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304 results on '"Claeys W"'

1. Joule Expansion Imaging Techniques on Microlectronic Devices

Author

Grauby, S., Lopez, L. -D. Patino, Salhi, A., Puyoo, E., Rampnoux, J. -M., Claeys, W., and Dilhaire, S.

Subjects
Physics - General Physics
Abstract

We have studied the electrically induced off-plane surface displacement on two microelectronic devices using Scanning Joule Expansion Microscopy (SJEM). We present the experimental method and surface displacement results. We show that they can be successfully compared with surface displacement images obtained using an optical interferometry method. We also present thermal images using Scanning Thermal Microscopy (SThM) technique to underline that SJEM is more adapted to higher frequency measurements, which should improve the spatial resolution., Comment: Submitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions)

Published
2008

9. Combined pressure-temperature inactivation of alkaline phosphatase in bovine milk: a kinetic study

Author

Ludikhuyze, L., Claeys, W., and Hendrickx, M.

Subjects
Alkaline phosphatase -- Research, Milk -- Pasteurization, Business, Food/cooking/nutrition
Abstract

Some experts believe that a combination of mild temperature elevation and high pressure treatment will be the most likely way forward to increase the shelf life of raw milk. A new study on pressure-temperature inactivation of alkaline phosphatase shows that it is generally more pressure resistant than the non-sporogenic pathogenic microorganisms present in milk and therefore can be used as an indication that these microorganisms are absent in pressure-treated milk.

Published
2000

20. Cross-plan Si/SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics.

Author

Ezzahri, Y., Grauby, S., Dilhaire, S., Rampnoux, J. M., and Claeys, W.

Subjects
REFLECTANCE, OPTICAL reflection, OPTICS, THERMAL analysis, SUPERLATTICES, TEMPERATURE, SPEED, ELECTRONS, TRANSDUCERS
Abstract

A pump-probe thermoreflectance technique is used for the nondestructive evaluation of thermal and acoustic properties of Si/Si0.7Ge0.3 superlattice (SL) at room temperature. In particular, this technique allows the determination of the metal transducer/SL thermal boundary resistance, the SL cross-plan thermal conductivity, and the longitudinal sound velocity inside the SL. Several effects related to the extraction of these properties are studied, including the metal transducer thickness and electron diffusion inside it. [ABSTRACT FROM AUTHOR]

Published
2007
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28. Coherent phonons in Si/ SiGe superlattices

Author

EZZAHRI, Younès, GRAUBY, Stéphane, RAMPNOUX, Jean-Michel, MICHEL, Hélène, PERNOT, Gilles, CLAEYS, W., DILHAIRE, Stefan, ROSSIGNOL, Clément, ZENG, G., SHAKOURI, Ali, Centre de physique moléculaire optique et hertzienne (CPMOH), Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, Laboratoire de Mécanique Physique (LMP), University of California [Santa Cruz] (UCSC), University of California, and Région AquitaineFEDER Objectif 2DARPAONR

Subjects
[SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph], Condensed Matter::Materials Science, [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics], Condensed Matter::Superconductivity, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], PACS: 68.35.Ja, 63.20.Dj, 68.65.Cd, 68.35.Iv, Condensed Matter::Strongly Correlated Electrons, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
Abstract

International audience; There are several classes of coherent phonons whose generation mechanisms are completely different: impulsive stimulated Raman scattering, Brillouin oscillations, and coherent longitudinal-acoustic-phonon Bragg reflection. All of these are investigated in Si/ SiGe superlattices using a picosecond ultrasonics technique at room temperature. Bragg reflection for a single vibrational mode is related to gaps in the phonon-dispersion relation at the center and the boundary of the folded Brillouin zone. The two lowest minigaps are observed at 283 and 527 GHz. Theoretical calculations of phonon-dispersion relation and phonon reflection rate are given to explain experimental results.

Published
2007
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30. Qualitative Temperature Variation Imaging by Thermoreflectance and SThM Techniques

Author

Grauby, Stéphane, Salhi, A., Patino Lopez, L.D., Dilhaire, S., Charlot, B., Claeys, W., Cretin, B., Tessier, G., Trannoy, N., Vairac, P., Volz, S., Centre de physique moléculaire optique et hertzienne (CPMOH), Université Sciences et Technologies - Bordeaux 1 (UB)-Centre National de la Recherche Scientifique (CNRS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Micro et nanothermique (MN), Université Sciences et Technologies - Bordeaux 1 (UB)-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL), TIMA Editions, Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Université Sciences et Technologies - Bordeaux 1-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-ESPCI ParisTech, and Université Sciences et Technologies - Bordeaux 1-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris)

Subjects
[INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR], Thermal imaging, scanning thermal microscopy, spatial resolution
Abstract

Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/handle/2042/5920); International audience; We have studied temperature variations on two dissipative structures with two different techniques. The dissipative structures are constituted of thin (0.35µm) dissipative resistors, the distance between two resistors being equal to 0.8 or 10 µm. On one hand, we have used a thermoreflectance imaging technique which is a well-known non contact optical method to evaluate temperature variations but whose spatial resolution is limited by diffraction. On the other hand, we have used a Scanning Thermal Microscope (SThM) to study the thermal behaviour of these small dissipative structures. We compare qualitative results obtained by both methods and we present their advantages and limitations for temperature measurements on microelectronic devices.

Published
2005

32. Development of an original method of high resolution imagery in real time across an absorbent environment: application to microelectronic circuits

Author

ABBADI, I., DILHAIRE, S., SALIN, F., CLAEYS, W., Centre de physique moléculaire optique et hertzienne (CPMOH), Université Sciences et Technologies - Bordeaux 1 (UB)-Centre National de la Recherche Scientifique (CNRS), Centre d'Etudes Lasers Intenses et Applications (CELIA), and Université de Bordeaux (UB)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS]Physics [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience; no abstract

Published
2005
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33. Effect of the laser pulse duration on picosecond ultrasonic signals

Author

Rossignol, C., Audoin, Bertrand, Rampnoux, Jean-Michel, Dilhaire, S., Claeys, W., Laboratoire des Milieux Désordonnés et Hétérogènes (LMDH), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), Centre de résonance magnétique biologique et médicale (CRMBM), Aix Marseille Université (AMU)-Assistance Publique - Hôpitaux de Marseille (APHM)-Centre National de la Recherche Scientifique (CNRS), Centre de physique moléculaire optique et hertzienne (CPMOH), Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, Institut de Mécanique et d'Ingénierie de Bordeaux (I2M), Institut National de la Recherche Agronomique (INRA)-Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux (Bordeaux INP)-Centre National de la Recherche Scientifique (CNRS), Université Sciences et Technologies - Bordeaux 1 (UB)-Centre National de la Recherche Scientifique (CNRS), Institut de Mécanique et d'Ingénierie (I2M), Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-Arts et Métiers Sciences et Technologies, HESAM Université (HESAM)-HESAM Université (HESAM), and Université Sciences et Technologies - Bordeaux 1-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS]Physics [physics], ComputingMilieux_MISCELLANEOUS
Abstract

International audience; no abstract

Published
2005

34. Applications de l acoustique picoseconde à l analyse non destructive de circuits intégrés

Author

Rampnoux, J. M., Ezzahri, Y., Dilhaire, S., Grauby, S., Claeys, W., Rossignol, C., Audoin, Bertrand, Andriamonje, Grégory, Pouget, Vincent, Ousten, Yves, Lewis, Dean, Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, and Import, Ims

Subjects
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Published
2004

36. Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI Circuits

Author

Andriamonje, Grégory, Pouget, Vincent, Ousten, Yves, Lewis, Dean, Danto, Yves, Rampnoux, J. M., Ezzahri, Y., Dilhaire, S., Grauby, S., Claeys, W., Rossignol, C., Audoin, Bertrand, Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, and Import, Ims

Subjects
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Published
2003

37. Optical studies for MEMS thermomechanical characterization

Author

Jorez, S., Laconte, J., Raskin, Jean-Pierre, Cornet, A., Grauby, S., Dilhaire, S., Claeys, W., Photomec'02, and UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

Abstract

We present different optical techniques to characterize Micro-Electro-Mechanical Systems (MEMS) components. The temperature, topography and displacement of a MEMS related to its mechanical characteristics can be extracted using optical reflections. The MEMS under consideration in this paper is microheater composed of a loop-shaped resistor (heater) in phosphorus doped polysilicon.

Published
2003

38. Differential thermal testing: An approach to its feasibility

Author

Josep Altet, Rubio, A., Claeys, W., Dilhaire, S., Schaub, E., Tamamoto, H., Department of Electronic Engineering, Universitat Politècnica de Catalunya [Barcelona] (UPC), Centre de physique moléculaire optique et hertzienne (CPMOH), Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, Department of Computer Science and Engineering [Akita], and Akita University

Subjects
[PHYS]Physics [physics]
Abstract

International audience; Testing techniques based on the functional behaviour, the propagation delay and the levels of quiescent current have been used with great success for the last two decade technologies. However, the efficiency of such techniques is dubious for future technologies, characterised by huge mixed-mode complex circuits and very low supply voltage levels. In this paper the feasibility of using internal thermal sensors to detect heat sources provoked by structural defects are considered and evaluated.

Published
1999
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39. Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization

Author

Altet, J., Aldrete Vidrio, E., Mateo, D., Salhi, A., Grauby, Stéphane, Claeys, W., Dilhaire, S., Perpiñà, X., Jordà, Xavier, Altet, J., Aldrete Vidrio, E., Mateo, D., Salhi, A., Grauby, Stéphane, Claeys, W., Dilhaire, S., Perpiñà, X., and Jordà, Xavier

Abstract

Heterodyne strategies can be used to characterize thermal coupling in integrated circuits when the electrical bandwidth of the dissipating circuit is beyond the bandwidth of the thermal coupling mechanism. From the characterization of the thermal coupling, two possible applications are described: extraction of characteristics of the dissipating circuit (the determination of the center frequency of a low-noise amplifier) and the extraction of the thermal coupling transfer function.

Published
2009

40. A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits

Author

Altet, J., Aldrete Vidrio, E., Mateo, D., Perpiñà, X., Jordà, Xavier, Vellvehi Hernández, Miquel, Millán, José, Salhi, A., Grauby, Stéphane, Claeys, W., Dilhaire, S., Altet, J., Aldrete Vidrio, E., Mateo, D., Perpiñà, X., Jordà, Xavier, Vellvehi Hernández, Miquel, Millán, José, Salhi, A., Grauby, Stéphane, Claeys, W., and Dilhaire, S.

Abstract

The observation of spectral components of the power dissipated by devices and circuits in integrated circuits (IC) by temperature measurements is limited by the bandwidth of either the temperature transducer or the intrinsic cut-off frequency provided by the thermal coupling inside the chip. In this paper, we use a heterodyne method to observe the high-frequency behavior of circuits and devices by means of low-frequency lock-in temperature measurements. As experimental results, two applications of the technique are presented: detection of hot spots in ICs activated by high-frequency electrical signals and the observation of the frequency response of an integrated resistor through temperature measurements. The heterodyne method has been used in this paper with four different measurement techniques: embedded differential BiCMOS temperature sensor, laser reflectometer, laser interferometer and internal IR laser deflection meter.

Published
2008

41. High resolution interferometry (HRI) and electronic speckle pattern interferometry (ESPI) applied to the thermomechanical study of a MOS power transistor

Author

Nassim, K., Joannes, L., Cornet, A., Dilhaire, Stefan, Schaub, Emmanuel, Claeys, W., Laboratoire d'Optique Appliquée (FYAM), Université Catholique de Louvain = Catholic University of Louvain (UCL), Centre de physique moléculaire optique et hertzienne (CPMOH), Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, and Bergeret, Bernadette

Subjects
[PHYS]Physics [physics], ComputingMilieux_MISCELLANEOUS, [PHYS] Physics [physics]
Abstract

International audience

Published
1998

43. Thermal characterization of defects in an IC: Thermal testing

Author

Josep Altet, Rubio, A., Dilhaire, S., Schaub, E., Claeys, W., Department of Electronic Engineering, Universitat Politècnica de Catalunya [Barcelona] (UPC), Centre de physique moléculaire optique et hertzienne (CPMOH), Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, and Bergeret, Bernadette

Subjects
[PHYS]Physics [physics], ComputingMilieux_MISCELLANEOUS, [PHYS] Physics [physics]
Abstract

International audience

Published
1998

45. Optical studies for MEMS thermomechanical characterization

Author

UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, Jorez, S., Laconte, J., Raskin, Jean-Pierre, Cornet, A., Grauby, S., Dilhaire, S., Claeys, W., Photomec'02, UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, Jorez, S., Laconte, J., Raskin, Jean-Pierre, Cornet, A., Grauby, S., Dilhaire, S., Claeys, W., and Photomec'02

Abstract

We present different optical techniques to characterize Micro-Electro-Mechanical Systems (MEMS) components. The temperature, topography and displacement of a MEMS related to its mechanical characteristics can be extracted using optical reflections. The MEMS under consideration in this paper is microheater composed of a loop-shaped resistor (heater) in phosphorus doped polysilicon.

Published
2003

46. TESTING OF THE QUALITY OF SOLDER JOINTS THROUGH THE ANALYSIS OF THEIR THERMAL-BEHAVIOR WITH AN INTERFEROMETRIC LASER PROBE

Author

Claeys, W., Quintard, V., Dilhaire, S., Lewis, D., Danto, Y., Bergeret, Bernadette, Centre de physique moléculaire optique et hertzienne (CPMOH), Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, Laboratoire d'études de l'intégration des composants et systèmes électroniques (IXL), and Centre National de la Recherche Scientifique (CNRS)-École Nationale Supérieure d'Électronique, Informatique et Radiocommunications de Bordeaux (ENSEIRB)-Université Sciences et Technologies - Bordeaux 1

Subjects
[PHYS]Physics [physics], ComputingMilieux_MISCELLANEOUS, [PHYS] Physics [physics]
Abstract

International audience; no abstract

Published
1994

48. Four different approaches for the measurement of IC surface temperature: Application to thermal testing

Author

Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions, Saulnier, J.B, Altet Sanahujes, Josep, Dilhaire, Stefan, Volz, S., Rampnoux, J.M., Rubio Sola, Jose Antonio, Grauby, S., Patino, L., Claeys, W., Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica, Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions, Saulnier, J.B, Altet Sanahujes, Josep, Dilhaire, Stefan, Volz, S., Rampnoux, J.M., Rubio Sola, Jose Antonio, Grauby, S., Patino, L., and Claeys, W.

Abstract

Silicon die surface temperature can be used to monitor the health state of digital and analogue integrated circuits (IC). In the present paper, four different sensing techniques: scanning thermal microscope, laser reflectometer, laser interferometer and electronic built-in differential temperature sensors are used to measure the temperature at the surface of the same IC containing heat sources (hot spots) that behave as faulty digital gates. The goal of the paper is to describe the techniques as well as to present the performances of these sensing methods for the detection and localisation of hot spots in an IC. q 2002 Elsevier Science Ltd All rights reserved., Postprint (published version)

Published
2002

49. EARLY DETECTION OF AGING IN SOLDER JOINTS THROUGH LASER PROBE THERMAL-ANALYSIS OF THE PELTIER EFFECT

Author

Claeys, W., Quintard, V., Dilhaire, S., Lewis, D., Danto, Y., Centre de physique moléculaire optique et hertzienne (CPMOH), Université Sciences et Technologies - Bordeaux 1 (UB)-Centre National de la Recherche Scientifique (CNRS), Micro et nanothermique (MN), Université Sciences et Technologies - Bordeaux 1 (UB)-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL), Laboratoire d'études de l'intégration des composants et systèmes électroniques (IXL), Université Sciences et Technologies - Bordeaux 1 (UB)-École Nationale Supérieure d'Électronique, Informatique et Radiocommunications de Bordeaux (ENSEIRB)-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Université Sciences et Technologies - Bordeaux 1, Université Sciences et Technologies - Bordeaux 1-Université de Nantes (UN)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Ecole Centrale Paris-ENSMA-DGA-Ecole Superieure de Physique et de Chimie Industrielles de la Ville de Paris (ESPCI Paris), Centre National de la Recherche Scientifique (CNRS)-École Nationale Supérieure d'Électronique, Informatique et Radiocommunications de Bordeaux (ENSEIRB)-Université Sciences et Technologies - Bordeaux 1, and Bergeret, Bernadette

Subjects
[PHYS]Physics [physics], ComputingMilieux_MISCELLANEOUS, [PHYS] Physics [physics]
Abstract

International audience; no abstract

Published
1993

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