1. DiMES PMI research at DIII-D in support of ITER and beyond
- Author
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Jeffrey N. Brooks, P.C. Stangeby, R.P. Doerner, Jerome Guterl, Dean A. Buchenauer, J.G. Watkins, R.A. Moyer, J.A. Boedo, J.D. Elder, C.J. Lasnier, William R. Wampler, Houyang Guo, Adam McLean, Tyler Abrams, Daniel Thomas, David Donovan, E.T. Hinson, Rui Ding, M.E. Fenstermacher, Richard E. Nygren, Ezekial A Unterberg, A.R. Briesemeister, D.L. Rudakov, Eric Hollmann, C.P.C. Wong, A.W. Leonard, Igor Bykov, and C.P. Chrobak
- Subjects
Tokamak ,Materials science ,DIII-D ,Thomson scattering ,Plasma parameters ,Mechanical Engineering ,Divertor ,Nuclear engineering ,Plasma ,01 natural sciences ,010305 fluids & plasmas ,law.invention ,symbols.namesake ,Nuclear Energy and Engineering ,law ,Sputtering ,0103 physical sciences ,symbols ,Langmuir probe ,General Materials Science ,010306 general physics ,Civil and Structural Engineering - Abstract
An overview of recent Plasma-Material Interactions (PMI) research at the DIII-D tokamak using the Divertor Material Evaluation System (DiMES) is presented. The DiMES manipulator allows for exposure of material samples in the lower divertor of DIII-D under well-diagnosed ITER-relevant plasma conditions. Plasma parameters during the exposures are characterized by an extensive diagnostic suite including a number of spectroscopic diagnostics, Langmuir probes, IR imaging, and Divertor Thomson Scattering. Post-mortem measurements of net erosion/deposition on the samples are done by Ion Beam Analysis, and results are modelled by the ERO and REDEP/WBC codes with plasma background reproduced by OEDGE/DIVIMP modelling based on experimental inputs. This article highlights experiments studying sputtering erosion, re-deposition and migration of high-Z elements, mostly tungsten and molybdenum, as well as some alternative materials. Results are generally encouraging for use of high-Z PFCs in ITER and beyond, showing high redeposition and reduced net sputter erosion. Two methods of high-Z PFC surface erosion control, with (i) external electrical biasing and (ii) local gas injection, are also discussed. These techniques may find applications in the future devices.
- Published
- 2017