19 results on '"Chien-Mo, James"'
Search Results
2. Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor.
3. Chip Performance Prediction Using Machine Learning Techniques.
4. Automatic IR-Drop ECO Using Machine Learning.
5. Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits
6. IR drop prediction of ECO-revised circuits using machine learning.
7. Test Methodology for Dual-rail Asynchronous Circuits.
8. Automatic test pattern generation for delay defects using timed characteristic functions.
9. Machine-learning-based dynamic IR drop prediction for ECO.
10. Fault modeling and testing of retention flip-flops in low power designs.
11. Jump Scan: A DFT Technique for Low Power Testing.
12. ELF-Murphy Data on Defects and Test Sets.
13. Diagnosis of Sequence-Dependent Chips.
14. Testing for resistive opens and stuck opens.
15. Diagnosis of Tunneling Opens.
16. Testing for tunneling opens.
17. Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.
18. Very-Low-Voltage testing of amorphous silicon TFT circuits.
19. Power scan: DFT for power switches in VLSI designs.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.