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1. Myths and methodologies: Considerations for evaluating the time course of thermoregulatory adaptation during heat acclimation

2. Myths and methodologies: Considerations for evaluating the time course of thermoregulatory adaptation during heat acclimation.

3. Exponentiated gamma constant-stress partially accelerated life tests with unified hybrid censored data: Statistical inferences

4. Exponentiated gamma constant-stress partially accelerated life tests with unified hybrid censored data: Statistical inferences.

6. Estimation procedures for partially accelerated life test model based on unified hybrid censored sample from the Gompertz distribution.

7. Accelerated life tests for modified Kies exponential lifetime distribution: binomial removal, transformers turn insulation application and numerical results

8. Costs of Maintenance Service Policy: a New Approach on Constant Stress Partially Accelerated Life Test for Generalized Inverted Exponential Distribution.

9. On the Bayesian Analysis of Constant-Stress Life Test Model Under Type-Ii Censoring.

10. Bayesian Estimation of Constant-Stress Life Test Model Using Type-I Censored Data from the Linear Failure Rate Distribution.

11. Statistical Inference of Constant-Stress Partially Accelerated Life Test Model Using Failure-Censored Data from the Linear Failure Rate Distribution.

12. BAYESIAN ANALYSIS OF A CONSTANT-STRESS ACCELERATED LIFE TESTING WITH THERMAL AGING LIFE MODEL UNDER GENERAL PROGRESSIVE TYPE-II CENSORED DATA.

13. Accelerated life tests for modified Kies exponential lifetime distribution: binomial removal, transformers turn insulation application and numerical results

14. Functional fatigue of NiTi Shape Memory wires for a range of end loadings and constraints

15. Costs of Maintenance Service Policy: a New Approach on Constant Stress Partially Accelerated Life Test for Generalized Inverted Exponential Distribution

16. Functional fatigue of Ni–Ti shape memory wires under various loading conditions.

17. Bayesian analysis of a constant-stress accelerated life testing with thermal aging life model under general progressive type-II censored data

18. Functional fatigue of NiTi Shape Memory wires for a range of end loadings and constraints.

19. Optimum constant-stress life test plans for Pareto distribution under type-I censoring.

20. Functional fatigue of NiTi Shape Memory wires for a range of end loadings and constraints

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