1. Use of non-contact voltmeter to quantify potential induced degradation in CdTe modules.
- Author
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Ahmad Raza, Hamza, Ibne Mahmood, Farrukh, and TamizhMani, Govindasamy
- Subjects
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VOLTMETERS , *PHOTOVOLTAIC power systems , *CADMIUM telluride , *BUILDING-integrated photovoltaic systems - Abstract
• Non-contact Electrostatic Voltmeter (ESV) application for the PV industry. • Identification of PID-affected PV module. • Identification of poor-performing PV module in grid-connected PV system. Potential induced degradation (PID) is a significant reliability issue for photovoltaic modules in the field. Conventionally, to detect the PID-affected modules, all the modules in a string are individually disconnected and measured using I-V (current–voltage) tracers. It is extremely time-consuming, expensive and unsafe (if the module connectors are field aged) approach. In our approach, we aim detecting the PID-affected modules quickly, inexpensively and safely without disconnecting individual modules in the string. In this study, contactless electrostatic voltmeter's (ESV) strength was explored to detect the PID-affected cadmium telluride (CdTe) modules in a string. These contactless measurements on high-voltage PV strings could make this technique unique and preferable to detect PID-affected modules in a string compared to the I-V curve method. In this work, a CdTe module was stressed for PID using the Aluminum (Al) foil method in a walk-in environmental chamber, which resulted in a reduction of module's peak current (I max), peak voltage (Vmax), and fill factor (FF), and hence power (Pmax). Outdoor light I-V, EL, and ESV measurements were performed pre- and post-PID to determine the effectiveness of the non-contact ESV technique. The ESV technique successfully detected the change in V max, and hence Pmax, compared to the pre-and post-PID conditions. A difference of less than 2% was observed in the results of the non-contact and non-interruptive method compared to the conventionally used interruptive voltmeter or I-V tracer method. This technique and the test results demonstrate a significant promise to identify poor-performing modules in PV string without disconnection of individual modules in the string. [ABSTRACT FROM AUTHOR]
- Published
- 2023
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