11 results on '"Croft, G.D."'
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2. An electrostatic discharge failure mechanism in semiconductor devices, with applications to electrostatic discharge measurements using transmission line pulsing technique
3. Modeling and measurement approaches for electrostatic discharge in semiconductor devices and ICs: an overview
4. An improved transmission line pulsing (TLP) setup for electrostatic discharge (ESD) testing in semiconductor devices and ICs.
5. A method for determining a transmission line pulse shape that produces equivalent results to human body model testing methods.
6. An Improved Experimental Setup for Electrostatic Discharge (ESD) Measurements Based on Transmission Line Pulsing Technique.
7. A process independent ESD design methodology
8. An improved transmission line pulsing (TLP) setup for electrostatic discharge (ESD) testing in semiconductor devices and ICs
9. A method for determining a transmission line pulse shape that produces equivalent results to human body model testing methods
10. Transient supply clamp with a variable RC time constant
11. A process independent ESD design methodology.
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