341 results on '"Electronic test equipment"'
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2. Complete multipactor suppression in an X-band dielectric-loaded accelerating structure
- Author
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Gai, W. [Argonne National Lab. (ANL), Argonne, IL (United States)]
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- 2016
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3. Fission Chambers Detector Unit Mockup Testing at Research Reactors.
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Alferov, V. P., Fedorov, V. A., Kudryavtsev, A. V., Martazov, E. S., Selyaev, N. A., Batyunin, A. V., Kashchuk, Yu A., and Vorobiev, V. A.
- Subjects
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ELECTRONIC amplifiers , *GAMMA rays , *FISSION counters , *NEUTRON counters , *NUCLEAR reactors - Abstract
This paper presents the results of the fission chambers (FC) behavior under intensive neutron and gamma radiation at the research reactors. The FC detector unit (DU) was designed for the International Experimental Thermonuclear Reactor neutron diagnostic “divertor neutron flux monitor.” Two mockups of the DU with FCs containing 1 g and 100 mg of 235U were tested. The test complex is based on the FC signal processing unit and the FC parameters’ monitoring system. The processing unit contains several measuring chains and acquire FC signal over a wide range of neutron flux variation. The FC parameters’ monitoring system records signal shapes, acquires pulse-height amplitude spectra, and checks electrical parameters of the neutron detector. The radiation tests were carried out at the research reactors IRT MEPhI and VVR-c. The structure and characteristics of the test complex as well measurement techniques and tools for FC characterization are discussed. The results of reactor experiments to determine characteristics of the DU mockup and wide-range neutron flux monitoring channels are presented. [ABSTRACT FROM AUTHOR]
- Published
- 2018
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4. OVERVIEW OF ELECTRONIC TEST EQUIPMENT FOR DEFROSTING AND HEATING OF CRYOPRESERVED BLOOD PRODUCTS
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V.I. Borisov, A.E. Zhdanov, L. Evdochim, L.G. Dorosinskiy, and K.E. Negodyaev
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Defrosting ,business.industry ,Electronic test equipment ,Environmental science ,Process engineering ,business - Published
- 2021
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5. Estimation of ice-liquid plasma phase transition using electronic test equipment
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Measure (data warehouse) ,Modern medicine ,Broadcast engineering ,business.industry ,Computer science ,media_common.quotation_subject ,Electronic test equipment ,Process (computing) ,Software ,Defrosting ,Quality (business) ,business ,Process engineering ,media_common - Abstract
One of the most dynamically developing areas of knowledge is modern medicine. In many ways, the pace of development of medicine is determined by technological capabilities. The blood service is one of the most technologically saturated branches of medicine since the quality of the final product and the patient’s health depend on the processing technology of the blood and its components. According to the technical regulations on the safety requirements of blood, its products, blood-substituting solutions and technical means used in transfusion-infusion therapy, approved by the Government of Russia on 01/26/2010: “The components of donated blood must be thawed and heated to the required temperature using specially designed equipment”. Defroster for cryopreserved blood products are specialized technical means used to measure electrical, magnetic and electromagnetic quantities characterizing the temperature parameters of the object to be thawed and heated. In the field of defrosting and heating cryopreserved blood products for transfusion-infusion, the fundamental task is to develop a software solution for simulating defrosting systems, which can make it possible to determine the optimal parameters of defrosting systems at the stage of pre-model modeling. This article describes an experimental study to evaluate the phase transition of an ice-liquid plasma during defrosting using radio measuring equipment. The obtained data will be used to create a mathematical model of the process of defrosting blood products. Zhdanov A. E., Dorosinskiy L. G., Borisov V. I., Negodyaev K. E., Evdochim L. Estimation of ice-liquid plasma phase transition using electronic test equipment. Ural Radio Engineering Journal. 2020;4(4):363–375. DOI: 10.15826/urej.2020.4.4.001.
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- 2020
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6. A Simple, Cheap and Precise Microcontroller Based DDS Function Generator
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Ali Rospawan, Joni Welman Simatupang, and Irwan Purnama
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Microcontroller ,Computer science ,business.industry ,Arduino ,Electronic test equipment ,Phase noise ,Electrical engineering ,Function generator ,Waveform ,Keypad ,Electronics ,business - Abstract
In electronics design and troubleshooting, the function generator is an important and versatile electronic test equipment. But the prices of finished function generator sold on market is expensive and not everyone can afford it. In order to create an economic and reliable function generator, microcontroller-based DDS function generator designed. AD9833 is DDS based programmable function generator from Analog Devices, which capable to producing sine, triangular and square wave output. To make an easy to use and flexible function generator, AD9833 connected with 4x4 matrix membrane keypad and LCD 1602. The microcontroller-based DDS function generator successfully created. The waveform generated by AD9833 offers not only exceptional accuracy and stability, but also low phase noise, an excellent frequency change and sudden waveform change ability, its useful in a wide variety of testing applications.
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- 2021
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7. VI-Based Measurement System Focusing on Space Applications
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L. E. Seixas, Saulo Finco, and S. P. Gimenez
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Engineering ,010308 nuclear & particles physics ,business.industry ,Test equipment ,System of measurement ,05 social sciences ,Electronic test equipment ,Local area network ,Semiconductor device ,Integrated circuit ,Ionizing irradiation ,01 natural sciences ,law.invention ,Automatic test equipment ,law ,Embedded system ,0502 economics and business ,0103 physical sciences ,Electrical and Electronic Engineering ,business ,050203 business & management - Abstract
This article describes in detail a custom, high-performance, compact, flexible and reconfigurable test equipment. This measurement system is able to perform, locally or remotely, the electrical characterization of semiconductor devices and integrated circuits (ICs) under ionizing irradiation tests. This measurement platform can be managed remotely through serial, Local Network Area (LAN) link, allowing the electrical characterization of these devices in harsh test environments. Using this customized test measurement system, we were capable to reduce total test time by 1/3 in our TID test application.
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- 2017
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8. Variability Extension To Sparks, A Domain Specific Scripting Language For Electronic Test Equipment
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Halit Oğuztüzün and Mahdi Saeedi Nikoo
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Domain-specific language ,Computer science ,business.industry ,Aspect-oriented programming ,Electronic test equipment ,A domain ,Extension (predicate logic) ,computer.software_genre ,Automation ,Scripting language ,Preprocessor ,Software engineering ,business ,computer - Abstract
Initial version of SparkS, a domain specific scripting language for calibration automation of electronic test equipment, was designed as a single-task language. As we decided to make the language more powerful over time to make it support variations in equipment models, it also became clear that we need to give language a support for variability. In this work we present our approach for handling variability in SparkS. We also show our design and development of the methodology.
- Published
- 2019
9. Design and Implementation of a Portable TT&C Test Equipment for Small Satellite
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X. Chen, L.J. Cao, and H. Zeng
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Engineering ,business.industry ,Test equipment ,Electronic test equipment ,General Medicine ,Modular design ,Test (assessment) ,Automatic test equipment ,Upgrade ,Embedded system ,Scalability ,Satellite ,business ,Computer hardware - Abstract
This paper describes the design and implementation of the portable TT&C test equipment for small satellite. Now small satellites propose the idea of a quick test. For meeting requirement of the quick test, portable TT&C test equipment is proposed. The equipment takes full advantage of the current modular design technology, test bus technology, virtual instrument technology etc. It overcomes the disadvantage of traditional test equipment integrated difficulty, which is caused by traditional discrete and variety devices. The equipment has the advantages of scalable, flexible upgrade, compact, portable. After the experimental validation applied in the satellite test, it achieved good results. So it is important for test technological development of small satellite.
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- 2015
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10. High speed test interface module using MEMS technology
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Nabeeh Kandalaft, Rashid Rashizadeh, and Ali Attaran
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Microelectromechanical systems ,Engineering ,business.industry ,Electronic test equipment ,Electrical engineering ,Hardware_PERFORMANCEANDRELIABILITY ,Integrated circuit ,Condensed Matter Physics ,Atomic and Molecular Physics, and Optics ,Die (integrated circuit) ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,law.invention ,Automatic test equipment ,law ,Distortion ,Hardware_INTEGRATEDCIRCUITS ,Electronic engineering ,Device under test ,Signal integrity ,Electrical and Electronic Engineering ,Safety, Risk, Reliability and Quality ,business - Abstract
At frequencies above a few gigahertz, testing integrated circuits becomes a challenging task. Test signal integrity degradation due to parasitic effects of interconnects and electromagnetic coupling undermine the test results and increase the yield loss of integrated circuits at high speeds. A new test interface module based on MEMS technology is proposed in this paper. High-speed micro test-channels are designed to establish connectivity between the device under test and the tester at the die level. Experimental results indicate that the proposed architecture can be used to test integrated circuits up to 50 GHz without much loss or distortion.
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- 2015
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11. Digital Test Equipment and Measurement Systems
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Jerry C. Whitaker
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Automatic test equipment ,Computer science ,Test equipment ,System of measurement ,Electronic test equipment ,Automotive engineering - Published
- 2017
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12. A heuristic algorithm to generate test program sequences for moving probe electronic test equipment
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Bertha M. Arteta
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Computer engineering ,Computer science ,Test program ,Electronic test equipment ,Simulation - Published
- 2017
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13. Realizing variations in performance and scalability via technology integration and new development
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Larry V. Kirkland
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Flexibility (engineering) ,Computer science ,business.industry ,Electronic test equipment ,people.profession ,Test engineer ,Reliability engineering ,Automatic test equipment ,Embedded system ,Scalability ,Device under test ,Test Management Approach ,Open architecture ,business ,people - Abstract
It is important to allow the test engineer great flexibility when developing a test program. Highly skilled test engineers desire flexibility and different hardware platforms to test a Unit Under Test (UUT). In the past, the engineer was told to use specific test equipment and not provided with the option to program an instrument to their specific test and diagnostic plans. Being stuck in a rut on our test technology has always been an area of concern. There are many ways to approach a test and sometimes circumstances dictate unique approaches to solve specific problems such as No-Fault-Found or diagnostic weaknesses. High Performance characteristics are Scalable, Full Dynamic Performance Configurable and have a common core Software Suite. PXI systems are flexible and you can add capability. PXI has become a dominant industry standard for measurement and automation applications. PXI is established with High Performance like High Data Transfer Rates, Small Rugged Industrial Footprint, and an Open Standard with Multiple Vendors. PXI has Innovative Technologies including Boundary Scan/JTAG, FPGA and high I/O Dynamic Digital. PXI based Automatic Test Equipment (ATE) is quickly becoming very practical. Inserting non-ATLAS applications into an ATLAS test program can be commonplace. Developing a digital test utilizing a PXI FPGA is a practical approach to utilizing technology. The FPGA can be programmed on a step by step approach. Each step can be independent or dependent. Interactive diagnostics is achievable by utilizing ATLAS in conjunction with specific applications. Pattern failures can be passed to the diagnostic routine for processing and patterns failures can be tested for a certain state during probing. FPGA modules can adapt their functionality on the fly. Systems can partially reconfigure an FPGA while the module is running to change its behavior in response to incoming signals this includes altering test vectors to more extensively test functions that appear marginal. New techniques needed include test hardware performance (although this continues to evolve with great improvements), software test techniques, and the long term support. Long term support is being addressed with the advent of true open systems which highlight improvement in flexibility and scalability. The practical application for this approach is downsizing test equipment, using state-of-the-art technology and improving test time. Test Program Set (TPS) development is constantly under scrutiny and process improvement. The type of scrutiny taking place is the inclusion of new hardware and software techniques to improve NFF rates, diagnostics and test time. We need to improve the TPS development time and the quality of our TPSs. Also, utilizing multiple languages proves the open architecture is valid and practical. This paper discusses the development, integration and characteristics of state-of-the-art systems. Discussed is the wide range of flexibility or scalability, utilizing integration of devices and techniques, latest technology use, expanding your capability, true open system concepts, scalable system applications and how to start out small and grow to a greater test capability.
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- 2017
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14. Intra-operative label-free multimodal multiphoton imaging of breast cancer margins and microenvironment (Conference Presentation)
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Darold R. Spillman, Yi Sun, Marina Marjanovic, Eric J. Chaney, Haohua Tu, Partha S. Ray, Stephen A. Boppart, Sixian You, George Liu, and Anna M. Higham
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Tumor microenvironment ,medicine.medical_specialty ,Materials science ,Microscope ,Breast imaging ,Electronic test equipment ,Cancer ,medicine.disease ,Laser ,law.invention ,Breast cancer ,law ,medicine ,Medical physics ,Label free ,Biomedical engineering - Abstract
Label-free multi-photon imaging has been a powerful tool for studying tissue microstructures and biochemical distributions, particularly for investigating tumors and their microenvironments. However, it remains challenging for traditional bench-top multi-photon microscope systems to conduct ex vivo tumor tissue imaging in the operating room due to their bulky setups and laser sources. In this study, we designed, built, and clinically demonstrated a portable multi-modal nonlinear label-free microscope system that combined four modalities, including two- and three- photon fluorescence for studying the distributions of FAD and NADH, and second and third harmonic generation, respectively, for collagen fiber structures and the distribution of micro-vesicles found in tumors and the microenvironment. Optical realignments and switching between modalities were motorized for more rapid and efficient imaging and for a light-tight enclosure, reducing ambient light noise to only 5% within the brightly lit operating room. Using up to 20 mW of laser power after a 20x objective, this system can acquire multi-modal sets of images over 600 μm × 600 μm at an acquisition rate of 60 seconds using galvo-mirror scanning. This portable microscope system was demonstrated in the operating room for imaging fresh, resected, unstained breast tissue specimens, and for assessing tumor margins and the tumor microenvironment. This real-time label-free nonlinear imaging system has the potential to uniquely characterize breast cancer margins and the microenvironment of tumors to intraoperatively identify structural, functional, and molecular changes that could indicate the aggressiveness of the tumor.
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- 2017
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15. Optical coherence tomography (OCT) guided smart laser knife for cancer surgery (Conference Presentation)
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Thomas E. Milner, Austin McElroy, Arnold D. Estrada, and Nitesh Katta
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Materials science ,medicine.diagnostic_test ,business.industry ,Electronic test equipment ,Pulse duration ,chemistry.chemical_element ,Nanosecond ,Laser ,law.invention ,Optics ,Thulium ,Optical coherence tomography ,chemistry ,law ,Fiber laser ,medicine ,Laser beam quality ,business - Abstract
Neurological cancer surgeries require specialized tools that enhance imaging for precise cutting and removal of tissue without damaging adjacent neurological structures. The novel combination of high-resolution fast optical coherence tomography (OCT) alongside short pulsed nanosecond thulium (Tm) lasers offers stark advantages utilizing the superior beam quality, high volumetric tissue removal rates of thulium lasers with minimal residual thermal footprint in the tissue and avoiding damage to delicate sub-surface structures (e.g., nerves and microvessels); which has not been showcased before. A bench-top system is constructed, using a 15W 1940nm nanosecond pulsed Tm fiber laser (500uJ pulse energy, 100ns pulse duration, 30kHz repetition rate) for removing tissue and a swept source laser (1310±70nm, 100kHz sweep rate) is utilized for OCT imaging, forming a combined Tm/OCT system – a smart laser knife. The OCT image-guidance informs the Tm laser for cutting/removal of targeted tissue structures. Tissue phantoms were constructed to demonstrate surgical incision with blood vessel avoidance on the surface where 2mm wide 600um deep cuts are executed around the vessel using OCT to guide the procedure. Cutting up to delicate subsurface blood vessels (2mm deep) is demonstrated while avoiding damage to their walls. A tissue removal rate of 5mm^3/sec is obtained from the bench-top system. We constructed a blow-off model to characterize Tm cut depths taking into account the absorption coefficients and beam delivery systems to compute Arrhenius damage integrals. The model is used to compare predicted tissue removal rate and residual thermal injury with experimental values in response to Tm laser-tissue modification.
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- 2017
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16. Birefringence phantoms for polarization sensitive optical coherence tomography (Conference Presentation)
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Linbo Liu, Kathy Beaudette, Martin Villiger, Xinyu Liu, and Brett E. Bouma
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Photoelasticity ,Birefringence ,Polarization sensitive ,Materials science ,Optics ,Optical coherence tomography ,medicine.diagnostic_test ,business.industry ,Electronic test equipment ,medicine ,Polarization (waves) ,business - Published
- 2017
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17. Image-guided smart laser system for precision implantation of cells in cartilage
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Michael R. Gardner, Janet Zoldan, John Rector, Thomas E. Milner, Nitesh Katta, Kevin C. Choy, Cody O. Crosby, and Austin McElroy
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030203 arthritis & rheumatology ,Materials science ,medicine.diagnostic_test ,business.industry ,Electronic test equipment ,Pulse duration ,02 engineering and technology ,Nanosecond ,021001 nanoscience & nanotechnology ,Laser ,law.invention ,03 medical and health sciences ,0302 clinical medicine ,Optics ,Optical coherence tomography ,law ,Fiber laser ,Articular cartilage repair ,medicine ,sense organs ,Laser beam quality ,0210 nano-technology ,business ,Biomedical engineering - Abstract
State-of-the-art treatment for joint diseases like osteoarthritis focus on articular cartilage repair/regeneration by stem cell implantation therapy. However, the technique is limited by a lack of precision in the physician’s imaging and cell deposition toolkit. We describe a novel combination of high-resolution, rapid scan-rate optical coherence tomography (OCT) alongside a short-pulsed nanosecond thulium (Tm) laser for precise cell seeding in cartilage. The superior beam quality of thulium lasers and wavelength of operation 1940 nm offers high volumetric tissue removal rates and minimizes the residual thermal footprint. OCT imaging enables targeted micro-well placement, precise cell deposition, and feature contrast. A bench-top system is constructed using a 15 W, 1940 nm, nanosecond-pulsed Tm fiber laser (500 μJ pulse energy, 100 ns pulse duration, 30kHz repetition rate) for removing tissue, and a swept source laser (1310 ± 70 nm, 100 kHz sweep rate) for OCT imaging, forming a combined Tm/OCT system – a “smart laser knife”. OCT assists the smart laser knife user in characterizing cartilage to inform micro-well placement. The Tm laser creates micro-wells (2.35 mm diameter length, 1.5 mm width, 300 μm deep) and micro-incisions (1 mm wide, 200 μm deep) while OCT image-guidance assists and demonstrates this precision cutting and cell deposition with real-time feedback. To test micro-well creation and cell deposition protocol, gelatin phantoms are constructed mimicking cartilage optical properties and physiological structure. Cell viability is then assessed to illustrate the efficacy of the hydrogel deposition. Automated OCT feedback is demonstrated for cutting procedures to avoid important surface/subsurface structures. This bench-top smart laser knife system described here offers a new image-guided approach to precise stem cell seeding that can enhance the efficacy of articular cartilage repair.
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- 2017
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18. Compact system with handheld microfabricated optoelectronic probe for needle-based tissue sensing applications
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James M. Scheiman, Mary Ann Mycek, Julia M. Pakela, Seung Yup Lee, Kyounghwan Na, and Euisik Yoon
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Materials science ,Optical fiber ,business.industry ,Electronic test equipment ,Detector ,01 natural sciences ,Photodiode ,law.invention ,010309 optics ,03 medical and health sciences ,0302 clinical medicine ,law ,030220 oncology & carcinogenesis ,0103 physical sciences ,Optoelectronics ,business ,Mobile device ,Microfabrication ,Light-emitting diode ,Diode - Abstract
We present the design, development, and bench-top verification of an innovative compact clinical system including a miniaturized handheld optoelectronic sensor. The integrated sensor was microfabricated with die-level light-emitting diodes and photodiodes and fits into a 19G hollow needle (internal diameter: 0.75 mm) for optical sensing applications in solid tissues. Bench-top studies on tissue-simulating phantoms have verified system performance relative to a fiberoptic based tissue spectroscopy system. With dramatically reduced system size and cost, the technology affords spatially configurable designs for optoelectronic light sources and detectors, thereby enabling customized sensing configurations that would be impossible to achieve with needle-based fiber-optic probes.
- Published
- 2017
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19. A Network Based Test Interface Allowing Access Of Hardware Developers To Test Equipment
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Safak Bilgi Akdemir and Engin Ozturk
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Ethernet ,SIMPLE (military communications protocol) ,Computer science ,business.industry ,Transmission Control Protocol ,Interface (computing) ,Electronic test equipment ,ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS ,Local area network ,computer.software_genre ,Automation ,Server ,Embedded system ,Operating system ,business ,computer - Abstract
In this paper, a customized software tool to manage remote access to test equipment is presented. The software tool is developed using LabWindows/CVI and runs on Ethernet over TCP protocol. Ethernet is used as the media for communication and control since a local-area-network (LAN) infrastructure is mostly available in a facility; and almost all commercial-off-the-shelf (COTS) equipment manufacturers offer device control over LAN. The tool has a simple command structure, so users are not required to have any programming knowledge or spend extra programming effort for test automation. Developers' needs for remote access to test equipment, sending dynamical commands to and receiving measurement data from test equipment are also discussed in this paper. Ways to share test equipment resources dynamically between different setups using TCP protocol is discussed and a sample application is presented. As conclusion, effects of utilizing such tools in development over project efficiency and coordination between teams are summarized.
- Published
- 2017
20. Test strategies for industrial testers for converter controls equipment
- Author
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V. Kasampalis, D. Nisbet, M Di Cosmo, Benjamin Todd, Patryk Wojciech Oleniuk, and Slawosz Uznanski
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Test strategy ,Boundary scan ,Test design ,010308 nuclear & particles physics ,business.industry ,Computer science ,Electronic test equipment ,Code coverage ,Electrical engineering ,Converters ,01 natural sciences ,030218 nuclear medicine & medical imaging ,Reliability engineering ,03 medical and health sciences ,0302 clinical medicine ,0103 physical sciences ,Device under test ,Electronics ,Detectors and Experimental Techniques ,business ,Instrumentation ,Mathematical Physics - Abstract
Power converters and their controls electronics are key elements for the operation of the CERN accelerator complex, having a direct impact on its availability. To prevent early-life failures and provide means to verify electronics, a set of industrial testers is used throughout the converters controls electronics' life cycle. The roles of the testers are to validate mass production during the manufacturing phase and to provide means to diagnose and repair failed modules that are brought back from operation. In the converter controls electronics section of the power converters group in the technology department of CERN (TE/EPC/CCE), two main test platforms have been adopted: a PXI platform for mixed analogue-digital functional tests and a JTAG Boundary-Scan platform for digital interconnection and functional tests. Depending on the functionality of the device under test, the appropriate test platforms are chosen. This paper is a follow-up to results presented at the TWEPP 2015 conference, adding the boundary scan test platform and the first results from exploitation of the test system. This paper reports on the test software, hardware design and test strategy applied for a number of devices that has resulted in maximizing test coverage and minimizing test design effort.
- Published
- 2017
21. Reliability Design and Test of the Vehicle Electronic Equipment
- Author
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Long Bo Qu, Xun Yi Dang, Zhan Yu Zhan, Xiao Yu Yang, and Sheng Rui Yuan
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Engineering ,business.industry ,Electronic test equipment ,General Engineering ,Electronics ,Reliability design ,business ,Reliability (statistics) ,Electronic equipment ,Test (assessment) ,Reliability engineering - Abstract
If there is no reliability, high-performance electronic devices indicator is no meaning. Reliability design, testing and verification methods of the vehicle electronic equipment are analyzed in this paper, and presented in the industry designed to improve the reliability of electronic equipment ideas, to regulate the reliability of electronic equipment designed to provide a technical basis.
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- 2014
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22. Research on the Data Management of Electric Vehicle Charging Equipment Testing Platform
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Li Na Wang, He Chuan Zhang, and Xiang Wu Yan
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Engineering ,business.product_category ,Switched-mode power supply ,business.industry ,Data management ,Electronic test equipment ,General Engineering ,Functional requirement ,Database design ,Automotive engineering ,Automatic test equipment ,Embedded system ,Electric vehicle ,business ,Test data - Abstract
Compared with common switching power supply, EV charger has more functional requirements, more severe demands on electrical performance, and wider range of output voltage and current value, what will make the test more complex. Variety of conditions will be set to test the electrical performance of the charger completely, and a large amount of test data will be generated. This article describes the data management platform of EV charging equipment test, which uses real-time database to manage the data. It also detailed introduce data collection and storage, data analysis and report generation and database design of the test platform. The test results show that this system can manage the test data safely, quickly and reliably, providing a convenient and fast way to achieve rapid automated charger test.
- Published
- 2014
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23. Research on Design of Virtual Maintenance Training System for Electronic Equipment
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Xin Zhang, Jian Zhou Mao, and Yan Hui Wang
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Engineering ,business.industry ,Order (business) ,Electronic test equipment ,Virtual maintenance ,Training system ,Systems engineering ,General Medicine ,Paper based ,Virtual reality ,business ,Electronic equipment ,Predictive maintenance - Abstract
In order to better solving the problem of electronic equipment maintenance training, promoting the level of management and usage to electronic equipment. The design method of virtual maintenance training system for electronic equipment is discussed in this paper based on virtual reality technology. Simulation results show that the system can well implement virtual maintenance training for the electronic equipment, and has certain reference value to develop other relevant system.
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- 2014
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24. The Test Equipment Based on Single Chip Micro (SCM) of Volt-Ampere Characteristic of CT
- Author
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Bai Fen Liu and Ying Gao
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Very-large-scale integration ,Engineering ,business.industry ,Electronic test equipment ,Electrical engineering ,Volt-ampere ,ComputerApplications_COMPUTERSINOTHERSYSTEMS ,General Medicine ,law.invention ,Sine wave ,law ,Electronic engineering ,Electronics ,business ,Transformer ,Pulse-width modulation ,Voltage - Abstract
Nowadays, various test equipment tend to be more intelligent, the test equipment of the volt-ampere characteristic of CT is so too. As the development of the electronics, VLSI(SCM) is manufactured. The purpose of our project is to scheme out a intelligent test system by the computer technique and the test technique. This equipment is mostly made of the SCM system and the peripheral equipment. We control the output of the digital transformer by SCM. The output voltage can make the TL494 create PWM wave. The wave is the control signal of the main circuit. The output wave of the main circuit is the sine wave, and the value of the output can be amended automatically. Compared with the traditional equipment, this equipment is smaller and use less energy, but its function is more powerful. It can be programmable. We can take it more expediently. So, this kind of equipment can be used widely in the future.
- Published
- 2014
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25. The Development of a Equipment Repair and Identification Management System
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Hong Zhuan Cai, Jun Wen, and Li Jun Qiu
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Information management ,Management information systems ,Identification (information) ,Design management ,Engineering ,Scientific management ,business.industry ,Management system ,Electronic test equipment ,Systems engineering ,Serial port ,General Medicine ,business - Abstract
This paper designs a meet the requirements of equipment repair information management system, to realize the scientific management of instruments and equipments. Based on RFID technology, database technology, information processing and transmission technology, we aimed to systemize the management over the equipment. The test showed that, the designed system meets the requirements, design management process equipment is stable and reliable, through the serial port and the read and write tag subroutine to achieve a good exchange of electronic tags and database information, and has the advantages of simple operation, convenient use, safety and protection measures of powerful and perfect. This system can greatly improve the working efficiency of the instrument and equipment management, equipment information management more accurate, standard and perfect, to meet the need of dynamic management of equipment effectively.
- Published
- 2014
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26. The Test System of PXI-Based Aeronautic Equipment
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Ji Xiang Tang and Zhi Gang Zhu
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Engineering ,business.industry ,Interface (computing) ,Electronic test equipment ,Reactance ,Testing equipment ,General Medicine ,Test (assessment) ,Automatic test equipment ,Identification (information) ,Embedded system ,Test requirements ,business ,Computer hardware - Abstract
By analyzing the interface characteristics and test requirements of certain aeronautic equipment, using PXI instrument as test platform, integrated using SPIB instrument, virtual instrument, simulation technologies, independent developed video output collection equipment, SRU testing equipment modules and other hardware device, developed integrated automatic test equipment which based on PXI and GPIB bus instrument technology, provide airborne work environment for weapons, instrument, electrical, communication, navigation, identification, reactance systems airborne LRU, automatic complete the control, incentive, performance and function test of LRU.
- Published
- 2014
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27. The Design Proposal Aerospace Electronic Test Equipment Based on Multi-Interface Data Communication
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Jin Ling Wang, Wen Sheng Qiao, and Yan Jun Zhang
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Ethernet ,Engineering ,business.industry ,Controller (computing) ,Interface (computing) ,Reliability (computer networking) ,Embedded system ,Electronic test equipment ,General Medicine ,Field-programmable gate array ,business ,Aerospace ,Chip - Abstract
In the background of requirement which apply in aerospace remote measurement electronic equipment, a new requirement for the universal degree to the remote measurement system is proposed. This paper design communicating solutions of the multi-interface device, hardware circuit,FPGA as the core logic controller, coordinating RS-422 interface chip, Ethernet controller W5300,USB-FIFO,FT245 interface chip and other functional modules. The communication equipment has a variety of interfaces; achieve the reliability of transmission of high data rate. This has been applied for engineering practice and improves the efficiency of the design of the remote measurement equipment and maintenance.
- Published
- 2013
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28. Test methods for RF-based electronic safety equipment: Part 2 — Development of laboratory-based tests
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William F. Young and Kate A. Remley
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Engineering ,Computer Networks and Communications ,business.industry ,Electronic test equipment ,System safety ,Replicate ,Electromagnetic interference ,Field (computer science) ,Reliability engineering ,Test (assessment) ,Signal Processing ,Electronic engineering ,Wireless ,NIST ,Electrical and Electronic Engineering ,business ,Instrumentation ,Software - Abstract
We describe the development of free-field test methods for wireless electronic safety equipment that replicate field-test conditions in a laboratory environment. The test methods can be used to verify the performance of wireless devices, such as those used by emergency responders, in the presence of known attenuation and under RF interference conditions. The test methods presented here were developed to support the National Fire Protection Association (NFPA) in the revision of NFPA 1982: Standard on Personal Alert Safety Systems (PASS), but would be applicable to other types of RF-based equipment as well. In Part 1, we illustrated methods for extracting performance metrics from a series of field tests conducted by NIST researchers. In Part 2, we replicate the key field test conditions in the laboratory and verify device performance under those conditions.
- Published
- 2013
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29. An automatic test equipment for integrated circuits in the extreme environments
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Xiaohai Hu, Zhen Li, Zong Jie Xiang, and Lanlai Wang
- Subjects
Engineering ,business.industry ,Electric shock ,Environmental tests ,Electronic test equipment ,Hardware_PERFORMANCEANDRELIABILITY ,Integrated circuit ,Temperature cycling ,medicine.disease ,Automotive engineering ,law.invention ,Shock (mechanics) ,Vibration ,Automatic test equipment ,law ,Hardware_INTEGRATEDCIRCUITS ,Electronic engineering ,medicine ,business - Abstract
This paper describes an automatic test equipment for integrated circuits. Most traditional automatic test equipments focus on integrated circuits tests in conventional environments. They usually can not test integrated circuits in the extreme environments, such as thermal cycling, thermal vacuum, vibration and shock. Some can accomplish the tests in only one kind of extreme environment. We invent an automatic test equipment that can test integrated circuits in various extreme environments, such as thermal cycling, thermal vacuum, vibration and shock. We use this equipment to evaluate the feasibility of using the tested integrated circuits in space navigation. The actual use of this ATE demonstrates its obvious advantage in environmental tests.
- Published
- 2016
- Full Text
- View/download PDF
30. Test methods for FPGA switching characteristics on GPETE test platform
- Author
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Yuanpei Gao, Shi Chao, Jian Wang, Jinmei Lai, Bang Zhang, and Xinyu Ma
- Subjects
010302 applied physics ,Engineering ,business.industry ,020208 electrical & electronic engineering ,Electronic test equipment ,Test compression ,02 engineering and technology ,Digital clock manager ,Automatic test pattern generation ,Chip ,01 natural sciences ,Automatic test equipment ,0103 physical sciences ,0202 electrical engineering, electronic engineering, information engineering ,Device under test ,business ,Digital signal processing ,Computer hardware - Abstract
Testing FPGA switching characteristics on general purpose electronic test equipment(GPETE) test platform has much lower financial cost and more accessibility than testing on Automatic Test Equipment(ATE). However, when testing on GPETE platform, test accuracy is more easily influenced by device under test(DUT) board and test equipment, and some kinds of stimuli such as maximum frequency stimulus is difficult to impose. This paper presents several test methods aiming to ensure the test accuracy and solve maximum frequency stimulus imposing problem of GPETE test platform. Our methods are: 1) Time-to-Digital Converter(TDC) method to reduce test equipment's impact on test accuracy; 2) Comparing technique to eliminate delay interference from DUT board and extra delay path inside the chip; and 3) Digital Clock Manager(DCM) method to solve maximum stimulus imposing problem. Test results of XC4VLX200 FPGA shows that our methods have a relatively good accuracy and the stimulus imposing problem has been solved to some extent.
- Published
- 2016
- Full Text
- View/download PDF
31. The research on the integrated test system for the secondary devices and system in smart substation
- Author
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Hui Ren, Chen Fan, Guoqing Zhao, and Hao Yuan
- Subjects
Engineering ,business.industry ,020209 energy ,Electronic test equipment ,02 engineering and technology ,Automatic test pattern generation ,Test harness ,Test (assessment) ,Reliability engineering ,Automatic test equipment ,System under test ,0202 electrical engineering, electronic engineering, information engineering ,Virtual device ,Test Management Approach ,business - Abstract
The secondary devices and system should be tested to verify the functions configuration before the substation is put into operation. Most of time, the test system is divided into several parts and carried out one by one. At the same time, the existing experimental and testing methods have shortcomings in aspect of test means and test efficiency and can not fully meet the new test requirements of smart substation. In order to solve these problems, the integrated test system is presented and discussed in detailed. Firstly, according to the test demand, the reasonable framework and test procedure is built up. The test host can connect the test equipment physically and interact with them. Secondly, three key technologies about the system are discussed, which are the improvement technology of existing testers, virtual equipment technology, the automatic test technology based on the script language. Thirdly, the application of this system in the new generation smart substation is demonstrated. It is convenient to realize the system level test about whole substation. It can improve the test efficiency, and provide guidance or reference for future testing and debugging.
- Published
- 2016
- Full Text
- View/download PDF
32. Analog integrated circuits parameters online test system for accelerated test
- Author
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Cheng Gao, Jiaoying Huang, Xubo Lv, and Can Cui
- Subjects
Engineering ,021103 operations research ,business.industry ,Electronic test equipment ,0211 other engineering and technologies ,02 engineering and technology ,Integrated circuit ,Automatic test pattern generation ,021001 nanoscience & nanotechnology ,law.invention ,Automatic test equipment ,Reliability (semiconductor) ,law ,visual_art ,Electronic component ,Operational amplifier ,visual_art.visual_art_medium ,0210 nano-technology ,business ,Highly accelerated life test ,Simulation - Abstract
The integrated operational amplifiers are widely used in the analog integrated circuits. The reliability of the devices, especially in changing temperature condition, affects the reliability of automation equipment. Accelerated test is a main method to assess electronic components' life. At present, there are some problems in parameters test systems. e.g., multiple devices can't be tested at the same time by the system. The devices are timing taken out of constant temperature drying to measure parameters, but the behavior by human often affects the test results. In high temperature conditions, it is impossible for the system to test devices online and analyze the test results. All above, an online test system of integrated operational amplifier, which is for accelerated test, was designed. Firstly, the design principle of the system was introduced. Secondly, the key modules and their roles in the system were described. In the end, the designed system was applied to assess the life for the integrated operational amplifier. It indicated that the system is able to test parameters for accelerated test. The number of the operational amplifiers can be changed. The test conditions are ambient temperature and accelerated test and so on.
- Published
- 2016
- Full Text
- View/download PDF
33. A case study: Dividing tests of interdependent units into independent test systems
- Author
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Volkan Ozdemir
- Subjects
Weapon system ,Engineering ,Test case ,Software ,Test design ,System under test ,business.industry ,Embedded system ,Electronic test equipment ,Process (computing) ,business ,Test (assessment) ,Reliability engineering - Abstract
There are many units in weapon systems; that communicate with each other and supply necessary signals to related units. The complicated hardware and software interfaces of these systems make designing tests for production more challenging. In order to test a unit individually, without the other units existing in the test system, some serious test design work must be done for simulating the functions of other units. To design a well-balanced test application, commercially available test equipment must be used, since maintenance of the test system gets harder if unique test boards are designed instead of using general test equipment. In this paper, a case study which has two main units and three electronic boards is explained. These Units Under Test (UUT)are highly dependent on each other and unique output of one unit is the unique input of other units. Some signals even cannot be produced if the designated input is not wired to the UUT. These units and electronic cards communicate with each other using RS422 and Can-Open during the operation continuously. The communication rules are so strict that even only one random message is missing than the communication of the system fails. To design a test system that simulates functions of these units and communicates with UUT's at the same time by serial channel and CAN-Open, some serious time is needed. However, if the test designer has a limited time, then the process of designing must be flawless and systematic. With years of experience in the test design area, ASELSAN has excelled its own test development process in order to work under pressure and limited time. Dividing the test design process into different parts and building a closed loop control system around it lower the necessary time to develop tests dramatically. Throughout this paper, ASELSAN's way of designing a test system is clearly explained with a challenging weapon system.
- Published
- 2016
- Full Text
- View/download PDF
34. Simultaneous multi-scale microscopy as a potential dedicated tool for intra-operative parathyroid identification during thyroid surgery (Conference Presentation)
- Author
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Wendy-Julie Madore, Caroline Boudoux, Anastasios Maniakas, Tareck Ayad, Mathias Strupler, Etienne De Montigny, and Nadir Goulamhoussen
- Subjects
medicine.medical_specialty ,medicine.diagnostic_test ,business.industry ,medicine.medical_treatment ,Electronic test equipment ,Thyroidectomy ,Laser ,law.invention ,Surgery ,Lens (optics) ,medicine.anatomical_structure ,Optical coherence tomography ,law ,Confocal microscopy ,Microscopy ,medicine ,Parathyroid gland ,business - Abstract
While thyroidectomy is considered a safe surgery, dedicated tools facilitating tissue identification during surgery could improve its outcome. The most common complication following surgery is hypocalcaemia, which results from iatrogenic removal or damage to parathyroid glands. This research project aims at developing and validating an instrument based on optical microscopy modalities to identify tissues in real time during surgery. Our approach is based on a combination of reflectance confocal microscopy (RCM) and optical coherence tomography (OCT) to obtain multi-scale morphological contrast images. The orthogonal field of views provide information to navigate through the sample. To allow simultaneous, synchronized video-rate imaging in both modalities, we designed and built a dual-band wavelength-swept laser which scans a 30 nm band centered at 780 nm and a 90 nm band centered at 1310 nm. We built an imaging setup integrating a custom-made objective lens and a double-clad fibre coupler optimized for confocal microscopy. It features high resolutions in RCM (2µm lateral and 20 µm axial) in a 500 µm x 500 µm field-of-view and a larger field-of-view of 2 mm (lateral) x 5 mm (axial) with 20 µm lateral and axial resolutions in OCT. Imaging of ex vivo animal samples is demonstrated on a bench-top system. Tissues that are visually difficult to distinguish from each other intra-operatively such as parathyroid gland, lymph nodes and adipose tissue are imaged to show the potential of this approach in differentiating neck tissues. We will also provide an update on our ongoing clinical pilot study on patients undergoing thyroidectomy.
- Published
- 2016
- Full Text
- View/download PDF
35. Quantitative imaging of the microbubble concentrations by using an in-line phase contrast tomosynthesis prototype: a preliminary phantom study
- Author
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Yuhua Li, Bin Zheng, Wei R. Chen, Kai Yang, Muhammad U. Ghani, Molly D. Wong, Di Wu, and Hong Liu
- Subjects
Photon ,Materials science ,Electronic test equipment ,Photon energy ,Radiation ,01 natural sciences ,Tomosynthesis ,Imaging phantom ,030218 nuclear medicine & medical imaging ,010309 optics ,03 medical and health sciences ,0302 clinical medicine ,0103 physical sciences ,Microbubbles ,Beam (structure) ,Biomedical engineering - Abstract
The purpose of this study is to demonstrate the feasibility of using a high-energy in-line phase contrast tomosynthesis system to quantitatively imaging microbubbles in a tissue simulating phantom under a limited radiation dose. The imaging system used in the investigation was a bench top in-line phase contrast tomosynthesis prototype operated under 120 kVp tube voltage and 0.5 mA tube current. A prime beam filter made of 2.3 mm Cu, 0.8 mm Pb and 1.0 mm Al was employed to obtain as large as possible portion of x-ray photon energy higher than 60 keV. The tissue simulating phantom was built by three acrylic slabs and a wax slab to mimic a 40 mm thick compressed breast. There were two tiny-sized structures with average 1 mm depth engraved on the two different layers. The microbubble suspensions with different concentrations were injected into those tiny structures. The inline phase contrast angular projections acquired were used to reconstruct the in-plane slices of the tiny structures on different layers. The CNRs vs microbubble concentrations were investigated. As the result, the microbubble suspensions were clearly visible, showing higher CNR when compared with the areas with no microbubble. Furthermore, a monotonously increasing relation between CNRs and microbubble concentrations was observed after calculating the area CNR of the phase contrast tomosynthesis slices.
- Published
- 2016
- Full Text
- View/download PDF
36. Analysis of Airplane Timing Equipment’s Automatic Test Based on ATS Platform
- Author
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Jian Fei Si, Shi Yong Hao, Xiang Xin Zhan, Chun Feng Yu, and Yuan Feng Zhang
- Subjects
Working hours ,Automatic test equipment ,Engineering ,business.product_category ,business.industry ,Electronic test equipment ,General Engineering ,ComputerApplications_COMPUTERSINOTHERSYSTEMS ,business ,Simulation ,Electromagnetic interference ,Test (assessment) ,Airplane - Abstract
Test airplane timing equipment automatically is usually difficult because of great working current and strong electromagnetic interference . This article analyzed automatic test on airplane timing equipment based on ATS platform that uses digital I/O module and VXI bus, which can reduce the impact of the device operating current on the system. Moreover, the method can execute parallel test on several working hours at a time.
- Published
- 2012
- Full Text
- View/download PDF
37. Design of Test System for one Type of Airborne Photoelectric Equipment Based on PC104 Bus
- Author
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Hui Lin Fan, Xian Yong Jing, and Man Yi Hou
- Subjects
Engineering ,business.industry ,Serial communication ,Electronic test equipment ,General Medicine ,Automatic test pattern generation ,Automatic test equipment ,Software ,Control system ,Multithreading ,business ,Signal conditioning ,Computer hardware ,Simulation - Abstract
A certain type of airborne photoelectric equipment is the key device for aiming and distance measuring. On the basis of analyzing the test requirement of the equipment, a test system is designed with PC104 embedded computer as the core control system. The function of the test system is suggested. Hardware programs of power, bus board, signal conditioning circuit and anti-jamming measure are designed. The multithreading technology and measures to prevent wrong data communicating are applied to develop software of the test system. The test system can be applied to test and debug the photoelectric equipment. The data handling technology used in the test equipment has advantages as high speed, high efficiency and high reliability.
- Published
- 2012
- Full Text
- View/download PDF
38. A General Automatic Test System for Instruments in IC Equipment
- Author
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Ling Tian and Xiaoshan Su
- Subjects
Engineering ,business.industry ,Electronic test equipment ,Integrated circuit ,law.invention ,Automatic test equipment ,Software ,Data acquisition ,law ,Component (UML) ,Embedded system ,Personal computer ,Electrical and Electronic Engineering ,business ,Instrumentation ,Computer hardware ,Reusability - Abstract
This paper proposes a general testing model for instruments and several testing approaches to test instruments in integrated circuit (IC) equipment. Three levels of mirror models are built to describe the hierarchical construction of units under test in IC equipment, which is used to simulate the internal structure and component relationship of tested instruments. By using different types of data acquisition (DAQ) cards and corresponding drivers, a concept of virtual pin is proposed to establish a bridge between the software and hardware aspects of the automatic test system (ATS). To improve the flexibility of the ATS, the testing procedure for a single instrument or equipment is divided into mirror model configuration and runtime control. By this way, the same mirror model can be adapted to different testing applications. To meet the needs of reusability of mirror models and transportability of testing applications, various configurations are serialized and deserialized via Extensible Markup Language files. Based on industrial personal computer and DAQ cards, an ATS prototype named IC Equipment Tester (ICETester) was developed to support the proposed mirror model and testing methods. The prototype was implemented for the development of plasma-enhanced chemical vapor deposition (PECVD) equipment, which proved that ICETester is efficient and flexible to test instruments in the PECVD equipment.
- Published
- 2012
- Full Text
- View/download PDF
39. Control System Design and Data Communication Realization of Road Accelerated Loading Test Equipment
- Author
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Xu Guang Wang, Zhi Guang Guan, and Ji Wei Zhang
- Subjects
Engineering ,business.industry ,Circuit design ,Electronic test equipment ,General Engineering ,Communications system ,Port (computer networking) ,Automotive engineering ,law.invention ,Microprocessor ,law ,Control system ,Road surface ,Communications protocol ,business ,Simulation - Abstract
Road accelerated loading test equipment is an important device for making road surface test under dynamic load action, and making test and evaluation on road structure and road surface material. The paper analyzes structure and working principle of road accelerated loading test equipment, mainly researches hardware circuit design of control system. In order to realize real-time display of operational parameters, data communication between PLC and single chip microprocessor uses free port communication mode. The paper mainly introduces communication protocol and its realization method, and proposes partial key programs. Operation of road accelerated loading test equipment indicates the equipment has reliable operation, the control system has stable working, and the data communication system is simple and practical.
- Published
- 2011
- Full Text
- View/download PDF
40. An Integration of Military Electronic Equipment and Flexible Test Technology
- Author
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Guo Shun Chen, Gang Niu, and Pei Yuan Wang
- Subjects
Engineering ,Standardization ,Software modularization ,business.industry ,Electronic test equipment ,General Medicine ,Test harness ,Manufacturing engineering ,Electronic equipment ,Automatic test equipment ,Modular programming ,Systems engineering ,Redundancy (engineering) ,business - Abstract
Aimed at the characteristics that military electronic equipment has applied numerous technologies, many kinds of tested signals, the demands of test system’s accuracy and expansibility. Researched the test system based flexible test technology; the design ideas are structure modularization, electric interface standardization and software modularization. Especially analyzed modularization design, redundancy or parallel channels, calibration and system function test loop, flexible test can be applied well in the filed of military electronic equipment support.
- Published
- 2011
- Full Text
- View/download PDF
41. A LOOK AT ONE ELECTRONICS PROBLEM-ELECTRONIC TEST EQUIPMENT
- Author
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Robert Bilinski
- Subjects
Engineering ,business.industry ,Electronic test equipment ,Electrical engineering ,Electronics ,business - Published
- 2009
- Full Text
- View/download PDF
42. Automated control of the velocity of in-tube diagnostic tools for main gas pipelines: II. Electronic equipment of a bypass device
- Author
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V. E. Loskutov, A. M. Podgorbunskikh, A. F. Matvienko, and V. A. Kanaikin
- Subjects
Engineering ,Hardware_MEMORYSTRUCTURES ,Automatic control ,business.industry ,Mechanical Engineering ,Detector ,Electronic test equipment ,Condensed Matter Physics ,Diagnostic tools ,Pipeline (software) ,Electronic equipment ,Automotive engineering ,Pipeline transport ,Mechanics of Materials ,General Materials Science ,Tube (fluid conveyance) ,business ,Simulation - Abstract
The design and operation of electronic in-tube nondestructive-testing equipment containing a bypass device are described. The electronic equipment designed for the bypass device is built in the general system of onboard electronic equipment and performs automatic control of the preset velocity of a flaw detector or other diagnostic pigs moving through a pipeline.
- Published
- 2007
- Full Text
- View/download PDF
43. Designing factory support equipment for field use
- Author
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Todd Burton, Jesse Sandoval, Christopher Phillips, and Derrick Jensen
- Subjects
Engineering ,Software ,Test equipment ,business.industry ,Electronic test equipment ,Device under test ,Line-replaceable unit ,business ,Swap (computer programming) ,Maintenance engineering ,Reliability engineering - Abstract
One problem that continues to plague test equipment is the fact that the factory, depot and field are all different environments, creating a scenario where the Unit Under Test (UUT) is being tested under variable circumstances. Additionally, the amount of testing available to the field is often limited to the extent that the field test equipment is only capable of determining a most likely Line Replaceable Unit (LRU) to swap out. When a swap-out action remediates a given problem, the replaced item is assumed to be faulty and the LRU is sent back to the depot for further repair.
- Published
- 2015
- Full Text
- View/download PDF
44. Developing Enhanced Light Imaging Test Equipment for DUTS obsolescence
- Author
-
Erwin Ho
- Subjects
Engineering ,Unit testing ,Software ,business.industry ,Test equipment ,Obsolescence ,Robustness (computer science) ,Test set ,Electronic test equipment ,Software incompatibility ,business ,Software engineering - Abstract
This paper will address the process that was implemented to manage and assess the existing obsolete hardware and implement new modern hardware. Managing obsolete software to process and assess newer technology and improve software functionality and robustness into the existing system in order to meet minimum schedule for qualification and acceptance. Maintaining test equipment that was designed over 20 years ago has presented major issues dealing with obsolescence. The steps of dealing with obsolescence are an ongoing process that will continue as new technology is always emerging. Hardware and software advancements continue to grow to provide faster, smarter and more accurate test equipment. When dealing with obsolete equipment there is often no longer sufficient support for the equipment from the manufacturer and maintaining the equipment to top standards and test procedures can prove difficult. Older obsolete equipment generally will not perform as well as newer technology and when components in the test equipment become obsolete, new technology must be implemented with old equipment to function as desired. Pairing older and newer technology may sometimes be a difficult task considering potential hardware and software incompatibility. All the potential issues must be explored and once understood procuring the new equipment is the next step. Once procured extensive testing must be performed to ensure complete compatibility between old and new equipment. Complete understanding of the obsolete equipment is essential in order to implement new equipment. From there we can learn and understand how newer equipment technology can be implemented with existing hardware and software capabilities. This paper discusses the replacement of the obsolete Computer Automated Display (CAD) test set with the new Enhanced Light Imaging Test Equipment (ELITE) required for the C-17 Display Unit Test Station (DUTS). The purpose is to show how the ELITE is smaller, lighter and enhances functionality than its predecessor.
- Published
- 2015
- Full Text
- View/download PDF
45. The testing system of electronic equipment design and implementation based on LabVIEW
- Author
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Zhao Chen, Wang Zhen, Liu Jinmei, and Yao Yanqi
- Subjects
Engineering ,Automatic test equipment ,System under test ,business.industry ,Control theory ,Embedded system ,Control system ,Electronic test equipment ,business ,Test harness ,Control bus ,Test data - Abstract
This paper firstly presents the characteristics of the bus 1553B and its protocol implementation in the electronic equipment test system, and then introduces the implementation process for the bus controller and remote terminal in the system in detail. LabVIEW was adopted to realize the function in main controller and test terminal in the electronic equipment test system. The operation command, test data and state of data communication can be recorded in real time, so the test system of electronic equipment is convenient to monitor the data. The test results showed that the test system worked efficiently with low bit error rate.
- Published
- 2015
- Full Text
- View/download PDF
46. Modular automatic test equipment design for on-platform diagnostics
- Author
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Ryan Nielsen and Daniel A Tagliente
- Subjects
Engineering ,Software portability ,Automatic test equipment ,business.industry ,Embedded system ,Design for testing ,Electronic test equipment ,Device under test ,Modular design ,User interface ,business ,Test harness ,Computer hardware - Abstract
A modular design for portable automatic test equipment used for on-platform diagnostics is described. The hardware and software architecture of the design are described in detail. The design comprises a core module that houses a processor and the primary instrumentation, measurement, and stimulus hardware of the test equipment. The design also includes an application module that provides platform-specific hardware capabilities and an interface to the system that is being tested. Modularity allows for the test equipment to be easily adapted for use on a wide variety of weapon systems and vehicles. The addition of optional wireless capability further enhances the portability and usability of the automatic test equipment when performing on-platform diagnostic tests and procedures. The test equipment is used in conjunction with a host computer that provides a user interface to the operator and directs the test equipment in interacting with the unit under test. The test equipment can also interact with or be directed by an Interactive Electronic Technical Manual running on the host computer. Communication between the test equipment and the host computer can be abstracted or encrypted as necessary, such that data transmissions are secure and accurate. When combined with vehicle health management systems, test program sets, and other automatic test equipment, the described design helps facilitate a two-level maintenance philosophy for military equipment and fleet vehicles.
- Published
- 2015
47. Developing easy pluggable test equipments for factory and development testing of air defense gun system
- Author
-
Onur Yasar and Hakan Caner
- Subjects
Engineering ,Automatic test equipment ,System under test ,business.industry ,Embedded system ,Electronic test equipment ,Operational acceptance testing ,System integration ,Systems design ,Factory (object-oriented programming) ,business ,Test harness - Abstract
Data acquisition, monitoring and recording from several interfaces of system under test is one of the most important issues for the system integration and operational testing. These tests are performed at several times at different places from factory to field test ranges. When the amount of the test interfaces are huge, preparation time for test setup, connection complexity between test equipments and system under test need to be minimized. In this paper, the developing of easy pluggable test equipments and compatible system design approach are discussed.
- Published
- 2015
- Full Text
- View/download PDF
48. Test program and ATE station dependencies: Have we learned anything from the past, or are we doomed to repeat it?
- Author
-
Michael Seavey and Dale D. Reitze
- Subjects
Engineering ,business.industry ,Test equipment ,Electronic test equipment ,computer.software_genre ,Test harness ,Test (assessment) ,Automatic test equipment ,Front panel ,Test program ,Operating system ,Scenario testing ,business ,computer - Abstract
Early test systems were designed for manual operation where the user had to select front panel buttons and knobs to set-up and run tests. This method of testing was time consuming, expensive and prone to error. Automatic Test Equipment (ATE) was originally developed to take manual test scenarios and automate the repetitive procedures that technicians performed while conducting tests on Units Under Test (UUTs).
- Published
- 2015
- Full Text
- View/download PDF
49. Advanced smart grid distribution testing
- Author
-
Victor Tran, Richard J. Bravo, and James Hernandez
- Subjects
Smart grid ,business.industry ,Computer science ,Electronic test equipment ,Electrical engineering ,AC power ,business ,Grid ,Automation ,Field (computer science) ,Test (assessment) ,Power (physics) ,Reliability engineering - Abstract
This paper will present the design of SCE's Smart Grid Test Facility (SGTF) and equipment test. This facility can be used to test, demonstrate, and validate utility distribution equipment performance before, during, and/or after their installation in the grid. This test facility's voltage, frequency, real power, and reactive power will be completely controlled where the equipment's automation, protection, and communications performance can be fully evaluated. This paper will provide the following additional information. First, it will provide a layout of the two distribution circuits in this facility with the equipment that will be installed to support the testing. Additionally, this paper will provide an overview of various tests that will be performed at SGTF to assess equipment performance. Furthermore, it will provide the ability to test automation and protection schemes that are otherwise prohibited to perform in the field. Finally, it will provide recommendations on additional uses of this facility such as training, installation procedures, volt/VAR control schemes, and communications. This facility will provide us the ability to pre-test pilot or new equipment without adversely affecting or disturbing customers.
- Published
- 2015
- Full Text
- View/download PDF
50. Photothermal microscopy: an effective diagnostic tool for laser irradiation effects on fused silica and KDP
- Author
-
Wu Zhouling, Dong Jingtao, and Chen Jian
- Subjects
Tunable diode laser absorption spectroscopy ,Materials science ,business.industry ,Electronic test equipment ,Photothermal therapy ,Laser ,law.invention ,Absorbance ,Optics ,law ,Microscopy ,Irradiation ,Absorption (electromagnetic radiation) ,business - Abstract
In this paper, an automated microscopic instrument based on this technique is developed and used for the measurement and analysis of weak absorption properties of optical materials. This system shows a measuring sensitivity of absorbance down to 10 ppb, and provides user-friendly operation of the whole absorption measurement process. Compared with a typical bench-top system, the automated system requires little special skills from the operators and is therefore more reliable and reproducible. By using this system, a study of laser irradiation effects on optical materials induced by high power laser pulses is performed. The in-situ monitoring of a laser induced damage process at 355 nm in fused silica is realized, which indicates that the photothermal system is a useful tool for analysis of laser-material-interaction dynamics. Other specific applications of this system include measuring weak absorption, detecting local absorption defects. Experimental results show that both surface/sub-surface absorption defects on fused silica and bulk absorption defects on KDP are clearly determined.
- Published
- 2015
- Full Text
- View/download PDF
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