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Abstract Insulated gate bipolar transistor (IGBT) modules are widely used as power switching devices. In actual working conditions, the failure of bonding wires is one of the most important failure modes. At present, the influence of bonding wire failure is not considered in the reliability evaluation of the device, resulting in a large error in the life prediction result. Therefore, this paper proposes a life evaluation method for IGBT modules that takes into account the failure of the bonding wire. The transient thermal impedance of 1200 V/50 A IGBT module under the failure conditions of different numbers of bonding wires is calculated by constructing a finite element simulation model of device electro‐thermal coupling. Both simulation and experimental results show that with the increase of the number of bonding wire failures, the transient thermal impedance curve of the device rises and the steady‐state thermal impedance increases. The Foster thermal network models of the devices are updated, and the number of power cycles of the device with bonding wire failure under DC and sinusoidal pulse width modulation (SPWM) conditions is calculated. When the number of bonding wire failures and fatigue accumulation have a linear relationship, the life will be reduced by 48.29% compared to the healthy state.

The stochastic resonance (SR) phenomenon induced by a multiplicative periodic signal in a logistic growth model with correlated noises is studied by using the theory of signal-to-noise ratio ( SNR) in the adiabatic limit. The expressions of the SNR are obtained. The effects of multiplicative noise intensity α and additive noise intensity D, and correlated intensity λ on the SNR are discussed respectively. It is found that the existence of a maximum in the SNR is the identifying characteristic of the SR phenomena. In comparison with the SR induced by additive periodic signal, some new features are found: (1) When SNR as a function of λ for fixed ratio of α and D, the varying of α can induce a stochastic multi-resonance, and can induce a re-entrant transition of the peaks in SNR vs λ; (2) There exhibits a doubly critical phenomenon for SNR vs D and λ, i.e., the increasing of D (or λ) can induce the critical phenomenon for SNR with respect to λ (or D); (3) The doubly stochastic resonance effect appears when α and D are simultaneously varying in SNR, i.e., the increment of one noise intensity can help the SR on another noise intensity come forth. [ABSTRACT FROM AUTHOR]

The effects of spatiotemporal disorder, i.e., both the noise and quenched disorder, on the dynamics of active particles in two dimensions are investigated. We demonstrate that within the tailored parameter regime, nonergodic superdiffusion and nonergodic subdiffusion occur in the system, identified by the observable quantities (the mean squared displacement and ergodicity-breaking parameter) averaged over both the noise and realizations of quenched disorder. Their origins are attributed to the competition effects between the neighbor alignment and spatiotemporal disorder on the collective motion of active particles. These results may be helpful for further understanding the nonequilibrium transport process of active particles, as well as for detection of the transport of self-propelled particles in complex and crowded environments.