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37 results on '"CE - Equipe Contacts Electriques"'

1. Mesures électriques locales par AFM en mode intermittent

Author

Vecchiola, Aymeric, Chrétien, Pascal, Schneegans, Olivier, Houzé, Frédéric, Bouzehouane, Karim, Fusil, Stéphane, Mattana, Richard, Seneor, Pierre, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), Concept Scientific Instruments, Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), Unité mixte de physique CNRS/Thales (UMPhy CNRS/THALES), Centre National de la Recherche Scientifique (CNRS)-THALES, ANR-11-NANO-0021,MELAMIN,Mesures électriques locales par AFM en mode intermittent - Application à la spintronique moléculaire et valorisation -(2011), Houzé, Frédéric, Nanotechnologies et Nanosystèmes - Mesures électriques locales par AFM en mode intermittent - Application à la spintronique moléculaire et valorisation - - - MELAMIN2011 - ANR-11-NANO-0021 - P2N - VALID, and THALES [France]-Centre National de la Recherche Scientifique (CNRS)

Subjects
[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2013

2. Imagerie de résistance électrique locale par AFM à pointe conductrice en mode contact intermittent

Author

Vecchiola, Aymeric, Chrétien, Pascal, Schneegans, Olivier, Houzé, Frédéric, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MISCELLANEOUS
Abstract

National audience

Published
2013

3. Developments in functional surfaces for electrical contacts

Author

Noël, Sophie, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2013

4. An investigation of fretting wear behaviour of lubricated nickel coatings for electrical contacts application

Author

Noël, Sophie, Alamarguy, David, Brézard-Oudot, Aurore, Gendre, P., CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS, ComputingMilieux_MISCELLANEOUS
Abstract

LGEP 2013 ID = 1454; International audience

Published
2013

5. An investigation of fretting wear behaviour of nickel coatings for electrical contacts application in dry and lubricated conditions

Author

Aurore Brézard-Oudot, Sophie Noël, David Alamarguy, P. Gendre, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Materials science, 020209 energy, Metallurgy, Fretting, 02 engineering and technology, Surfaces and Interfaces, Surface finish, engineering.material, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Electrical contacts, Surfaces, Coatings and Films, Coating, Electrical resistance and conductance, Mechanics of Materials, Plating, 0202 electrical engineering, electronic engineering, information engineering, Materials Chemistry, engineering, Lubrication, Lubricant, 0210 nano-technology
Abstract

International audience; Fretting remains a major cause of connector failure and can impair reliability of complex system. Much work is devoted to minimise the effects of cyclic displacements in the contact interface. One of the options is to choose proper materials for the final layer and eventually select an underlayer. Another option is to apply a lubricant compatible with the electrical function of the connecting device. Its effect must be the reduction of friction with the preservation of conduction. In this work we have investigated the properties of nickel electrodeposited on cuprous coupons submitted to an imposed sine displacement fretting test (1 Hz, 25 μm, 2.5 N). The contacts are of the sphere on plane type. The plating conditions are shown to have a large effect on the microstructure, roughness and composition of the nickel coatings. Consequently the fretting behaviours of the compared coating are different. Fretting degradation is evaluated for our application as the number of cycles for which the build-up of oxidised debris gives a value of electrical resistance superior to a threshold. During the fretting test the rough nickel with large grains is observed to be prone to very high friction and partial slip. Fretting of the smoother coating with small grains is characterised by gross slip. Contacts were lubricated with solutions of perfluorinated polyether (PFPE). It is shown that a strong friction reduction takes place and that the fretting degradation is postponed. Surface analysis shows that fluorine is grafted in the interface and protects the interface. The electrodeposition process and the properties of the nickel coating are shown to have an effect on the lubricant behaviour in the contact interface. These results show the strong potential of lubricated nickel for applications in the field of electrical devices.

Published
2013
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6. Développement d'une imagerie de résistance électrique locale par AFM à pointe conductrice en mode contact intermittent

Author

Vecchiola, Aymeric, Schneegans, Olivier, Chrétien, Pascal, Houzé, Frédéric, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2013

7. Commutation résistive de films minces de LixCoO2: Spécificité du comportement de l'AFM à pointe conductrice

Author

Mai, Van Huy, Moradpour, Alec, Schneegans, Olivier, Auban-Senzier, Pascale, Pasquier, Claude, Wang, Kang, Franger, Sylvain, Revcolevschi, Alexandre, Svoukis, Efthymios, Giapintzakis, John, Lecoeur, Philippe, Aubert, Pascal, Agnus, Guillaume, Maroutian, Thomas, Salot, Raphaël, Chrétien, Pascal, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2013

8. Resistive switching phenomena in LixCoO2 thin films

Author

Schneegans, Olivier, Mai, van Huy, Moradpour, Alec, Auban-Senzier, Pascale, Pasquier, Claude, Wang, Kang, Franger, Sylvain, Revcolevschi, Alexandre, Svoukis, Efthymios, Giapintzakis, John, Lecoeur, Philippe, Aubert, Pascal, Agnus, Guillaume, Maroutian, Thomas, Salot, R., Chrétien, Pascal, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2012

9. Diagnostic of Connector's Degradation Level by Frequency Domain Reflectometry

Author

C. Gilbert, F. Loete, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
0209 industrial biotechnology, business.industry, Computer science, Time-domain reflectometer, 020208 electrical & electronic engineering, Electrical engineering, 02 engineering and technology, Line (electrical engineering), Cable gland, 020901 industrial engineering & automation, Frequency domain, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Reflectometry, business, Electrical impedance, Short circuit, Degradation (telecommunications)
Abstract

International audience; Because of the increasing size of electrical networks in automotives, the degradation of wires and connectors has become a major concern. As a matter of fact, severe system failures are often merely due to broken wires, bad crimping or degraded connectors. Furthermore, the difficulty to localize those kinds of defects using nowadays techniques generally leads to costly repair. Reflectometry is a well-known method used to monitor the health of lines and wired networks. Wiring networks can be affected with two types of faults: "soft ones" are created by the change of the impedance along the line due to different kinds of defects (insulation, radial crack, and degradation of connector...) in the wire and "hard ones" which correspond to open and short circuits. For the first type of faults, the frequency-domain response of the faulty wiring presents a modification of the impedance, in the defect location. For that reason, this paper focuses on the application of the reflectometry technique to the broadband characterization of a vibration degraded Cu-Sn connector. Once the Sn plating is removed, the electrical properties of the contact interface are entirely modified. The results presented in this paper show that observing such kind of transition can be used as criteria for estimating the degradation level of the connector.

Published
2012
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10. Graphene films for corrosion protection of gold coated cuprous substrates in view of an application to electrical contacts

Author

Alexandre Jaffré, Sophie Noël, Laurent Baraton, Fanny Hauquier, Pascal Viel, David Alamarguy, Serge Palacin, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Electron mobility, Materials science, Graphene, Metallurgy, Contact resistance, 02 engineering and technology, Chemical vapor deposition, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Electrical contacts, 0104 chemical sciences, Corrosion, law.invention, law, Composite material, 0210 nano-technology, Graphene nanoribbons, Graphene oxide paper
Abstract

International audience; Corrosion of gold coated electrical contacts remains a problem often avoided by keeping the final gold coating thicknesses over 1 μm. Graphene has recently been shown to be an outstanding material: among its astonishing properties are the theoretical carrier mobility at room temperature (200 000 cm2/V-1s-1) and the Young modulus (1.5 TPa). Graphene is a one-atom thick two-dimensional carbon crystal and has been first produced by mechanical exfoliation to obtain high purity defect free sheets. Chemical vapour deposition (CVD) is another method producing larger areas of graphene. Much work has been dedicated to graphene oxide (GO) deposition and reduction processes for applications ranging from electronics to sensors. In this work we describe briefly how a method of liquid exfoliation and spray deposition can be used to produce nanometric films of graphene flakes which can be more or less uniform and continuous according to the tuning of the process. Films were sprayed in different conditions on various substrates: laboratory substrates such as evaporated gold on glass, Si wafers and metallic coupons. The coupons under study were cut from cuprous alloy strips with a 2μm Ni underlayer and a 0.8 μm Au layer. The coupons were coated with graphene films; they were then submitted to a four gas corrosion environmental test of the GR-1217-CORE Nov. 1995 type. A significant protection effect was observed for the sprayed graphene films. The deposition method by means of a spraying device was difficult to characterise but Raman spectroscopy and SEM images of the sprayed films showed evidence of the film formation. Contact resistance measurements and friction tests in a ball plane configuration were performed; low values of resistance and very low friction coefficients were measured. These first results show the very strong potential of graphene films deposited by a spraying method for electrical contacts applications and particularly for corrosion protection.

Published
2012
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11. Observation of Branly's effect during shunting experiments on scaled wheel-rail contacts

Author

Chollet, Hugues, Houzé, Frédéric, Testé, Philippe, Loete, Florent, Lorang, Xavier, Debucquoi, Sébastien, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MISCELLANEOUS
Abstract

International audience

Published
2012

12. Activités au LGEP et à Supélec dans le Domaine des Décharges et des Arcs Électriques

Author

Romaric Landfried, Khaled Almaksour, Philippe Dessante, Mike Kirkpatrick, Thierry Leblanc, Emmanuel Odic, Philippe Testé, Supélec Sciences des Systèmes (E3S), Ecole Supérieure d'Electricité - SUPELEC (FRANCE), Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[SPI]Engineering Sciences [physics]
Published
2012

13. Resistive switching phenomena in HT-LixCoO2 thin films deposited by PLD

Author

Svoukis, Efthymios, Mai, Van Huy, Athanasopoulos, G.I., Moradpour, Alec, Schneegans, Olivier, Giapintzakis, John, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS, ComputingMilieux_MISCELLANEOUS
Abstract

LGEP 2012 ID = 1035; International audience

Published
2012

14. Electrical behaviour of the wheel-rail contact

Author

S. Debucquoi, M. Antoni, H. Chollet, F. Houzé, F. Loëte, R. Andlauer, X. Lorang, P. Testé, F. Lerdu, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Engineering, business.industry, Context (language use), 02 engineering and technology, Track circuit, 010501 environmental sciences, Track (rail transport), 01 natural sciences, law.invention, Shunting, 020303 mechanical engineering & transports, 0203 mechanical engineering, law, Position (vector), Railway signalling, Transient (oscillation), business, Simulation, ComputingMilieux_MISCELLANEOUS, 0105 earth and related environmental sciences, Voltage
Abstract

In railway signalling systems, a shunting principle is frequently used to detect the presence and position of a train on a track section. In some situations, the detection can become difficult essentially because of the electrical behaviour of the wheel-rail contact. This situation is called a shunting malfunction problem. To be able to fit rolling stock and/or the track circuits, the only knowledge of the various responses of the track circuit voltage receptor does not suffice and a more robust understanding of physical phenomena involved has become necessary. This paper focuses on two experiments dedicated to the study of the electrical wheel-rail contact. The first experiment concerns measurements on a reduced scale bench in laboratory, whereas the second aims to investigate the same parameters in the context of a real site with an instrumented train on a portion of commercially used track. In both cases, static contact and rolling contact have been studied, however only the rolling contact, which is clearly the worse case, will be considered in the paper. Time transient current-voltage characteristics have been measured and analyzed varying some main parameters such as voltage and current range, signal frequency, applied load. The results obtained on the reduced scale bench prove to be in good agreement with those from site tests. A contact voltage saturation phenomenon was observed, which is discussed in the light of recent papers relative to Branly effect.

Published
2012

15. Measuring kinetics of enzymatic hydrolysis of acetylcholine in presence of high voltage pulses by dielectric characterization

Author

Gilbert, Cedric, Meyer, Olivier, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Published
2012

16. Technique de caractérisation diélectrique et électrique (de 40 Hz à 4 GHz) de solutions électrolytiques

Author

Gilbert, Cedric, Meyer, Olivier, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MISCELLANEOUS
Abstract

National audience

Published
2012

17. Observation par spectroscopie diélectrique (40 Hz - 4 GHz) de cinétiques de réaction enzymatique soumises a des champs impulsionnels de fortes amplitudes

Author

Gilbert, Cedric, Meyer, Olivier, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MISCELLANEOUS
Abstract

National audience

Published
2012

18. Growth and transport properties of HT-Li xCoO 2 thin films deposited by pulsed laser deposition

Author

Svoukis, E., Athanasopoulos, G. I., Moradpour, A., Schneegans, O., Revcolevschi, A., Giapintzakis, John, Giapintzakis, John [0000-0002-7277-2662], Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Materials science, Thin films, Analytical chemistry, Electrical resistances, General Physics and Astronomy, Pulsed laser deposition, Layered structured, 02 engineering and technology, Substrate (electronics), 010402 general chemistry, 01 natural sciences, Surface roughness, Electrical resistance and conductance, LiCoO 2, Substrate temperature, In-situ growth, Single phase, Deposition (phase transition), CP-AFM, Thin film, Cobalt compounds, Substrates, Surfaces and Interfaces, General Chemistry, Combustion chemical vapor deposition, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Vapor deposition, 0104 chemical sciences, Surfaces, Coatings and Films, Carbon film, Oxygen pressure, Transport properties, Deposition temperatures, 0210 nano-technology
Abstract

The successful in situ growth of single phase, c-axis oriented, layered structured Li xCoO 2 thin films on (0 0 0 1) Al 2O 3 substrates by pulsed laser deposition is reported. Thin films were grown in an oxygen pressure of 1 mbar and substrate temperatures varying from 300 up to 600°C. It is found that the surface roughness and electrical resistance of the films depends strongly on the deposition temperatures. © 2012 Elsevier B.V. 258 9366 9369 9366-9369

Published
2012
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19. Surface temperature measurement of a copper anode submitted to a non-stationary electric arc in air

Author

Landfried, Romaric, Leblanc, Thierry, Andlauer, Richard, Testé, Philippe, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
[PHYS]Physics [physics], Physical Sciences
Abstract

LGEP 2011 ID = 893; International audience; This work concerns the assessment of the surface temperature of copper anodes submitted to an electric arc in a non-stationary regime in air at atmospheric pressure. An infrared camera is used to measure the decrease of the surface temperature just after a very fast controlled arc extinction. Results are presented for different mean values of the arc current intensity (30, 70 and 130 A) with an electric arc duration in the range of 2-5 ms. The temperature decrease after the arc extinction allows an assessment of the surface temperature just at the moment of the arc switching off. In the present experimental conditions the mean temperatures reached for copper anodes are in the range of 750-1200 °C according to the arc current intensity values. Comparison between experimental results and a numerical modeling of the electrode heating allowed one to assess the surface power balance. The values for the volt equivalent are found about 12 V and the values for the surface power density are found to be near 2 × 10(9) W/m².

Published
2011
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20. Fretting Behavior of Nickel Coatings for Electrical Contact Applications

Author

Sophie Noël, S. Correia, David Alamarguy, P. Laurat, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Materials science, 020209 energy, Contact resistance, Metallurgy, chemistry.chemical_element, Fretting, 02 engineering and technology, Slip (materials science), Surface finish, Tribology, 021001 nanoscience & nanotechnology, Electrical contacts, Nickel, chemistry, biological sciences, 0202 electrical engineering, electronic engineering, information engineering, Surface roughness, 0210 nano-technology
Abstract

LGEP 2011 ID = 817; International audience; Fretting remains a major cause of connector failure and can impair reliability in complex systems. Oxidizable metals such as tin, copper and nickel are particularly prone to fretting degradation. We report here the first results of an investigation on fretting of nickel contacts with two types of deposits. Sulfate nickel layers are electrodeposited in different conditions and show very different behaviours during fretting tests. The characteristics of the layers are analyzed and show different compositions and microstructures. The compositions are measured by X-Ray Photoelectron Spectroscopy (XPS) which allows determining the chemical nature of the compounds formed during exposure to air. Topography is measured by AFM and the roughness and grain characteristics are assessed. Electrical properties at the micro/nanoscale are measured with the CP-AFM technique. Various loads are applied to the cantilever beam; the electrical characterization is performed versus the load. The results of fretting experiments are analyzed in terms of fretting regimes. The fretting regimes occurring during the test of the matte layers involve partial slip which delays the occurrence of contact resistance (Rc) increase. Gross slip in the interface is shown to create very poorly conducting wear debris leading to drastic increase of Rc. This study is part of a larger one aiming at tailoring coatings allowing the best tribological and electrical behaviors during fretting of nickel contacts.

Published
2011
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21. Heating of a copper cathode: experiment and numerical modelling

Author

Landfried, Romaric, Leblanc, Thierry, Testé, Philippe, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS, ComputingMilieux_MISCELLANEOUS
Abstract

LGEP 2011 ID = 816; International audience

Published
2011

22. Fretting behaviour of various intermetallic compounds in electrical contacts: Influence on reliability

Author

Philippe Gendre, David Alamarguy, Sophie Noël, Sandra Correia, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Materials science, Intermetallic, chemistry.chemical_element, Fretting, 02 engineering and technology, Electrical contact resistance, 0203 mechanical engineering, Wear, Materials Chemistry, Electroplating, Contact resistance, Metallurgy, Surfaces and Interfaces, Tribology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Copper, Electrical contacts, Surfaces, Coatings and Films, 020303 mechanical engineering & transports, chemistry, Mechanics of Materials, Tin, 0210 nano-technology
Abstract

LGEP 2011 ID = 822; International audience; Many connectors are made of cuprous substrates with electroplated final surfaces such as tin and nickel. The main failure mechanism of such devices has been shown to be fretting. Intermetalliccompounds (IMC) formed due to the ageing of tin coatings have been shown to be an aggravating factor. Much work is still dedicated to better understand the failure mechanisms involved in tin fretting. The aim of this work was to elaborate improved coatings for better reliability of electronic devices. The work has been performed on tin layers electrodeposited on cuprous substrates such as those used in the electronic industry. Sine displacement cycles were imposed to ball/plane samples in "controlled displacement" fretting" tests. Experiments were performed for samples with underlayers of different types and thickness both as received and after heat treatment. The number of cycles for the contact resistance to exceed the threshold value of 10 mΩ increased with thin underlayers of 0.1 μm. The heat treated tin layer with a 0.1 μm cobalt underlayer showed a low and stable Rc value for a highly increased number of cycles. Various physicochemical techniques were used to analyse the composition profiles of the samples and to measure the thickness of the intermetalliccompounds. Thin underlayers allow copper to diffuse; intermetalliccompounds of different composition and with different structures are formed: Cu6Sn5, Ni3Sn4 or unidentified (Cu-Sn-Ni) and (Cu-Sn-Co) compounds. The electrical and tribological behaviours of bare IMC were investigated after stripping the free tin; sticking phenomena could account for the lower values of resistance recorded for the (Cu-Sn-Ni) and (Cu-Sn-Co) compounds. The particular needle shape of the intermetalliccompound formed with the thin cobalt underlayer could cause different fretting conditions leading to lower values of contact resistance for a longer time. Despite the complex phenomena involved, indications are given for the elaboration of coatings with improved frettingbehaviour in electrical contacts applications.

Published
2011
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23. Growth and transport measurements of HT-LixCoO2 thin films deposited by PLD

Author

Svoukis, Efthymios, Athanasopoulos, G.I., Moradpour, Alec, Schneegans, Olivier, Saint-Martin, R., Revcolevschi, Alexandre, Giapintzakis, John, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Abstract

LGEP 2011 ID = 790; International audience; LixCoO2 has widely been used as a cathode material for Li- batteries. The unique transport properties are attributed to intercalation and de-intercalation of Li ions. Only one group has presented optimum conditions for high quality HT-LiCoO2. Optimum conditions for HT-LiCoO2 are found. Films were successfully deposited by pulsed laser deposition (PLD) on Al2O3 (0001) substrates. The crystal structure of the film has been studied using in-situ RHEED and X-ray diffraction. Electrical measurements of the films via Van der Pauw and CP-AFM will be presented in a wide range of temperatures.

Published
2011

24. Conductive-probe AFM characterization of graphene sheets chemically grafted on gold surfaces

Author

Hauquier, Fanny, Alamarguy, David, Baraton, Laurent, Viel, P, Noël, Sophie, Filoramo, A, Huc, V, Houzé, Frédéric, Palacin, Serge, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS, ComputingMilieux_MISCELLANEOUS
Abstract

LGEP 2011 ID = 814; International audience

Published
2011

25. Measuring in vitro kinetics of enzymatic hydrolysis of acetylcholine in presence of high voltages pulses by dielectric characterization

Author

Gilbert, Cedric, Meyer, Olivier, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MANAGEMENTOFCOMPUTINGANDINFORMATIONSYSTEMS, ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS
Abstract

LGEP 2011 ID = 851

Published
2011

26. Detection and Location of Defects in Wiring Networks Using Time-Domain Reflectometry and Neural Networks

Author

Lionel Pichon, F. Loete, Mostafa Kamel Smail, Tarik Hacib, ICHAMS - Equipe Interaction Champs - Matériaux et Structures, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), COCODI - Equipe Conception, Commande et Diagnostic, CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
010302 applied physics, Artificial neural network, Computer science, Wave propagation, Finite difference, Finite difference method, Finite-difference time-domain method, 020206 networking & telecommunications, 02 engineering and technology, Inverse problem, 01 natural sciences, Finite element method, Electronic, Optical and Magnetic Materials, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Time domain, Electrical and Electronic Engineering, Reflectometry, Electrical impedance, Algorithm
Abstract

LGEP 2011 ID = 812; International audience; This paper presents a new technique to reconstruct faulty wiring networks and/or to localize the defects affecting the branches of the wiring network from the time domain reflectometry response. The method is also for characterization of defects in branches on the network. The direct model for wave propagation along the transmission lines is modeled by RLCG circuit parameters computed by finite elements method (FEM) or analytical solution and the finite difference time-domain (FDTD) method. Neural networks (NNs) are used to solve the inverse problem. A set of experimental results is carried out in order to validate the calculations.

Published
2011
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27. Fretting behaviour of various intermetallic compounds in electrical contacts : Influence on reliability

Author

Noël, Sophie, Alamarguy, David, Correia, Sandra, Brézard, Aurore, Gendre, P., Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS, ComputingMilieux_MISCELLANEOUS
Abstract

LGEP 2011 ID = 825; International audience

Published
2011

28. Improvement of electrical contacts reliability in a magnetic MEMS switch

Author

Poulain, C., Vincent, M., Chiesi, L., Delamarre, J., Houzé, Frédéric, Sibuet, H., CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Published
2011

29. Optimisation de la mesure de capacité électrique locale absolue par AFM à sonde conductrice

Author

Estevez, Ivan, Chrétien, Pascal, Schneegans, Olivier, Houzé, Frédéric, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS, ComputingMilieux_MISCELLANEOUS
Abstract

LGEP 2011 ID = 818; National audience

Published
2011

30. Apport du microscope à force atomique pour l\'étude de certains phénomènes relatifs aux micro-contacts électriques

Author

Vincent, M, Row, S. W., Poulain, C, Chiesi, L, Houzé, Frédéric, Delamarre, J, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS, ComputingMilieux_MISCELLANEOUS
Abstract

LGEP 2011 ID = 819; National audience

Published
2011

31. Enzymatic Acetylcholine Hydrolysis Modification by High Voltage and Fast Rise Time Pulsed EMW Using Dielectric Spectroscop

Author

Gilbert, Cedric, Meyer, Olivier, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MANAGEMENTOFCOMPUTINGANDINFORMATIONSYSTEMS, ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS
Abstract

LGEP 2011 ID = 849

Published
2011

32. Cast and accurate dielectric characterization technical to get various electrolytic parameters

Author

Gilbert, Cedric, Meyer, Olivier, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MANAGEMENTOFCOMPUTINGANDINFORMATIONSYSTEMS, ComputerSystemsOrganization_COMPUTER-COMMUNICATIONNETWORKS, InformationSystems_MISCELLANEOUS
Abstract

LGEP 2011 ID = 850

Published
2011

33. Resistive switching phenomena in Li xCoO 2 thin films

Author

Moradpour, A., Schneegans, O., Franger, S., Revcolevschi, A., Salot, R., Auban-Senzier, P., Pasquier, C., Svoukis, E., Giapintzakis, John, Dragos, O., Ciomaga, V.-C., Chrétien, P., Giapintzakis, John [0000-0002-7277-2662], Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Materials science, Orders of magnitude (temperature), cobalt oxide, Oxide, Switching systems, 02 engineering and technology, 010402 general chemistry, chemistry, 01 natural sciences, chemistry.chemical_compound, Atomic force microscopy, electric conductivity, Electric Impedance, Four-order, General Materials Science, Thin film, Cobalt oxide, mixed conductors, Current voltage curve, Microscopy, Cobalt compounds, Cobalt oxides, business.industry, resistive switching, Mechanical Engineering, article, Atomic Force, Oxides, Cobalt, 021001 nanoscience & nanotechnology, 0104 chemical sciences, thin films, Mechanics of Materials, lithium, Resistive switching, Switching, impedance, Optoelectronics, oxide, 0210 nano-technology, business, Oxide thin films
Abstract

A substantial resistive switching of Li xCoO 2 mixed-conductor thin films is observed for the first time. The occurrence of possible bipolar switching in these oxide thin films is by current-voltage curves, investigated by conducting-probe atomic force microscopy (CP-AFM). The films are incorporated into an Au/Li xCoO 2/p++Si device and exhibit a significant resistive-switching process involving a ratio of over four orders of magnitude. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. 23 4141 4145 4141-4145

Published
2011
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34. Essais de vieillissement par vibration de connecteurs pour la mécatronique

Author

Michelet, J.P., Guinet, J., Colin, C., Michon, P., Brézard-Oudot, Aurore, Noël, Sophie, Alamarguy, David, Loete, Florent, CE - Equipe Contacts Electriques, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
ComputingMilieux_MISCELLANEOUS
Abstract

National audience

Published
2010

35. Experimental assessment of the surface temperature of copper electrodes submitted to an electric arc in air at atmospheric pressure

Author

Romaric Landfried, Ph Teste, Thierry Leblanc, R. Andlauer, Schneegans, Olivier, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
010302 applied physics, History, Range (particle radiation), Atmospheric pressure, Chemistry, Infrared, Analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 7. Clean energy, 01 natural sciences, Cathode, Computer Science Applications, Education, Anode, law.invention, Electric arc, Arc (geometry), Plasma arc welding, law, 0103 physical sciences, Composite material, 0210 nano-technology, ComputingMilieux_MISCELLANEOUS
Abstract

LGEP 2011 ID = 929; International audience; This paper concerns the assessment of the surface temperature of copper electrodes submitted to an electric arc in a non stationary regime in air. An infrared camera is used to measure the decrease of the temperature surface just after a controlled and very fast arc extinction. In the first part, the experimental method is described. In the second part, results are presented for 60-70 A with an electric arc duration in the range 3-4 ms. The temperature decrease after the arc extinction allows to reach an assessment of the surface temperature just at the arc switching off. In the present experimental conditions the mean temperatures reached for copper cathodes and anodes are in the range 750-850°C.

Published
2010
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36. Tribological and electrical study of Fluorinated Diazonium Films as dry lubricants for electrical contacts

Author

Serge Palacin, Sophie Noël, Marc Sallé, Frédéric Houzé, Alessandro Benedetto, Franck Le Derf, David Alamarguy, Mirela Balog, Pascal Viel, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-SUPELEC-Centre National de la Recherche Scientifique (CNRS), CE - Equipe Contacts Electriques, Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Chimie des Surfaces et Interfaces (LCSI), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Chimie, Ingénierie Moléculaire et Matériaux d'Angers (CIMMA), Université d'Angers (UA)-Centre National de la Recherche Scientifique (CNRS), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-SUPELEC-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-SUPELEC-Centre National de la Recherche Scientifique (CNRS), Laboratoire de Chimie, Ingénierie Moléculaire et Matériaux d'Angers (CIMMA), and Centre National de la Recherche Scientifique (CNRS)-Université d'Angers (UA)

Subjects
Materials science, Ultra-high vacuum, Nanotechnology, 02 engineering and technology, engineering.material, 010402 general chemistry, 01 natural sciences, Materials Chemistry, Thin film, Composite material, Electrical conductor, Dry lubricant, ComputingMilieux_MISCELLANEOUS, Diamond, Surfaces and Interfaces, General Chemistry, [CHIM.MATE]Chemical Sciences/Material chemistry, Tribology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Electrical contacts, 0104 chemical sciences, Surfaces, Coatings and Films, engineering, Cyclic voltammetry, 0210 nano-technology
Abstract

International audience; The need to operate in extreme environmental conditions (ultra high vacuum, high temperatures, aerospatial, etc.) and the miniaturisation toward microelectromechanical system is demanding new materials in the field of low-level electrical contacts lubrication. A dry and chemically immobilised layer avoiding the traditional wet lubricating fluids would have many advantages. We report here the first results on films obtained by the electrochemical reduction of different diazonium salts and their use as protective coatings able to lubricate the metallic surfaces of an electrical contact while preserving at the same time electrical conduction. The physicochemical properties of the films, elaborated from various diazonium salts, were studied by cyclic voltammetry and ATR FT-IR spectroscopy. Atomic force microscope was combined with a home-made wide-range current measurement system to investigate simultaneously the mechanical and electrical interactions between the doped diamond conductive tips and the evaporated gold surfaces coated with the diazonium films. The analysis of the simultaneous mechanical and electrical properties of the films in a nanocontact situation is shown to bring much insight into the electrical contact application.

Published
2008
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37. Carbon nanotubes/fluorinated polymers nanocomposite thin films for electrical contacts lubrication

Author

Nicolas Izard, Alessandro Benedetto, Sophie Noël, Serge Palacin, Pascal Viel, Pascale Chenevier, Laboratoire de génie électrique de Paris (LGEP), Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS), Schneegans, Olivier, Laboratoire de Chimie des Surfaces et Interfaces (LCSI), Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire d'Electronique Moléculaire (LEM), CE - Equipe Contacts Electriques, and Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Centre National de la Recherche Scientifique (CNRS)

Subjects
Materials science, 02 engineering and technology, Substrate (electronics), Carbon nanotube, 010402 general chemistry, 01 natural sciences, law.invention, symbols.namesake, X-ray photoelectron spectroscopy, law, Materials Chemistry, Organic chemistry, Lubricant, Thin film, ComputingMilieux_MISCELLANEOUS, [CHIM.MATE]Chemical Sciences/Material chemistry, Surfaces and Interfaces, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Electrical contacts, 0104 chemical sciences, Surfaces, Coatings and Films, Chemical engineering, Lubrication, symbols, 0210 nano-technology, Raman spectroscopy
Abstract

The need to operate in extreme environmental conditions (ultra high vacuum, high temperatures, aerospatial environment, …) and the miniaturization toward micro electromechanical systems is demanding new materials in the field of low-level electrical contacts lubrication. Dry and chemically immobilized lubrication is expected to be an alternative to the traditional wet lubricants oils. With the goal to conciliate electrical conductivity and lubricant properties we designed nanocomposite thin films composed of a 2D carbon nanotubes network embedded in an organic matrix. The nanotubes networks were deposited on gold surfaces modified by electrochemical cathodic grafting of poly(acrylonitrile). The same substrate served for covalently bonding the low-friction organic matrix. Three different matrixes were tested: a perfluorinated oligomer chemically grafted and two different polyfluorinated acrylates electrochemically grafted. The nanocomposite thin films have been characterized by ATR FT-IR, XPS and Raman spectroscopy. We measured the effects of the different matrixes and the nanotubes addition on the tribological properties and on the contact resistances of the films.

Published
2006
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