154 results on '"Danylyuk, Serhiy"'
Search Results
2. EUV Measurement Technologies
3. Laser-lift-off of GaN-based transistors with an ultra-short-pulsed deep UV laser
4. Optical Design of a High Flux Setup in the Extreme Ultraviolet
5. Optical and structural characterization of orthorhombic LaLuO3 using extreme ultraviolet reflectometry
6. Disclosing Topographical and Chemical Patterns in Confined Films of High Molecular Weight Block Copolymers Under Controlled Solvothermal Annealing
7. Disclosing Topographical and Chemical Patterns in Confined Films of High-Molecular-Weight Block Copolymers under Controlled Solvothermal Annealing.
8. Development of an ultra-compact inline transmission grating spectrograph for extreme ultraviolet wavelengths
9. The Role of Digital Technologies in Building Foreign Language Competencies of Future Specialists
10. Lensless Proximity EUV Lithography with a Xenon Gas Discharge Plasma Radiation
11. The Role of Digital Technologies in Building Foreign Language Competencies of Future Specialists
12. El papel de las tecnologías de la información (Classroom/Zoom) en la realización de seminarios
13. Sub-micrometer structuring of surfaces with deep UV lasers
14. Civic education of students by means of literature: european experience
15. El papel de las tecnologías de la información (Classroom/Zoom) en la realización de seminarios
16. Towards the resolution limit of Talbot lithography with compact EUV exposure tools
17. Design concepts of a new imaging system for a high-intensity XUV source beam by colour centres excitation in lithium fluoride crystals
18. Development of an ultra-compact inline transmission grating spectrograph for extreme ultraviolet wavelengths
19. The Use of Information Technology in the Educational Process during Martial Law
20. The Use of Information Technology in the Educational Process during Martial Law
21. Latent image characterization by spectroscopic reflectometry in the extreme ultraviolet
22. Design of an efficient illuminator for partially coherent sources in the extreme ultraviolet
23. Design concepts of a new imaging system for a high-intensity XUV source beam by colour centres excitation in lithium fluoride crystals
24. Lensless Proximity EUV Lithography with a Xenon Gas Discharge Plasma Radiation
25. Design and realization of an in-lab EUV dual beamline for industrial and scientific applications
26. Nanosession: Nanotechnological Fabrication Strategies
27. Broadband scatterometry at extreme ultraviolet wavelengths for nanograting characterization
28. Latent image characterization by spectroscopic reflectometry in the extreme ultraviolet
29. Accuracy analysis of a stand-alone EUV spectrometer for the characterization of ultrathin films and nanoscale gratings
30. Design and realization of an industrial stand-alone EUV resist qualification setup
31. Metrology and irradiation systems for accelerated testing of EUVL components
32. Computational proximity lithography with extreme ultraviolet radiation
33. REALIZATION OF PROFESSIONAL-AND-MANAGERIAL ORIENTATION OF MANAGERS OF SOCIO-CULTURAL ACTIVITIES IN THE PROCESS OF THEIR PROFESSIONAL ACTIVITIES
34. Characterization of nanoscale gratings by spectroscopic reflectometry in the extreme ultraviolet with a stand-alone setup
35. Novel high-contrast phase-shifting masks for EUV interference lithography
36. Nanoscale grating characterization through EUV spectroscopy aided by machine learning techniques
37. Computational proximity lithography with extreme ultraviolet radiation
38. Quantitative characterization of absorber and phase defects on EUV reticles using coherent diffraction imaging
39. Impact of rural schools on further adaptation of rural youth to the university life in a city: experience of Bohdan Khmelnytsky National University
40. Influence of Overheating Effect on Transport Properties of AlGaN/GaN Heterostructures
41. Industrial photoresist development with the EUV laboratory exposure tool: mask fabrication, sensitivity and contrast
42. Laboratory-based EUV spectroscopy for the characterization of thin films, membranes and nanostructured surfaces
43. Laboratory-scale EUV microscopy and nanometrology for scientific and industrial applications (Conference Presentation)
44. EUV-LET 2.0: a compact exposure tool for industrial research at a wavelength of 13.5nm
45. Spectroscopic reflectometry in the EUV for critical dimension metrology
46. Investigation of the resolution limit of Talbot lithography with compact EUV exposure tools.
47. UV radiation enhanced oxygen vacancy formation caused by the PLD plasma plume
48. SYSTEMIC APPROACH TO THE PROCESS OF PROFESSIONAL TRAINING OF FUTURE MANAGERS OF SOCIO-CULTURAL ACTIVITIES
49. Spatially Resolved Spectroscopic Extreme Ultraviolet Reflectometry for Laboratory Applications
50. IMPLEMENTATION OF MANAGERS’ PROFESSIONAL-AND-MANAGERIAL ORIENTATION IN THE PROCESS OF SOCIO-CULTURAL ACTIVITIES
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