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Single photon emitters (SPEs) are building blocks of quantum technologies. Defect engineering of 2D materials is ideal to fabricate SPEs, wherein spatially deterministic and quality-preserving fabrication methods are critical for integration into quantum devices and cavities. Existing methods use combination of strain and electron irradiation, or ion irradiation, which make fabrication complex, and limited by surrounding lattice damage. Here, we utilise only ultra-low energy electron beam irradiation (5 keV) to create dilute defect density in hBN-encapsulated monolayer MoS2, with ultra-high spatial resolution (< 50 nm, extendable to 10 nm). Cryogenic photoluminescence spectra exhibit sharp defect peaks, following power-law for finite density of single defects, and characteristic Zeeman splitting for MoS2 defect complexes. The sharp peaks have low spectral jitter (< 200 {\mu}eV), and are tuneable with gate-voltage and electron beam energy. Use of low-momentum electron irradiation, ease of processing, and high spatial resolution, will disrupt deterministic creation of high-quality SPEs., Comment: 31 pages, 16 figures, 1 table. Supplementary Material included

An intense low-energy broad luminescence peak (L-peak) is usually observed in 2D transition metal dichalcogenides (TMDs) at low temperatures. L-peak has earlier been attributed to bound excitons, but its origins are widely debated with direct consequences on optoelectronic properties. To decouple the contributions of physisorbed and chemisorbed oxygen, organic adsorbates, and strain on L-peak, we measured a series of monolayer (ML) MoS2 samples (mechanically exfoliated (ME), synthesized by oxygen-assisted chemical vapour deposition (O-CVD), hexagonal boron nitride (hBN) covered and hBN encapsulated). Emergence of L-peak below 150 K and saturation of photoluminescence (PL) intensity with laser power confirm bound nature of L-peak. Anomalously at room temperature, O-CVD samples show high A-exciton PL (c.f. ME), but reduced PL at low temperatures, which is attributed to strain-induced direct-to-indirect bandgap change in low defect O-CVD MoS2. Further, L-peak redshifts dramatically ~ 130 meV for O-CVD samples (c.f. ME). These observations are fully consistent with our predictions from density functional theory (DFT) calculations, considering effects of both strain and defects, and supported by Raman spectroscopy. In ME samples, charged oxygen adatoms are identified as thermodynamically favourable defects which can create in-gap states, and contribute to the L-peak. The useful effect of hBN is found to originate from reduction of charged oxygen adatoms and hydrocarbon complexes. This combined experimental-theoretical study allows an enriched understanding of L-peak and beneficial impact of hBN, and motivates collective studies of strain and defects with direct impact on optoelectronics and quantum technologies., Comment: 49 pages,21 figures

Semiconductor tunable barrier single-electron pumps can produce output current of hundreds of picoamperes at sub ppm precision, approaching the metrological requirement for the direct implementation of the current standard. Here, we operate a silicon metal-oxide-semiconductor electron pump up to a temperature of 14 K to understand the temperature effect on charge pumping accuracy. The uncertainty of the charge pump is tunnel limited below liquid helium temperature, implying lowering the temperature further does not greatly suppress errors. Hence, highly accurate charge pumps could be confidently achieved in a $^4$He cryogenic system, further promoting utilization of the revised quantum current standard across the national measurement institutes and industries worldwide.

Control on spatial location and density of defects in 2D materials can be achieved using electron beam irradiation. Conversely, ultralow accelerating voltages (less than or equal to 5kV) are used to measure surface morphology, with no expected defect creation. We find clear signatures of defect creation in monolayer (ML) MoS2 at these voltages. Evolution of E' and A1' Raman modes with electron dose, and appearance of defect activated peaks indicate defect formation. To simulate Raman spectra of MoS2 at realistic defect distributions, while retaining density-functional theory accuracy, we combine machine-learning force fields for phonons and eigenmode projection approach for Raman tensors. Simulated spectra agree with experiments, with sulphur vacancies as suggested defects. We decouple defects, doping and carbonaceous contamination using control (hBN covered and encapsulated MoS2) samples. We observe cryogenic PL quenching and defect peaks, and find that carbonaceous contamination does not affect defect creation. These studies have applications in photonics and quantum emitters., Comment: 49 pages, 24 figures, 4 tables

Optical contrast is the most common preliminary method to identify layer number of two-dimensional (2D) materials, but is seldom used as a confirmatory technique. We explain the reason for variation of optical contrast between imaging systems. We introduce a universal method to quantify the layer number using the RGB (red-green-blue) and RAW optical images. For RGB images, the slope of 2D flake (MoS2, WSe2, graphene) intensity vs. substrate intensity is extracted from optical images with varying lamp power. The intensity slope identifies layer number and is system independent. For RAW images, intensity slopes and intensity ratios are completely system and intensity independent. Intensity slope (for RGB) and intensity ratio (for RAW) are thus universal parameters for identifying layer number. A Fresnel-reflectance-based optical model provides an excellent match with experiments. Further, we have created a MATLAB-based graphical user interface that can identify layer number rapidly. This technique is expected to accelerate the preparation of heterostructures, and fulfil a prolonged need for universal optical contrast method.

Technological advancement towards the quantum era requires secure communication, quantum computation, and ultra-sensitive sensing capabilities. Layered quantum materials (LQMs) have remarkable optoelectronic and quantum properties that can usher us into the quantum era. Electron microscopy is the tool of choice for measuring these LQMs at an atomic and nanometer scale. On the other hand, electron-irradiation of LQMs can modify various material properties, including the creation of structural defects. We review different types of structural defects, as well as electron elastic- and inelastic-scattering induced processes. Controlled modification of optoelectronic and quantum properties of LQMs using electron-irradiation, including creation of single photon emitters is discussed. Protection of electron-irradiation induced damage of LQMs via encapsulation by other layered materials is encouraged. We finally give insights into challenges and opportunities, including creating novel structures using an electron beam., Comment: 16 pages, 4 figures