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1. Direct determination of trace impurities in high-purity silicon nitride by axial viewed inductively coupled plasma optical emission spectrometry using a slurry nebulization technique

2. Direct determination of impurities in high purity silicon carbide by inductively coupled plasma optical emission spectrometry using slurry nebulization technique

3. Determination of impurities in titanium nitride by slurry introduction axial viewed inductively coupled plasma optical emission spectrometry

4. Alkaline fusion-alkaline mode HG-ICP spectrometry for selenium determination

5. Preparation of a high-concentration nm-size ceramic silicon carbide slurry for the ICP-OES determination of ultra-trace impurities in a sample

6. Direct determination of trace metals in boron carbide by slurry introduction axial viewed inductively coupled plasma optical emission spectrometry

7. Erratum to 'Determination of impurities in titanium nitride by slurry introduction axial viewed inductively coupled plasma optical emission spectrometry' [Spectrochimica Acta Part B 60 (2005) 361–367]

8. Characterization of stability of ceramic suspension for slurry introduction in inductively coupled plasma optical emission spectrometry and application to aluminium nitride analysis

9. Determination of metal impurities in titanium dioxide using slurry sample introduction by axial viewing inductively coupled plasma optical emission spectrometry

11. Preparation of a high-concentration nm-size ceramic silicon carbide slurry for the ICP-OES determination of ultra-trace impurities in a sample.

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