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Despite the huge advancement in knowledge discovery and data mining techniques, the X-ray diffraction (XRD) analysis process has mostly remained untouched and still involves manual investigation, comparison, and verification. Due to the large volume of XRD samples from high-throughput XRD experiments, it has become impossible for domain scientists to process them manually. Recently, they have started leveraging standard clustering techniques, to reduce the XRD pattern representations requiring manual efforts for labeling and verification. Nevertheless, these standard clustering techniques do not handle problem-specific aspects such as peak shifting, adjacent peaks, background noise, and mixed phases; hence, resulting in incorrect composition-phase diagrams that complicate further steps. Here, we leverage data mining techniques along with domain expertise to handle these issues. In this paper, we introduce an incremental phase mapping approach based on binary peak representations using a new threshold based fuzzy dissimilarity measure. The proposed approach first applies an incremental phase computation algorithm on discrete binary peak representation of XRD samples, followed by hierarchical clustering or manual merging of similar pure phases to obtain the final composition-phase diagram. We evaluate our method on the composition space of two ternary alloy systems- Co-Ni-Ta and Co-Ti-Ta. Our results are verified by domain scientists and closely resembles the manually computed ground-truth composition-phase diagrams. The proposed approach takes us closer towards achieving the goal of complete end-to-end automated XRD analysis., Comment: Accepted and presented at the International Workshop on Domain-Driven Data Mining (DDDM) as a part of the SIAM International Conference on Data Mining (SDM 2021). Contains 11 pages and 5 figures

One of the pressing needs for space ultraviolet-visible astronomy is a design to allow larger mirrors than the James Webb Space Telescope primary. The diameter of the rocket fairing limits the mirror diameter such that all future missions calling for mirrors up to 16 meters in diameter or larger will require a mirror that is deployed post-launch. In response to the deployment requirement, we address the issues of this concept called "A Precise Extremely Large Reflective Telescope Using Reconfigurable Elements (APERTURE) with both hardware experiments and software simulations... We designed and built several fixtures with O-rings to hold a membrane. We established a coating process to make a membrane that was coated on one side with Cr and the other side with Cr-Terfenol-D-NiCo. The Terfenol-D (T-D hereafter) is the MSM (Magnetic Smart Memory) we use. We bought and established a procedure for measuring a deformation over time and purchased a Shack Hartmann system from Imagine Optic (https://www.imagine-optic.com). The first substrate we used was DuPont (TM) Kapton® polyimide film. Due to material creep, we found the stability over a 48-hour period with a Kapton substrate was not as good as desired (greater than 1 micron). We then switched to CP1 Polyimide. We found the CP1 much more stable to creep, being stable from about 3 hours to 48 hours to within a measurement error to below approximately 0.1 micron. We produced a 13 micron maximum deviation on a 50-millimeter-diameter piece of CP1 (25 microns thick). The T-D coating was about 2 microns, and the other layers, about 10 nanometers. The magnetic field at the base was about 0.1 teslas. We can make the T-D film at least 5 times thicker and the magnetic field at least 5 times stronger, and hence make deformations as much as 25 times larger. We have a formed a collaboration produced at the NIAC (NASA Innovative Advanced Concepts) mid-term review with Dr. Ron Shiri of Goddard Space Flight Center (GSFC) to explore making controlled deviations on lambda/14-lambda/20 scales which are required to bring a surface to the diffraction limit. We carried out only preliminary work on Si using a Coordinate Measuring Machine (CMM), which produced deviations on the 1 micron level. We are still working on a program to bring to GSFC a flat enough (radius of curvature greater than 10 microns) -coated a Si piece with Cr, T-D, NiCo. Then we plan to carry out tests with an interferometer. Further, we formed a new collaboration with Prof. Rajan Vaidyanathan of the University of Central Florida to replace the CP1 with a shape memory alloy (SMA). With his collaboration, we acquired new Federal funding outside of NASA to explore the use of SMAs (we use NiTi). Our preliminary results indicate that we can produce deformations greater than 1 micron on approximately 100 microns thick. Furthermore we have shown that the NiTi can deploy to better than 1 micron of its set original and then trained shape.