1. Measuring Lateral Magnetic Structure in Thin Films Using Polarized Neutron Reflectometry
- Author
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Lee, W. -T., Velthuis, S. G. E. te, Felcher, G. P., Klose, F., Gredig, T., Dahlberg, D., and Toperverg, B. V.
- Subjects
Condensed Matter - Mesoscale and Nanoscale Physics - Abstract
Polarized neutron reflectometry (PNR) has long been applied to measure the magnetic depth profile of thin films. In recent years, interest has increased in observing lateral magnetic structures in a film. While magnetic arrays patterned by lithography and submicron-sized magnetic domains in thin films often give rise to off-specular reflections, micron-sized ferromagnetic domains on a thin film produce few off-specular reflections and the domain distribution information is contained within the specular reflection. In this paper, we will first present some preliminary results of off-specular reflectivity from arrays of micron-sized permalloy rectangular bars. We will then use specular reflections to study the domain dispersion of an exchange-biased Co/CoO bilayer at different locations of the hysteresis loop., Comment: 10 pages, 3 figurres, PNCMI 2002, Juelich, Germany
- Published
- 2002
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