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10. Synthesis and memory properties of a conjugated copolymer of fluorene and benzoate with chelated europium complex.

11. Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced current.

12. Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm.

16. Cathodoluminescence Contrast of Localized Defects Part II. Defect Investigation

17. Cathodoluminescence Contrast of Localized Defects Part I. Numerical Model for Simulation

19. Investigation of Dislocations in GaAs Using Cathodoluminescence in the Scanning Electron Microscope

20. A Simulation Model for Electron Irradiation Induced Specimen Charging in a Scanning Electron Microscope

32. Error Voltage Components in Quantitative Voltage Contrast Measurement Systems

34. Physical and electrical properties of lanthanide-incorporated tantalum nitride for n-channel metal-oxide-semiconductor field-effect transistors

40. Effect of surface NH3 anneal on the physical and electrical properties of HfO2 films on Ge substrate

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