1. Volume Fabrication of Quantum Cascade Lasers on 200 mm-CMOS pilot line
- Author
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Coutard, JG, Brun, M, Fournier, M, Lartigue, O, Fedeli, F, Maisons, G, Fedeli, JM, Nicoletti, S, Carras, M, and Duraffourg, L
- Subjects
Physics - Applied Physics - Abstract
The manufacturing cost of quantum cascade lasers is still a major bottleneck for the adoption of this technology for chemical sensing. The integration of Mid-Infrared sources on Si substrate based on CMOS technology paves the way for high-volume low-cost fabrication. Furthermore, the use of Si-based fabrication platform opens the way to the co-integration of QCL Mid-InfraRed sources with SiGe-based waveguides, allowing realization of optical sensors fully integrated on planar substrate. We report here the fabrication and the characterization of DFB-QCL sources using top metal grating approach working at 7.4 microns fully implemented on our 200 mm CMOS pilot line. These QCL featured threshold current density of 2.5 kA/cm2 and a linewidth of 0.16 cm-1 with a high fabrication yield. This approach paves the way toward a Mid-IR spectrometer at the silicon chip level., Comment: 12 pages, 4 figures
- Published
- 2019