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A label-free sensing platform is described for the detection of single-stranded DNA by using surface-enhanced Raman scattering (SERS). The Raman spectra of molecules serving as Raman labels residing on the hot spot are enhanced and the sensing of the target species is confirmed by the appearance of an intense SERS signal of the Raman label, which is bound to the surface of the Ag film.

A new and simple surface-enhanced Raman spectroscopy (SERS)-based method is developed for the detection of single stranded DNA. Changes in surface change allow selective electrostatic adsorption of positively charged Ag NP clusters.

Morphology and conductivity modifications in poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) films induced by conductive atomic force microscopy probe are investigated. At an applied bias of positive or negative 10 V, raised features of 12.8±1.8 nm in height are generated and the local film conductivity is reduced. The feature height formation is irreversible and dependent on both applied bias and tip velocity. The mechanism by which these features are generated is proposed to be mass transport of PSS- to the surface under the atomic force microscope tip. This finding may open up the possibility of patterning PEDOT:PSS films, and thereby organic optoelectronic devices. [ABSTRACT FROM AUTHOR]