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1. Practical interferometric solutions for increasing test coverage for high precision optical manufacturing

Author

Chris McKeever and Steven VanKerkhove

Subjects
Lateral shear, Image stitching, Interferometry, Optics, Materials science, business.industry, Aperture, Astrophysics::Instrumentation and Methods for Astrophysics, Measure (physics), Code coverage, business
Abstract

Optical manufacturing facilities are often limited by the size of the optics they can interferometrically measure. This paper describes three practical methods to increase the aperture of interferometric surface coverage. These methods include a lateral shear, a subaperture rotational stitching routine and a through-the-element test.

Published
2000

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