional, Ohsuka, Shinji, additional, Tsuchiya, Hiroshi, additional, Tsuchiya, Yutaka, additional, and Uchikawa, Yoshiki, additional

Published
1998
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46. Electron counting theory

Author

Saito, Seiji, primary, Endo, Junji, additional, Kodama, Tetsuji, additional, Tonomura, Akira, additional, Fukuhara, Akira, additional, and Ohbayashi, Kohji, additional

Published
1992
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