81 results on '"Davies, Angela D."'
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2. Characterization and operation optimization of large aperture optical interferometers using binary pseudorandom array test standards
3. Zernike polynomials for mid-spatial frequency representation on optical surfaces
4. Usefulness of orthogonal basis sets for predicting optical performance of wavefronts with mid-spatial frequency error.
5. Introduction.
6. Representation of the Spatial Frequency Content of Errors on Optical Surfaces
7. Optical interferometry for 3D surface profiling of freeform optics
8. Using the random ball test to calibrate slope dependent errors in optical profilometry
9. Stokes and Jones matrix polarimetry based on geometric phase measurements
10. Sampling the coherence function: a novel method for shape measurement
11. Arbitrary phase shifting in diffraction common path interferometry
12. Amplitude checker grating-based multichannel lateral shear interferometry for extended aberration sensing
13. A new morphological cell parameter based on optical phase for the evaluation of cell populations
14. Moiré effect-based interference microscopy for biospecimen characterization
15. High-resolution 3D shape deformation, displacement, and strain measurement for robotic flapping wings
16. Vibration amplitude determination through besselogram modulation analysis
17. Improvement of topography measurement using denoising approach in Fourier digital holographic microscopy
18. High-accuracy three-dimensional tomographic observation of cell clusters
19. Interferometric measurements of phase objects by using a simultaneous polarizing phase shifting Mach-Zehnder interferometer
20. Synchronized real-space and frequency-domain low-coherence interferometry for wafer thickness and metrology applications
21. Dynamic interferometric measurements employing a pixelated polarization sensor and FFT spatial-temporal filtering techniques
22. Minimizing the Abbe-offset in interferometric radius metrology
23. Towards instantaneous spectrally controlled interferometry
24. Model based error separation of power spectral density artefacts in wavefront measurement
25. Specification and measurement of uncertainty in phase shifting Fizeau interferometry
26. Characterization and operation optimization of large aperture optical interferometers using binary pseudorandom array test standards
27. Surface-height measurement noise in interference microscopy
28. A wonderful life of holography, interferometry, and optical testing
29. Multi-path interferometer structures with cleaved silica microspheres
30. Dual sensing-light-sheet OCT for microfluidic PTV
31. Unlabeled flow cellular deformation measurement based on digital holographic microscopy
32. Multi-beam spatially multiplexed interference microscopy for phase objects examination
33. Multi-spectral digital holography with high-speed wavelength switching and high-speed camera
34. Characterization of the interpolation bias in the analysis of deflectometry measurement data
35. Grey-level coding for structured-light illumination systems
36. From the speckle interferometer to digital holography
37. A non-destructive evaluation system for additive manufacturing based on acoustic signature analysis with laser Doppler vibrometry
38. Laser-Doppler vibrometry with variable GHz heterodyne carrier via frequency-offset lock
39. Certification, self-calibration and uncertainty in optical surface testing
40. New interferometric technique to measure the length (thickness) of opaque objects using a commercial interferometer
41. Ray-trace simulation of the random ball test to improve microlens metrology
42. Improving Radius Measurements on a Commercial Interferometer
43. The effect of phase change on reflection on optical measurements
44. Gaussian beam modeling of the radius of curvature
45. Improving metrology for micro-optics manufacturing
46. Improving metrology for micro-optics manufacturing.
47. Uncertainties in interferometric measurements of radius of curvature
48. Interferometric testing of photomask substrate flatness
49. Haidinger interferometer for silicon wafer TTV measurement
50. Interferometric figure metrology: enabling in-house traceability
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