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1. Sensitive volume and triggering criteria of SEB in classic planar VDMOS

3. Neutron induced energy deposition in a silicon diode

4. High-energy heavy ion irradiation-induced structural modifications: a potential physical understanding of latent defects

5. SEB characterization of commercial power MOSFETs with backside laser and heavy ions of different ranges

6. Probing SET sensitive volumes in linear devices using focused laser beam at different wavelengths

7. Effects of beam spot size on the correlation between laser and heavy ion SEU testing

8. Development of a Standard Test Scenario to Evaluate the Effectiveness of Portable Fire Extinguishers on Lithium-ion Battery Fires

9. Fuel Cell Airframe Integration Study for Short-Range Aircraft

10. Measurement and calculation of charge deposition in a silicon diode irradiated by 30 MeV protons

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